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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:
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Patent Number Title Of Patent Date Issued
7701237 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device, and probe card used for burn-in stress and D/S tests Apr. 20, 2010
7701072 Semiconductor device and manufacturing method therefor Apr. 20, 2010
7700946 Structure for reducing prior level edge interference with critical dimension measurement Apr. 20, 2010
7700945 On-chip storage of hardware events for debugging Apr. 20, 2010
7700944 Semiconductor wafer, semiconductor chip, and semiconductor chip inspection method Apr. 20, 2010
7693424 Integrated proximity-to-optical transceiver chip Apr. 6, 2010
7692439 Structure for modeling stress-induced degradation of conductive interconnects Apr. 6, 2010
7692190 Semiconductor device Apr. 6, 2010
7691661 Method of fabricating a surface probing device Apr. 6, 2010
7689377 Technique for aging induced performance drift compensation in an integrated circuit Mar. 30, 2010
7687900 Semiconductor integrated circuit device and fabrication method for the same Mar. 30, 2010
7687803 Semiconductor device and method for manufacturing semiconductor device Mar. 30, 2010
7687286 Method and apparatus for determining the thickness of a dielectric layer Mar. 30, 2010
7683651 Test structure for electromigration analysis and related method Mar. 23, 2010
7683607 Connection testing apparatus and method and chip using the same Mar. 23, 2010
7683492 Semiconductor device Mar. 23, 2010
7683369 Structure for measuring body pinch resistance of high density trench MOSFET array Mar. 23, 2010
7679083 Semiconductor integrated test structures for electron beam inspection of semiconductor wafers Mar. 16, 2010
7674638 Sensor device and production method therefor Mar. 9, 2010
7671362 Test structure for determining optimal seed and liner layer thicknesses for dual damascene processing Mar. 2, 2010
7671361 Semiconductor device including fuse focus detector, fabricating method thereof and laser repair method using the fuse focus detector Mar. 2, 2010
7667477 Circuit for detecting and measuring noise in semiconductor integrated circuit Feb. 23, 2010
7667231 Automatic on-die defect isolation Feb. 23, 2010
7666559 Structure and method for determining an overlay accuracy Feb. 23, 2010
7663163 Semiconductor with reduced pad pitch Feb. 16, 2010
7660257 Semiconductor device and test method of semiconductor device Feb. 9, 2010
7659733 Electrical open/short contact alignment structure for active region vs. gate region Feb. 9, 2010
7655946 IC with comparator receiving expected and mask data from pads Feb. 2, 2010
7655945 Real-time monitoring of particles in semiconductor vacuum environment Feb. 2, 2010
7655944 Systems and methods for estimating thermal resistance of field effect transistor structures Feb. 2, 2010
7652284 Process monitor mark and the method for using the same Jan. 26, 2010
7651627 Hydrofluoroether as a heat-transfer fluid Jan. 26, 2010
7649200 System and method of detecting IC die cracks Jan. 19, 2010
7649173 Method of preparing a sample for transmission electron microscopy Jan. 19, 2010
7646208 On-chip detection of power supply vulnerabilities Jan. 12, 2010
7646016 Method for automated testing of the modulation transfer function in image sensors Jan. 12, 2010
7645620 Method and structure for reducing prior level edge interference with critical dimension measurement Jan. 12, 2010
7642769 Insert and tray for electronic device handling apparatus, and electronic device handling apparatus Jan. 5, 2010
7642625 Method of evaluating thermal stress resistance of semiconductor device, and semiconductor wafer having test element Jan. 5, 2010
7642551 Wafer-level package having test terminal Jan. 5, 2010
7642550 Multi-layer structures for parameter measurement Jan. 5, 2010
7642106 Methods for identifying an allowable process margin for integrated circuits Jan. 5, 2010
7639032 Structure for monitoring stress-induced degradation of conductive interconnects Dec. 29, 2009
7638798 Laminated wafer sensor system for UV dose measurement Dec. 29, 2009
7629609 Random number generating device Dec. 8, 2009
7629186 System and method for identification of a reference integrated circuit for a pick-and-place equipment Dec. 8, 2009
7626266 Semiconductor integrated circuit device having a plurality of functional circuits with low power consumption Dec. 1, 2009
7626240 Electro-optical apparatus and a circuit bonding detection device and detection method thereof Dec. 1, 2009
7622930 Method for inspecting transmission line characteristic of a semiconductor device using signal reflection measurement Nov. 24, 2009
7622737 Test structures for electrically detecting back end of the line failures and methods of making and using the same Nov. 24, 2009

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