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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:
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Patent Number Title Of Patent Date Issued
7786476 Semiconductor device system and method for modifying a semiconductor device Aug. 31, 2010
7786475 In-line test circuit and method for determining interconnect electrical properties and integrated circuit incorporating the same Aug. 31, 2010
7785906 Method to detect poly residues in LOCOS process Aug. 31, 2010
7785905 Dielectric actuator or sensor structure and method of making it Aug. 31, 2010
7781764 Nanometric device for the measurement of the conductivity and quantum effects of individual molecules and methods for the manufacture and use thereof Aug. 24, 2010
7781239 Semiconductor device defect type determination method and structure Aug. 24, 2010
7777223 Semiconductor device Aug. 17, 2010
7776626 Manufacturing method of semiconductor integrated circuit device Aug. 17, 2010
7772867 Structures for testing and locating defects in integrated circuits Aug. 10, 2010
7772686 Memory card fabricated using SiP/SMT hybrid technology Aug. 10, 2010
7772590 Metal comb structures, methods for their fabrication and failure analysis Aug. 10, 2010
7770081 Interface circuit for a single logic input pin of an electronic system Aug. 3, 2010
7768005 Physically highly secure multi-chip assembly Aug. 3, 2010
7768004 Semiconductor device including chips with electrically-isolated test elements and its manufacturing method Aug. 3, 2010
7764078 Test structure for monitoring leakage currents in a metallization layer Jul. 27, 2010
7764077 Semiconductor device including semiconductor evaluation element, and evaluation method using semiconductor device Jul. 27, 2010
7763887 Semiconductor device and method of fabricating the same Jul. 27, 2010
7762721 On chip temperature measuring and monitoring method Jul. 27, 2010
7759804 Semiconductor device and a method of manufacturing the same Jul. 20, 2010
7759135 Method of forming a sensor node module Jul. 20, 2010
7755084 Semiconductor wafer, semiconductor chip and method of manufacturing semiconductor chip Jul. 13, 2010
7755083 Package module with alignment structure and electronic device with the same Jul. 13, 2010
7755075 Phase-change memory device with minimized reduction in thermal efficiency and method of manufacturing the same Jul. 13, 2010
7751998 Semiconductor device, method for measuring characteristics of element to be measured, and characteristic management system of semiconductor device Jul. 6, 2010
7749779 Landing pad for use as a contact to a conductive spacer Jul. 6, 2010
7749778 Addressable hierarchical metal wire test methodology Jul. 6, 2010
7749398 Selective-redeposition sources for calibrating a plasma process Jul. 6, 2010
7745823 Thin film panel and method of manufacturing the same Jun. 29, 2010
7745775 Testing of transimpedance amplifiers Jun. 29, 2010
7745235 Method for manufacturing semiconductor sensor Jun. 29, 2010
7741638 Control layer for a nanoscale electronic switching device Jun. 22, 2010
7737710 Socket, and test apparatus and method using the socket Jun. 15, 2010
7737440 Test structure for charged particle beam inspection and method for fabricating the same Jun. 15, 2010
7737439 Semiconductor component having test pads and method and apparatus for testing same Jun. 15, 2010
7724019 Active device array substrate May. 25, 2010
7723724 System for using test structures to evaluate a fabrication of a wafer May. 25, 2010
7723709 Substrate holding apparatus, and inspection or processing apparatus May. 25, 2010
7723200 Electrically tunable resistor and related methods May. 25, 2010
7719007 Flexible electroluminescent capacitive sensor May. 18, 2010
7719006 Physical quantity sensor and semiconductor device having package and cover May. 18, 2010
7719005 Structure and method for monitoring and characterizing pattern density dependence on thermal absorption in a semiconductor manufacturing process May. 18, 2010
7719004 Sensor having hydrophobic coated elements May. 18, 2010
7715995 Design structure for measurement of power consumption within an integrated circuit May. 11, 2010
7709836 Detector arrangement, method for the detection of electrical charge carriers and use of an ONO field effect transistor for detection of an electrical charge May. 4, 2010
7709279 Methods for testing semiconductor devices methods for protecting the same from electrostatic discharge events during testing, and methods for fabricating inserts for use in testing semiconduct May. 4, 2010
7705353 Bonding pad, active device array substrate and liquid crystal display panel Apr. 27, 2010
7705352 Test structure for estimating electromigration effects with increased robustness with respect to barrier defects in vias Apr. 27, 2010
7705351 Flip chip semiconductor packaging device and testing method using first and second reflectors for determining gap between chip and circuit board or first and second chips Apr. 27, 2010
7705350 Fractional biasing of semiconductors Apr. 27, 2010
7705349 Test inserts and interconnects with electrostatic discharge structures Apr. 27, 2010

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