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Class Information
Number: 257/221
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Field effect device > Charge transfer device > Majority signal carrier (e.g., buried or bulk channel, or peristaltic) > Impurity concentration variation > Along the length of the channel (e.g., doping variations for transfer directionality)
Description: Subject matter wherein the impurity dopant ion concentration in the channel of the device varies along the length of the channel, whether the channel is horizontally or vertically oriented.










Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
8643100 Field effect transistor having multiple effective oxide thicknesses and corresponding multiple channel doping profiles Feb. 4, 2014
8581387 Through wire interconnect (TWI) having bonded connection and encapsulating polymer layer Nov. 12, 2013
8426279 Asymmetric transistor Apr. 23, 2013
8404523 Method for fabricating stacked semiconductor system with encapsulated through wire interconnects (TWI) Mar. 26, 2013
8217510 Semiconductor module system having stacked components with encapsulated through wire interconnects (TWI) Jul. 10, 2012
8212906 Skimmed charge capture and charge packet removal for increased effective pixel photosensor full well capacity Jul. 3, 2012
8203151 Semiconductor device and method for fabricating the same Jun. 19, 2012
8164121 Charge coupled device with potential gradient region between two control gate regions Apr. 24, 2012
8124979 Thin film transistor and method of manufacturing the same Feb. 28, 2012
8120167 System with semiconductor components having encapsulated through wire interconnects (TWI) Feb. 21, 2012
8013365 CMOS image sensor configured to provide reduced leakage current Sep. 6, 2011
7999290 Dual panel type organic electroluminescent device and method of fabricating the same Aug. 16, 2011
7910964 Semiconductor range-finding element and solid-state imaging device Mar. 22, 2011
7883908 Method for fabricating semiconductor component having encapsulated through wire interconnect (TWI) Feb. 8, 2011
7875979 Metal line of semiconductor device having a diffusion barrier including CRxBy and method for forming the same Jan. 25, 2011
7804151 Integrated circuit structure, design structure, and method having improved isolation and harmonics Sep. 28, 2010
7791161 Semiconductor devices employing poly-filled trenches Sep. 7, 2010
7754603 Multi-functional chalcogenide electronic devices having gain Jul. 13, 2010
7719036 Charge coupled device with high quantum efficiency May. 18, 2010
7659612 Semiconductor components having encapsulated through wire interconnects (TWI) Feb. 9, 2010
7586137 Non-volatile memory device and method of fabricating the same Sep. 8, 2009
7479669 Current aperture transistors and methods of fabricating same Jan. 20, 2009
7387908 CMOS imager with enhanced transfer of charge and low voltage operation and method of formation Jun. 17, 2008
7378714 Semiconductor device and its manufacturing method May. 27, 2008
7329926 Semiconductor device with constricted current passage Feb. 12, 2008
7157754 Solid-state imaging device and interline transfer CCD image sensor Jan. 2, 2007
7119379 Semiconductor device Oct. 10, 2006
7078745 CMOS imager with enhanced transfer of charge and low voltage operation Jul. 18, 2006
7075128 Charge transfer element having high output sensitivity Jul. 11, 2006
6949777 Method of controlling insulated gate transistor Sep. 27, 2005
6909126 Imager cell with pinned transfer gate Jun. 21, 2005
6867438 Solid-state imaging device and manufacturing method thereof Mar. 15, 2005
6847065 Radiation-hardened transistor fabricated by modified CMOS process Jan. 25, 2005
6787829 LCD panel Sep. 7, 2004
6762441 Imager cell with pinned transfer gate Jul. 13, 2004
6744083 Submicron MOSFET having asymmetric channel profile Jun. 1, 2004
6657243 Semiconductor device with SRAM section including a plurality of memory cells Dec. 2, 2003
6645839 Method for improving a doping profile for gas phase doping Nov. 11, 2003
6639259 Charge-coupled device Oct. 28, 2003
6603144 Solid-state imaging device and method for fabricating same Aug. 5, 2003
6590241 MOS transistors with improved gate dielectrics Jul. 8, 2003
6586784 Accumulation mode clocking of a charge-coupled device Jul. 1, 2003
6583474 Semiconductor device Jun. 24, 2003
6573541 Charge coupled device with channel well Jun. 3, 2003
6518605 Solid state imaging pickup device and method for manufacturing the same Feb. 11, 2003
6441409 Dual-line type charge transfer device Aug. 27, 2002
6426238 Charge transfer device and solid image pickup apparatus using the same Jul. 30, 2002
6420759 Semiconductor device Jul. 16, 2002
6333526 Charge transfer device and a manufacturing process therefor Dec. 25, 2001
6225669 Non-uniform gate/dielectric field effect transistor May. 1, 2001

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