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Class Information
Number: 257/375
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Field effect device > Having insulated electrode (e.g., mosfet, mos diode) > Insulated gate field effect transistor in integrated circuit > Complementary insulated gate field effect transistors > With pn junction to collect injected minority carriers to prevent parasitic bipolar transistor action > With means to reduce substrate spreading resistance (e.g., heavily doped substrate)
Description: Subject matter wherein the means to prevent latchup includes means to reduce the electrical resistance of the substrate to reduce voltage differences between different parts of the substrate due to currents flowing therethrough.










Patents under this class:
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Patent Number Title Of Patent Date Issued
8609502 Method of manufacturing semiconductor device including insulated gate bipolar transistor and diode Dec. 17, 2013
8507352 Method of manufacturing semiconductor device including insulated gate bipolar transistor and diode Aug. 13, 2013
8497195 Method for radiation hardening a semiconductor device Jul. 30, 2013
8354292 CMOS image sensor having a crosstalk prevention structure and method of manufacturing the same Jan. 15, 2013
8168999 Semiconductor device having IGBT and diode May. 1, 2012
8138530 CMOS image sensor having a crosstalk prevention structure Mar. 20, 2012
8093145 Methods for operating and fabricating a semiconductor device having a buried guard ring structure Jan. 10, 2012
8080853 Semiconductor device including insulated gate bipolar transistor and diode Dec. 20, 2011
7989329 Removal of surface dopants from a substrate Aug. 2, 2011
7977753 High voltage BICMOS device and method for manufacturing the same Jul. 12, 2011
7944000 Semiconductor resistor, method of manufacturing the same, and current generating device using the same May. 17, 2011
7911003 Semiconductor integrated circuit device Mar. 22, 2011
7859058 Semiconductor device having a SRAM with a substrate contact and method for fabricating the same Dec. 28, 2010
7804138 Buried guard ring and radiation hardened isolation structures and fabrication methods Sep. 28, 2010
7741680 Electro-static discharge and latchup resistant semiconductor device Jun. 22, 2010
7714394 CMOS semiconductor devices having elevated source and drain regions and methods of fabricating the same May. 11, 2010
7629654 Buried guard ring structures and fabrication methods Dec. 8, 2009
7396715 Semiconductor device and manufacturing method of the same Jul. 8, 2008
7394156 Semiconductor integrated circuit device and method of producing the same Jul. 1, 2008
7390680 Method to selectively identify reliability risk die based on characteristics of local regions on the wafer Jun. 24, 2008
RE40339 Silicon-on-insulator chip having an isolation barrier for reliability May. 27, 2008
7355250 Electrostatic discharge device with controllable holding current Apr. 8, 2008
7326977 Low noise field effect transistor Feb. 5, 2008
7304354 Buried guard ring and radiation hardened isolation structures and fabrication methods Dec. 4, 2007
7132715 Semiconductor device having a spacer layer doped with slower diffusing atoms than substrate Nov. 7, 2006
7019379 Semiconductor device comprising voltage regulator element Mar. 28, 2006
6995432 Semiconductor device having a gate oxide film with some NTFTS with LDD regions and no PTFTS with LDD regions Feb. 7, 2006
6972466 Bipolar transistors with low base resistance for CMOS integrated circuits Dec. 6, 2005
6963113 Method of body contact for SOI MOSFET Nov. 8, 2005
6946711 Semiconductor device Sep. 20, 2005
6943411 Semiconductor device including a low resistance wiring layer Sep. 13, 2005
6853040 MOS transistor and fabrication method thereof Feb. 8, 2005
6833591 Semiconductor device and method for fabricating the same Dec. 21, 2004
6831330 Method and apparatus for forming an integrated circuit electrode having a reduced contact area Dec. 14, 2004
6737709 Semiconductor device May. 18, 2004
6734496 Semiconductor device May. 11, 2004
6649983 Vertical bipolar transistor formed using CMOS processes Nov. 18, 2003
6566756 Semiconductor device with porous interlayer film of a range of average diameter having partially closed holes May. 20, 2003
6563173 Silicon-on-insulator chip having an isolation barrier for reliability May. 13, 2003
6563159 Substrate of semiconductor integrated circuit May. 13, 2003
6559486 Etching mask, process for forming contact holes using same, and semiconductor device made by the process May. 6, 2003
6552401 Use of gate electrode workfunction to improve DRAM refresh Apr. 22, 2003
6507080 MOS transistor and fabrication method thereof Jan. 14, 2003
6500714 Method and structure for manufacturing ROMs in a semiconductor process Dec. 31, 2002
6492684 Silicon-on-insulator chip having an isolation barrier for reliability Dec. 10, 2002
6420763 Semiconductor device having a retrograde well structure and method of manufacturing thereof Jul. 16, 2002
6396109 Isolated NMOS transistor fabricated in a digital BiCMOS process May. 28, 2002
6380595 Semiconductor device and manufacturing method therefor Apr. 30, 2002
6355948 Semiconductor integrated circuit device Mar. 12, 2002
6262457 Method of producing a transistor structure Jul. 17, 2001

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