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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7701237 |
Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device, and probe card used for burn-in stress and D/S tests |
Apr. 20, 2010 |
| 7701072 |
Semiconductor device and manufacturing method therefor |
Apr. 20, 2010 |
| 7700946 |
Structure for reducing prior level edge interference with critical dimension measurement |
Apr. 20, 2010 |
| 7700945 |
On-chip storage of hardware events for debugging |
Apr. 20, 2010 |
| 7700944 |
Semiconductor wafer, semiconductor chip, and semiconductor chip inspection method |
Apr. 20, 2010 |
| 7693424 |
Integrated proximity-to-optical transceiver chip |
Apr. 6, 2010 |
| 7692439 |
Structure for modeling stress-induced degradation of conductive interconnects |
Apr. 6, 2010 |
| 7692190 |
Semiconductor device |
Apr. 6, 2010 |
| 7691661 |
Method of fabricating a surface probing device |
Apr. 6, 2010 |
| 7689377 |
Technique for aging induced performance drift compensation in an integrated circuit |
Mar. 30, 2010 |
| 7687900 |
Semiconductor integrated circuit device and fabrication method for the same |
Mar. 30, 2010 |
| 7687803 |
Semiconductor device and method for manufacturing semiconductor device |
Mar. 30, 2010 |
| 7687286 |
Method and apparatus for determining the thickness of a dielectric layer |
Mar. 30, 2010 |
| 7683651 |
Test structure for electromigration analysis and related method |
Mar. 23, 2010 |
| 7683607 |
Connection testing apparatus and method and chip using the same |
Mar. 23, 2010 |
| 7683492 |
Semiconductor device |
Mar. 23, 2010 |
| 7683369 |
Structure for measuring body pinch resistance of high density trench MOSFET array |
Mar. 23, 2010 |
| 7679083 |
Semiconductor integrated test structures for electron beam inspection of semiconductor wafers |
Mar. 16, 2010 |
| 7674638 |
Sensor device and production method therefor |
Mar. 9, 2010 |
| 7671362 |
Test structure for determining optimal seed and liner layer thicknesses for dual damascene processing |
Mar. 2, 2010 |
| 7671361 |
Semiconductor device including fuse focus detector, fabricating method thereof and laser repair method using the fuse focus detector |
Mar. 2, 2010 |
| 7667477 |
Circuit for detecting and measuring noise in semiconductor integrated circuit |
Feb. 23, 2010 |
| 7667231 |
Automatic on-die defect isolation |
Feb. 23, 2010 |
| 7666559 |
Structure and method for determining an overlay accuracy |
Feb. 23, 2010 |
| 7663163 |
Semiconductor with reduced pad pitch |
Feb. 16, 2010 |
| 7660257 |
Semiconductor device and test method of semiconductor device |
Feb. 9, 2010 |
| 7659733 |
Electrical open/short contact alignment structure for active region vs. gate region |
Feb. 9, 2010 |
| 7655946 |
IC with comparator receiving expected and mask data from pads |
Feb. 2, 2010 |
| 7655945 |
Real-time monitoring of particles in semiconductor vacuum environment |
Feb. 2, 2010 |
| 7655944 |
Systems and methods for estimating thermal resistance of field effect transistor structures |
Feb. 2, 2010 |
| 7652284 |
Process monitor mark and the method for using the same |
Jan. 26, 2010 |
| 7651627 |
Hydrofluoroether as a heat-transfer fluid |
Jan. 26, 2010 |
| 7649200 |
System and method of detecting IC die cracks |
Jan. 19, 2010 |
| 7649173 |
Method of preparing a sample for transmission electron microscopy |
Jan. 19, 2010 |
| 7646208 |
On-chip detection of power supply vulnerabilities |
Jan. 12, 2010 |
| 7646016 |
Method for automated testing of the modulation transfer function in image sensors |
Jan. 12, 2010 |
| 7645620 |
Method and structure for reducing prior level edge interference with critical dimension measurement |
Jan. 12, 2010 |
| 7642769 |
Insert and tray for electronic device handling apparatus, and electronic device handling apparatus |
Jan. 5, 2010 |
| 7642625 |
Method of evaluating thermal stress resistance of semiconductor device, and semiconductor wafer having test element |
Jan. 5, 2010 |
| 7642551 |
Wafer-level package having test terminal |
Jan. 5, 2010 |
| 7642550 |
Multi-layer structures for parameter measurement |
Jan. 5, 2010 |
| 7642106 |
Methods for identifying an allowable process margin for integrated circuits |
Jan. 5, 2010 |
| 7639032 |
Structure for monitoring stress-induced degradation of conductive interconnects |
Dec. 29, 2009 |
| 7638798 |
Laminated wafer sensor system for UV dose measurement |
Dec. 29, 2009 |
| 7629609 |
Random number generating device |
Dec. 8, 2009 |
| 7629186 |
System and method for identification of a reference integrated circuit for a pick-and-place equipment |
Dec. 8, 2009 |
| 7626266 |
Semiconductor integrated circuit device having a plurality of functional circuits with low power consumption |
Dec. 1, 2009 |
| 7626240 |
Electro-optical apparatus and a circuit bonding detection device and detection method thereof |
Dec. 1, 2009 |
| 7622930 |
Method for inspecting transmission line characteristic of a semiconductor device using signal reflection measurement |
Nov. 24, 2009 |
| 7622737 |
Test structures for electrically detecting back end of the line failures and methods of making and using the same |
Nov. 24, 2009 |
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