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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6541777 |
Optical sensing and control of ultraviolet fluid treatment dynamics |
Apr. 1, 2003 |
| 6541770 |
Charged particle system error diagnosis |
Apr. 1, 2003 |
| 6538264 |
Semiconductor reliability test chip |
Mar. 25, 2003 |
| 6534785 |
Reduced terminal testing system |
Mar. 18, 2003 |
| 6534786 |
Semiconductor device having a test element, and method of manufacturing the same |
Mar. 18, 2003 |
| 6531709 |
Semiconductor wafer and fabrication method of a semiconductor chip |
Mar. 11, 2003 |
| 6528817 |
Semiconductor device and method for testing semiconductor device |
Mar. 4, 2003 |
| 6528818 |
Test structures and methods for inspection of semiconductor integrated circuits |
Mar. 4, 2003 |
| 6525343 |
Micro-chip for chemical reaction |
Feb. 25, 2003 |
| 6521910 |
Structure of a test key for monitoring salicide residue |
Feb. 18, 2003 |
| 6518593 |
Integrated circuit and method of designing integrated circuit |
Feb. 11, 2003 |
| 6518592 |
Apparatus, method and pattern for evaluating semiconductor device characteristics |
Feb. 11, 2003 |
| 6518591 |
Contact monitor, method of forming same and method of analizing contact-, via- and/or trench-forming processes in an integrated circuit |
Feb. 11, 2003 |
| 6512289 |
Direct current regulation on integrated circuits under high current design conditions |
Jan. 28, 2003 |
| 6509582 |
Semiconductor pad construction enabling pre-bump probing by planarizing the post-sort pad surface |
Jan. 21, 2003 |
| 6507044 |
Position-selective and material-selective silicon etching to form measurement structures for semiconductor fabrication |
Jan. 14, 2003 |
| 6507076 |
Microwave transistor subjected to burn-in testing |
Jan. 14, 2003 |
| 6504223 |
Contact structure and production method thereof and probe contact assembly using same |
Jan. 7, 2003 |
| 6501683 |
Nonvolatile semiconductor memory device |
Dec. 31, 2002 |
| 6496959 |
Method and system for estimating plasma damage to semiconductor device for layout design |
Dec. 17, 2002 |
| 6495855 |
Semiconductor device |
Dec. 17, 2002 |
| 6495856 |
Semiconductor device having a test pattern same as conductive pattern to be tested and method for testing semiconductor device for short-circuit |
Dec. 17, 2002 |
| 6492187 |
Method for automatically positioning electronic die within component packages |
Dec. 10, 2002 |
| 6489800 |
Method of testing an integrated circuit |
Dec. 3, 2002 |
| 6486492 |
Integrated critical dimension control for semiconductor device manufacturing |
Nov. 26, 2002 |
| 6486493 |
Semiconductor integrated circuit device having hierarchical test interface circuit |
Nov. 26, 2002 |
| 6485991 |
System and method for output track unit detection and safe storage tube removal |
Nov. 26, 2002 |
| 6476414 |
Semiconductor device |
Nov. 5, 2002 |
| 6472748 |
System and method for providing MMIC seal |
Oct. 29, 2002 |
| 6469316 |
Test structure to monitor the effects of polysilicon pre-doping |
Oct. 22, 2002 |
| 6469396 |
Integrated circuit chip having input/output terminals for testing and operation |
Oct. 22, 2002 |
| 6469909 |
MEMS package with flexible circuit interconnect |
Oct. 22, 2002 |
| 6461880 |
Method for monitoring silicide failures |
Oct. 8, 2002 |
| 6455334 |
Probe grid for integrated circuit analysis |
Sep. 24, 2002 |
| 6455352 |
Pin array assembly and method of manufacture |
Sep. 24, 2002 |
| 6452502 |
Method and apparatus for early detection of reliability degradation of electronic devices |
Sep. 17, 2002 |
| 6452209 |
Semiconductor devices having backside probing capability |
Sep. 17, 2002 |
| 6452208 |
Semiconductor chip including a reference element having reference coordinates |
Sep. 17, 2002 |
| 6448664 |
Ball grid array chip packages having improved testing and stacking characteristics |
Sep. 10, 2002 |
| 6448575 |
Temperature control structure |
Sep. 10, 2002 |
| 6448098 |
Detection of undesired connection between conductive structures within multiple layers on a semiconductor wafer |
Sep. 10, 2002 |
| 6449748 |
Non-destructive method of detecting die crack problems |
Sep. 10, 2002 |
| 6445002 |
SRAM-based semiconductor integrated circuit testing element |
Sep. 3, 2002 |
| 6445001 |
Semiconductor device with flip-chip structure and method of manufacturing the same |
Sep. 3, 2002 |
| 6444483 |
Method and apparatus of producing partial-area mask data files |
Sep. 3, 2002 |
| 6441469 |
Semiconductor memory configuration with dummy components on continuous diffusion regions |
Aug. 27, 2002 |
| 6441398 |
Algorithm for detecting sloped contact holes using a critical-dimension waveform |
Aug. 27, 2002 |
| 6441397 |
Evaluation of semiconductor chargeup damage and apparatus therefor |
Aug. 27, 2002 |
| 6441396 |
In-line electrical monitor for measuring mechanical stress at the device level on a semiconductor wafer |
Aug. 27, 2002 |
| 6437436 |
Integrated circuit chip package with test points |
Aug. 20, 2002 |
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