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Class Information
Number: 257/387
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Field effect device > Having insulated electrode (e.g., mosfet, mos diode) > Insulated gate field effect transistor in integrated circuit > With means to reduce parasitic capacitance > Gate electrode overlaps at least one of source or drain by no more than depth of source or drain (e.g., self-aligned gate)
Description: Subject matter wherein the gate electrode overlaps at least one source or drain by no more than the depth of the source or the drain (e.g., self-aligned gate).
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7394095 |
Electrode substrate, thin film transistor, display device and their production |
Jul. 1, 2008 |
| 7385261 |
Extended drain metal oxide semiconductor transistor and manufacturing method thereof |
Jun. 10, 2008 |
| 7365361 |
Semiconductor device and method for manufacturing the same |
Apr. 29, 2008 |
| 7355245 |
Structure for reducing overlap capacitance in field effect transistors |
Apr. 8, 2008 |
| 7348629 |
Metal gated ultra short MOSFET devices |
Mar. 25, 2008 |
| 7332775 |
Protruding spacers for self-aligned contacts |
Feb. 19, 2008 |
| 7323726 |
Method and apparatus for coupling to a common line in an array |
Jan. 29, 2008 |
| 7288817 |
Reverse metal process for creating a metal silicide transistor gate structure |
Oct. 30, 2007 |
| 7253482 |
Structure for reducing overlap capacitance in field effect transistors |
Aug. 7, 2007 |
| 7221028 |
High voltage transistor and method of manufacturing the same |
May. 22, 2007 |
| 7220680 |
Method for photolithography in semiconductor manufacturing |
May. 22, 2007 |
| 7214994 |
Self aligned metal gates on high-k dielectrics |
May. 8, 2007 |
| 7176537 |
High performance CMOS with metal-gate and Schottky source/drain |
Feb. 13, 2007 |
| 7125787 |
Method of manufacturing insulated gate semiconductor device |
Oct. 24, 2006 |
| 7115923 |
Imaging with gate controlled charge storage |
Oct. 3, 2006 |
| 7102155 |
Electrode substrate, thin film transistor, display device and their production |
Sep. 5, 2006 |
| 7026691 |
Minimizing transistor size in integrated circuits |
Apr. 11, 2006 |
| 7023059 |
Trenches to reduce lateral silicide growth in integrated circuit technology |
Apr. 4, 2006 |
| 7015552 |
Dual work function semiconductor structure with borderless contact and method of fabricating the same |
Mar. 21, 2006 |
| 6958500 |
Semiconductor device having low resistivity source and drain electrodes |
Oct. 25, 2005 |
| 6927461 |
Semiconductor device having shared contact and fabrication method thereof |
Aug. 9, 2005 |
| 6921951 |
Thin film transistor and pixel structure thereof |
Jul. 26, 2005 |
| 6897534 |
Semiconductor device having gate electrode of stacked structure including polysilicon layer and metal layer and method of manufacturing the same |
May. 24, 2005 |
| 6894350 |
LDMOS transistor capable of attaining high withstand voltage with low on-resistance and having a structure suitable for incorporation with other MOS transistors |
May. 17, 2005 |
| 6888198 |
Straddled gate FDSOI device |
May. 3, 2005 |
| 6885072 |
Nonvolatile memory with undercut trapping structure |
Apr. 26, 2005 |
| 6879007 |
Low volt/high volt transistor |
Apr. 12, 2005 |
| 6876045 |
Semiconductor device and process for manufacturing the same |
Apr. 5, 2005 |
| 6858533 |
Semiconductor device having an etch stopper formed of a sin layer by low temperature ALD and method of fabricating the same |
Feb. 22, 2005 |
| 6800909 |
Semiconductor device and method of manufacturing the same |
Oct. 5, 2004 |
| 6794699 |
Annular gate and technique for fabricating an annular gate |
Sep. 21, 2004 |
| 6784491 |
MOS devices with reduced fringing capacitance |
Aug. 31, 2004 |
| 6777756 |
Semiconductor device |
Aug. 17, 2004 |
| 6770929 |
Method for uniform polish in microelectronic device |
Aug. 3, 2004 |
| 6759710 |
Self-aligned double-gate MOSFET by selective epitaxy and silicon wafer bonding techniques |
Jul. 6, 2004 |
| 6753590 |
High impedance antifuse |
Jun. 22, 2004 |
| 6744099 |
MIS semiconductor device and manufacturing method thereof |
Jun. 1, 2004 |
| 6730570 |
Method for forming a self-aligned contact of a semiconductor device and method for manufacturing a semiconductor device using the same |
May. 4, 2004 |
| 6727568 |
Semiconductor device having a shallow trench isolation and method of fabricating the same |
Apr. 27, 2004 |
| 6724054 |
Self-aligned contact formation using double SiN spacers |
Apr. 20, 2004 |
| 6709936 |
Narrow high performance MOSFET device design |
Mar. 23, 2004 |
| 6693326 |
Semiconductor device of SOI structure |
Feb. 17, 2004 |
| 6690070 |
Insulated gate semiconductor device and its manufacturing method |
Feb. 10, 2004 |
| 6680511 |
Integrated circuit devices providing improved short prevention |
Jan. 20, 2004 |
| 6674132 |
Memory cell and production method |
Jan. 6, 2004 |
| 6670641 |
Thin film transistor, method of manufacturing the same and thin film transistor liquid crystal display device |
Dec. 30, 2003 |
| 6670711 |
Semiconductor device including low dielectric constant insulating film formed on upper and side surfaces of the gate electrode |
Dec. 30, 2003 |
| 6653686 |
Structure and method of controlling short-channel effect of very short channel MOSFET |
Nov. 25, 2003 |
| 6642584 |
Dual work function semiconductor structure with borderless contact and method of fabricating the same |
Nov. 4, 2003 |
| 6639575 |
Liquid crystal display |
Oct. 28, 2003 |
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