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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7626266 |
Semiconductor integrated circuit device having a plurality of functional circuits with low power consumption |
Dec. 1, 2009 |
| 7626240 |
Electro-optical apparatus and a circuit bonding detection device and detection method thereof |
Dec. 1, 2009 |
| 7622930 |
Method for inspecting transmission line characteristic of a semiconductor device using signal reflection measurement |
Nov. 24, 2009 |
| 7622737 |
Test structures for electrically detecting back end of the line failures and methods of making and using the same |
Nov. 24, 2009 |
| 7622736 |
Semiconductor device and method for manufacturing the same |
Nov. 24, 2009 |
| 7622735 |
Wafer for electrically characterizing tunnel junction film stacks with little or no processing |
Nov. 24, 2009 |
| 7620931 |
Method of adding fabrication monitors to integrated circuit chips |
Nov. 17, 2009 |
| 7618831 |
Method of monitoring the manufacture of interferometric modulators |
Nov. 17, 2009 |
| 7616014 |
Pulsed I-V measurement method and apparatus |
Nov. 10, 2009 |
| 7615781 |
Semiconductor wafer and semiconductor device, and method for manufacturing same |
Nov. 10, 2009 |
| 7615780 |
DNA biosensor and methods for making and using the same |
Nov. 10, 2009 |
| 7612371 |
Structure to monitor arcing in the processing steps of metal layer build on silicon-on-insulator semiconductors |
Nov. 3, 2009 |
| 7612370 |
Thermal interface |
Nov. 3, 2009 |
| 7605434 |
Semiconductor memory device to which test data is written |
Oct. 20, 2009 |
| 7605398 |
Apparatus of high dynamic-range CMOS image sensor and method thereof |
Oct. 20, 2009 |
| 7603598 |
Semiconductor device for testing semiconductor process and method thereof |
Oct. 13, 2009 |
| 7598523 |
Test structures for stacking dies having through-silicon vias |
Oct. 6, 2009 |
| 7598522 |
Semiconductor substrate and production process thereof |
Oct. 6, 2009 |
| 7595482 |
Standard component for length measurement, method for producing the same, and electron beam metrology system using the same |
Sep. 29, 2009 |
| 7595205 |
Using reverse arrangement for trend test in statistical process control for manufacture of semiconductor integrated circuits |
Sep. 29, 2009 |
| 7592623 |
Semiconductor device including wiring connection testing structure |
Sep. 22, 2009 |
| 7587648 |
Integrated circuit having electrically isolatable test circuitry |
Sep. 8, 2009 |
| 7586314 |
Multi-pin CV measurement |
Sep. 8, 2009 |
| 7585601 |
Method to optimize grating test pattern for lithography monitoring and control |
Sep. 8, 2009 |
| 7583093 |
Electrical test method of an integrated circuit |
Sep. 1, 2009 |
| 7582899 |
Semiconductor device having overlay measurement mark and method of fabricating the same |
Sep. 1, 2009 |
| 7579689 |
Integrated circuit package, and a method for producing an integrated circuit package having two dies with input and output terminals of integrated circuits of the dies directly addressable for |
Aug. 25, 2009 |
| 7579616 |
Four-terminal programmable via-containing structure and method of fabricating same |
Aug. 25, 2009 |
| 7576357 |
System for characterization of low-k dielectric material damage |
Aug. 18, 2009 |
| 7576356 |
Solution processed crosslinkable hole injection and hole transport polymers for OLEDs |
Aug. 18, 2009 |
| 7573066 |
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus |
Aug. 11, 2009 |
| 7573065 |
Semiconductor device evaluation method |
Aug. 11, 2009 |
| 7573064 |
Dielectric actuator or sensor structure and method of making it |
Aug. 11, 2009 |
| 7569853 |
Test pads on leads unconnected with die pads |
Aug. 4, 2009 |
| 7566900 |
Integrated metrology tools for monitoring and controlling large area substrate processing chambers |
Jul. 28, 2009 |
| 7561853 |
Radio frequency switch |
Jul. 14, 2009 |
| 7560801 |
Rewiring substrate strip with several semiconductor component positions |
Jul. 14, 2009 |
| 7560351 |
Integrated circuit arrangement with low-resistance contacts and method for production thereof |
Jul. 14, 2009 |
| 7553681 |
Carbon nanotube-based stress sensor |
Jun. 30, 2009 |
| 7550855 |
Vertically spaced plural microsprings |
Jun. 23, 2009 |
| 7550763 |
Semiconductor integrated circuit device and manufacture thereof |
Jun. 23, 2009 |
| 7550762 |
Isolation circuit |
Jun. 23, 2009 |
| 7550382 |
Manufacturing method of semiconductor device, evaluation method of semiconductor device, and semiconductor device |
Jun. 23, 2009 |
| 7549097 |
Semiconductor integrated circuit device and method of testing the same |
Jun. 16, 2009 |
| 7541815 |
Electronic device, testing apparatus, and testing method |
Jun. 2, 2009 |
| 7541613 |
Methods for reducing within chip device parameter variations |
Jun. 2, 2009 |
| 7541612 |
Multi-chip package semiconductor device and method of detecting a failure thereof |
Jun. 2, 2009 |
| 7541611 |
Apparatus using Manhattan geometry having non-Manhattan current flow |
Jun. 2, 2009 |
| 7538346 |
Semiconductor device |
May. 26, 2009 |
| 7538345 |
Inspection method of contact failure of semiconductor device and semiconductor device to which inspection method is applied |
May. 26, 2009 |
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