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Class Information
Number: 257/386
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Field effect device > Having insulated electrode (e.g., mosfet, mos diode) > Insulated gate field effect transistor in integrated circuit > With means to reduce parasitic capacitance
Description: Subject matter wherein the device contains means to reduce unwanted capacitance between elements of the field effect transistor.


Sub-classes under this class:

Class Number Class Name Patents
257/387 Gate electrode overlaps at least one of source or drain by no more than depth of source or drain (e.g., self-aligned gate) 168
257/389 With thick insulator over source or drain region 149


Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
7569897 Low-capacitance contact for long gate-length devices with small contacted pitch Aug. 4, 2009
7545007 MOS varactor with segmented gate doping Jun. 9, 2009
7528453 Field effect transistor with local source/drain insulation and associated method of production May. 5, 2009
7521714 Capacitor and manufacturing method thereof Apr. 21, 2009
7420241 Semiconductor memory device and method of manufacturing the same Sep. 2, 2008
7420260 Power semiconductor device for suppressing substrate recirculation current and method of fabricating power semiconductor device Sep. 2, 2008
7335956 Capacitor device with vertically arranged capacitor regions of various kinds Feb. 26, 2008
7288817 Reverse metal process for creating a metal silicide transistor gate structure Oct. 30, 2007
7282772 Low-capacitance contact for long gate-length devices with small contacted pitch Oct. 16, 2007
7233515 Integrated memory arrangement based on resistive memory cells and production method Jun. 19, 2007
7205618 Semiconductor device and method for manufacturing the same Apr. 17, 2007
7161199 Transistor structure with stress modification and capacitive reduction feature in a width direction and method thereof Jan. 9, 2007
7119393 Transistor having fully-depleted junctions to reduce capacitance and increase radiation immunity in an integrated circuit Oct. 10, 2006
7115957 Semiconductor raised source-drain structure Oct. 3, 2006
7034347 Charge detecting device Apr. 25, 2006
7023059 Trenches to reduce lateral silicide growth in integrated circuit technology Apr. 4, 2006
6995434 Semiconductor device and method of fabricating the same Feb. 7, 2006
6992355 Semiconductor-on-insulator constructions Jan. 31, 2006
6951621 Method for forming a product sensor, and a product sensor Oct. 4, 2005
6906419 Semiconductor device having a wiring layer of damascene structure and method for manufacturing the same Jun. 14, 2005
6891232 Semiconductor device having an injection substance to knock against oxygen and manufacturing method of the same May. 10, 2005
6891223 Transistor configuration with a structure for making electrical contact with electrodes of a trench transistor cell May. 10, 2005
6864547 Semiconductor device having a ghost source/drain region and a method of manufacture therefor Mar. 8, 2005
6815771 Silicon on insulator device and layout method of the same Nov. 9, 2004
6806172 Physical vapor deposition of nickel Oct. 19, 2004
6794722 Field effect transistor with reverse dopant grandient region Sep. 21, 2004
6787862 Gas insulated gate field effect transistor Sep. 7, 2004
6787841 Semiconductor element and semiconductor memory device using the same Sep. 7, 2004
6770929 Method for uniform polish in microelectronic device Aug. 3, 2004
6765268 Multiple transistors having a common gate pad between first group of drains and second group of drains Jul. 20, 2004
6756644 Ultra low QGD power MOSFET Jun. 29, 2004
6740884 Imaging array and methods for fabricating same May. 25, 2004
6696354 Method of forming salicide Feb. 24, 2004
6693335 Semiconductor raised source-drain structure Feb. 17, 2004
6690062 Transistor configuration with a shielding electrode outside an active cell array and a reduced gate-drain capacitance Feb. 10, 2004
6686059 Semiconductor device manufacturing method and semiconductor device Feb. 3, 2004
6686636 Semiconductor raised source-drain structure Feb. 3, 2004
6683355 Semiconductor raised source-drain structure Jan. 27, 2004
6680543 Semiconductor integrated circuit and system Jan. 20, 2004
6674117 Semiconductor element and semiconductor memory device using the same Jan. 6, 2004
6639264 Method and structure for surface state passivation to improve yield and reliability of integrated circuit structures Oct. 28, 2003
6639288 Semiconductor device with a particular conductor arrangement Oct. 28, 2003
6633070 Semiconductor device Oct. 14, 2003
6630715 Asymmetrical MOSFET layout for high currents and high speed operation Oct. 7, 2003
6603180 Semiconductor device having large-area silicide layer and process of fabrication thereof Aug. 5, 2003
6597045 Semiconductor raised source-drain structure Jul. 22, 2003
6573588 Capacitance element Jun. 3, 2003
6573572 Damascene structure and method of making Jun. 3, 2003
6573556 Parasitic surface transfer transistor cell (PASTT cell) for bi-level and multi-level NAND flash memory Jun. 3, 2003
6555883 Lateral power MOSFET for high switching speeds Apr. 29, 2003

1 2 3 4


 
 
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