Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Browse by Category: Main > Physics
Class Information
Number: 257/48
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Test or calibration structure
Description: Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.










Patents under this class:

Patent Number Title Of Patent Date Issued
8710652 Embedded package and method for manufacturing the same Apr. 29, 2014
8709833 Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variations Apr. 29, 2014
8704384 Stacked die assembly Apr. 22, 2014
8704226 Three-dimensional integrated circuit having redundant relief structure for chip bonding section Apr. 22, 2014
8704225 Semiconductor integrated circuit Apr. 22, 2014
8704224 Semiconductor test structures Apr. 22, 2014
8704223 Semiconductor device Apr. 22, 2014
8692248 Integrated circuit die having input and output circuit pads, test circuitry, and multiplex circuitry Apr. 8, 2014
8692247 Integrated mechanical device for electrical switching Apr. 8, 2014
8692246 Leakage measurement structure having through silicon vias Apr. 8, 2014
8692245 Crack stop structure and method for forming the same Apr. 8, 2014
8691684 Layout and pad floor plan of power transistor for good performance of SPU and STOG Apr. 8, 2014
8685760 Contact resistance test structure and method suitable for three-dimensional integrated circuits Apr. 1, 2014
8680883 Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the same Mar. 25, 2014
8680881 Test method and interposer used therefor Mar. 25, 2014
8680653 Wafer and a method of dicing a wafer Mar. 25, 2014
8680524 Method of arranging pads in semiconductor device, semiconductor memory device using the method, and processing system having mounted therein the semiconductor memory device Mar. 25, 2014
8680523 Sensor for semiconductor degradation monitoring and modeling Mar. 25, 2014
8674357 Method for measuring impurity concentration profile, wafer used for same, and method for manufacturing semiconductor device using same Mar. 18, 2014
8674356 Electrically measurable on-chip IC serial identifier and methods for producing the same Mar. 18, 2014
8674355 Integrated circuit test units with integrated physical and electrical test regions Mar. 18, 2014
8673657 Semiconductor device including a circuit area and a monitor area having a plurality of monitor layers and method for manufacturing the same Mar. 18, 2014
8670246 Computers including an undiced semiconductor wafer with Faraday Cages and internal flexibility sipes Mar. 11, 2014
8669659 Semiconductor device and a method of manufacturing the same Mar. 11, 2014
8669555 Semiconductor device Mar. 11, 2014
8664656 Devices and methods for embedding semiconductors in printed circuit boards Mar. 4, 2014
8664113 Multilayer interconnect structure and method for integrated circuits Mar. 4, 2014
8659132 Microelectronic package assembly, method for disconnecting a microelectronic package Feb. 25, 2014
8659036 Fine tuning of emission spectra by combination of multiple emitter spectra Feb. 25, 2014
8659018 Semiconductor device and integrated semiconductor device Feb. 25, 2014
8654269 Liquid crystal display device Feb. 18, 2014
8653845 Test handler and method for operating the same for testing semiconductor devices Feb. 18, 2014
8653629 Semiconductor device and wafer Feb. 18, 2014
8653518 Semiconductor device Feb. 18, 2014
8652971 Cavity process etch undercut monitor Feb. 18, 2014
8648341 Methods and apparatus for testing pads on wafers Feb. 11, 2014
8648340 Semiconductor device for driving electric motor Feb. 11, 2014
8648339 Semiconductor device including first semiconductor chip including first pads connected to first terminals, and second semiconductor chip including second pads connected to second terminals Feb. 11, 2014
8639855 Information collection and storage for single core chips to 'N core chips Jan. 28, 2014
8637998 Semiconductor chip and semiconductor device Jan. 28, 2014
8637894 Organic light-emitting display apparatus that prevents a thick organic insulating layer from lifting Jan. 28, 2014
8633482 Semiconductor device test structures and methods Jan. 21, 2014
8629435 Methods of extracting fin heights and overlap capacitance and structures for performing the same Jan. 14, 2014
8628982 Method of depositing and inspecting an organic light emitting display panel Jan. 14, 2014
8624243 Display panel Jan. 7, 2014
8624242 Semiconductor integrated circuit Jan. 7, 2014
8624241 Semiconductor chip, stack-type semiconductor package Jan. 7, 2014
8623772 Method of forming patterns of semiconductor device Jan. 7, 2014
8623673 Structure and method for detecting defects in BEOL processing Jan. 7, 2014
8618826 Method and apparatus for de-embedding Dec. 31, 2013











 
 
  Recently Added Patents
Light modulators and optical apparatuses including the same
Process for filtering interferograms obtained from SAR images acquired on the same area
Systems and methods for automobile accident claims initiation
Piperazinedione compounds
Epoxy composition for encapsulating an optical semiconductor element
Method and apparatus for focusing electrical stimulation in the brain during electro-convulsive therapy
Method and structure of forming backside through silicon via connections
  Randomly Featured Patents
Motion artifacts reduction algorithm for two-exposure dual-energy radiography
Glove construction with means for removably securing accessories
Door
Metal complex-based electron-transfer mediators in dye-sensitized solar cells
Indazole-carboxamide compounds as 5-HT.sub.4 receptor agonists
Method and device for producing at least partially open-celled foam films from styrene polymers
Moisture sensor for purging system
Light emitting panel and light emitting display
Cat litter box
Sampling apparatus for cryogenic food freezers