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Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7455939 |
Method of improving grating test pattern for lithography monitoring and controlling |
Nov. 25, 2008 |
| 7456033 |
Method of evaluating semiconductor device |
Nov. 25, 2008 |
| 7456449 |
Semiconductor apparatus, LED print head, and printer |
Nov. 25, 2008 |
| 7453272 |
Electrical open/short contact alignment structure for active region vs. gate region |
Nov. 18, 2008 |
| 7449909 |
System and method for testing one or more dies on a semiconductor wafer |
Nov. 11, 2008 |
| 7449716 |
Bond quality indication by bump structure on substrate |
Nov. 11, 2008 |
| 7439586 |
Liquid crystal display device and fabricating method thereof |
Oct. 21, 2008 |
| 7439538 |
Multi-purpose poly edge test structure |
Oct. 21, 2008 |
| 7439083 |
Technique for compensating for substrate shrinkage during manufacture of an electronic assembly |
Oct. 21, 2008 |
| 7439122 |
Method of manufacturing semiconductor device having improved RESURF Trench isolation and method of evaluating manufacturing method |
Oct. 21, 2008 |
| 7436199 |
Stack-type semiconductor package sockets and stack-type semiconductor package test systems |
Oct. 14, 2008 |
| 7435990 |
Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer |
Oct. 14, 2008 |
| 7435991 |
Micromechanical sensor |
Oct. 14, 2008 |
| 7427774 |
Targets for measurements in semiconductor devices |
Sep. 23, 2008 |
| 7423287 |
System and method for measuring residual stress |
Sep. 9, 2008 |
| 7423286 |
Laser transfer article and method of making |
Sep. 9, 2008 |
| 7423282 |
Memory structure and method of manufacture |
Sep. 9, 2008 |
| 7423288 |
Technique for evaluating a fabrication of a die and wafer |
Sep. 9, 2008 |
| 7420206 |
Interposer, semiconductor chip mounted sub-board, and semiconductor package |
Sep. 2, 2008 |
| 7419299 |
Methods of sensing temperature of an electronic device workpiece |
Sep. 2, 2008 |
| 7418643 |
Integrated circuit having electrically isolatable test circuitry |
Aug. 26, 2008 |
| 7418283 |
Adiabatic quantum computation with superconducting qubits |
Aug. 26, 2008 |
| 7416819 |
Test mask for optical and electron optical systems |
Aug. 26, 2008 |
| 7410837 |
Method of manufacturing mounting substrate |
Aug. 12, 2008 |
| 7411210 |
Semiconductor probe with resistive tip having metal shield thereon |
Aug. 12, 2008 |
| 7411294 |
Display device having misalignment detection pattern for detecting misalignment between conductive layer and insulating layer |
Aug. 12, 2008 |
| 7408189 |
Method of testing FPC bonding yield and FPC having testing pads thereon |
Aug. 5, 2008 |
| 7405423 |
Random number generating device |
Jul. 29, 2008 |
| 7399990 |
Wafer-level package having test terminal |
Jul. 15, 2008 |
| 7400157 |
Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes |
Jul. 15, 2008 |
| 7397260 |
Structure and method for monitoring stress-induced degradation of conductive interconnects |
Jul. 8, 2008 |
| 7393471 |
Anisotropic conductive sheet, its manufacturing method, and its application |
Jul. 1, 2008 |
| 7393619 |
Method and lithographic structure for measuring lengths of lines and spaces |
Jul. 1, 2008 |
| 7393754 |
Tape carrier type semiconductor device and method of producing the same |
Jul. 1, 2008 |
| 7394164 |
Semiconductor device having bumps in a same row for staggered probing |
Jul. 1, 2008 |
| 7390427 |
Hydrofluoroether as a heat-transfer fluid |
Jun. 24, 2008 |
| 7391226 |
Contact resistance test structure and methods of using same |
Jun. 24, 2008 |
| 7388224 |
Structure for determining thermal cycle reliability |
Jun. 17, 2008 |
| 7388385 |
Wafer dicing system |
Jun. 17, 2008 |
| 7381986 |
Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer |
Jun. 3, 2008 |
| 7375371 |
Structure and method for thermally stressing or testing a semiconductor device |
May. 20, 2008 |
| 7372072 |
Semiconductor wafer with test structure |
May. 13, 2008 |
| 7370257 |
Test vehicle data analysis |
May. 6, 2008 |
| 7368749 |
Method of detecting misalignment of ion implantation area |
May. 6, 2008 |
| 7368748 |
Test pixel and test pixel array for evaluating pixel quality in CMOS image sensor |
May. 6, 2008 |
| 7368208 |
Measuring phase errors on phase shift masks |
May. 6, 2008 |
| 7358527 |
Systems and methods for testing germanium devices |
Apr. 15, 2008 |
| 7355291 |
Overlay marks, methods of overlay mark design and methods of overlay measurements |
Apr. 8, 2008 |
| 7355435 |
On-chip detection of power supply vulnerabilities |
Apr. 8, 2008 |
| 7355201 |
Test structure for measuring electrical and dimensional characteristics |
Apr. 8, 2008 |
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