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Class Information
Number: 257/360
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Field effect device > Having insulated electrode (e.g., mosfet, mos diode) > With overvoltage protective means > For protecting against gate insulator breakdown > Protection device includes insulated gate transistor structure (e.g., combined with resistor element)
Description: Subject matter wherein the means for protecting against insulator breakdown is an insulated gate transistor structure.


Sub-classes under this class:

Class Number Class Name Patents
257/361 For operation as bipolar or punchthrough element 267


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13

Patent Number Title Of Patent Date Issued
6538300 Precision high-frequency capacitor formed on semiconductor substrate Mar. 25, 2003
6534834 Polysilicon bounded snapback device Mar. 18, 2003
6529035 Arrangement for improving the ESD protection in a CMOS buffer Mar. 4, 2003
6524893 Electrostatic discharge protection device for semiconductor integrated circuit, method for producing the same, and electrostatic discharge protection circuit using the same Feb. 25, 2003
6521952 Method of forming a silicon controlled rectifier devices in SOI CMOS process for on-chip ESD protection Feb. 18, 2003
6504216 Electrostatic discharge protective circuit Jan. 7, 2003
6504213 SOI-structure field-effect transistor and method of manufacturing the same Jan. 7, 2003
6498373 ESD protection CMOS structure with dynamic substrate control Dec. 24, 2002
6495888 Semiconductor device with p-n junction diode and method of forming the same Dec. 17, 2002
6492686 Integrated circuit having buffering circuitry with slew rate control Dec. 10, 2002
6493047 Liquid crystal display panel having electrostatic discharge prevention circuitry Dec. 10, 2002
6486515 ESD protection network used for SOI technology Nov. 26, 2002
6479870 ESD device with salicide layer isolated by shallow trench isolation for saving one salicide block photomask Nov. 12, 2002
6479869 Semiconductor device with enhanced protection from electrostatic breakdown Nov. 12, 2002
6479872 Dynamic substrate-coupled electrostatic discharging protection circuit Nov. 12, 2002
6476422 Electrostatic discharge protection circuit with silicon controlled rectifier characteristics Nov. 5, 2002
6476449 Silicide block for ESD protection devices Nov. 5, 2002
6472710 Field MOS transistor and semiconductor integrated circuit including the same Oct. 29, 2002
6469354 Semiconductor device having a protective circuit Oct. 22, 2002
6466423 Electrostatic discharge protection device for mixed voltage application Oct. 15, 2002
6462384 Semiconductor device for ESD protection Oct. 8, 2002
6462383 Semiconductor device with embedded protection element Oct. 8, 2002
6462381 Silicon-on-insulator (SOI) electrostatic discharge (ESD) protection device with backside contact opening Oct. 8, 2002
6462380 ESD protection circuit for advanced technologies Oct. 8, 2002
6462390 Multi-film capping layer for a salicide process Oct. 8, 2002
6455898 Electrostatic discharge input protection for reducing input resistance Sep. 24, 2002
6455897 Semiconductor device having electrostatic discharge protection circuit Sep. 24, 2002
6448619 Semiconductor device Sep. 10, 2002
6448593 Type-1 polysilicon electrostatic discharge transistors Sep. 10, 2002
6445039 System and method for ESD Protection Sep. 3, 2002
6441460 Largely voltage-independent electrical resistor formed in an integrated semiconductor circuit Aug. 27, 2002
6441437 Integrated semiconductor circuit with protective structure for protection against electrostatic discharge Aug. 27, 2002
6429505 SOI semiconductor controlled rectifier and diode for electrostatic discharge protection Aug. 6, 2002
6424013 Body-triggered ESD protection circuit Jul. 23, 2002
6420774 Low junction capacitance semiconductor structure and I/O buffer Jul. 16, 2002
6420761 Asymmetrical semiconductor device for ESD protection Jul. 16, 2002
6417544 Diode-like plasma induced damage protection structure Jul. 9, 2002
6414358 Arrangements to reduce charging damage in structures of integrated circuits Jul. 2, 2002
6414370 Semiconductor circuit preventing electromagnetic noise Jul. 2, 2002
6404017 Protection circuit for semiconductor integrated circuit that can discriminate between program voltage and static electricity Jun. 11, 2002
6404016 Semiconductor device Jun. 11, 2002
6399991 Semiconductor integrated circuit Jun. 4, 2002
6392860 Electrostatic discharge protection circuit with gate-modulated field-oxide device May. 21, 2002
6393603 Circuit design method calculating antenna size of conductive member connected to gate oxide film of transistor with approximate expression May. 21, 2002
6388292 Distributed MOSFET structure with enclosed gate for improved transistor size/layout area ratio and uniform ESD triggering May. 14, 2002
6384452 Electrostatic discharge protection device with monolithically formed resistor-capacitor portion May. 7, 2002
6376881 Protective element formed in an SOI substrate for preventing a breakdown in an oxide film located below a diffused resistor Apr. 23, 2002
6373105 Latch-up protection circuit for integrated circuits biased with multiple power supplies Apr. 16, 2002
6373104 Circuit method for reducing parasitic bipolar effects during electrostatic discharges Apr. 16, 2002
6369427 Integrated circuitry, interface circuit of an integrated circuit device, and cascode circuitry Apr. 9, 2002

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