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Class Information
Number: 257/170
Name: Active solid-state devices (e.g., transistors, solid-state diodes) > Regenerative type switching device (e.g., scr, comfet, thyristor) > With means to increase breakdown voltage > Surface feature (e.g., guard ring, groove, mesa, etc.)
Description: Subject matter wherein the means for increasing breakdown voltage includes a surface feature (e.g., a guard ring or groove or mesa).










Sub-classes under this class:

Class Number Class Name Patents
257/171 Edge feature (e.g., beveled edge) 74


Patents under this class:
1 2 3 4 5

Patent Number Title Of Patent Date Issued
8686508 Structures, methods and applications for electrical pulse anneal processes Apr. 1, 2014
8643104 Lateral diffusion metal oxide semiconductor transistor structure Feb. 4, 2014
8643146 Semiconductor device Feb. 4, 2014
8633543 Electro-static discharge protection circuit and semiconductor device Jan. 21, 2014
8587023 Guard rings with local coupling capacitance Nov. 19, 2013
8587071 Electrostatic discharge (ESD) guard ring protective structure Nov. 19, 2013
8564024 Trench-based power semiconductor devices with increased breakdown voltage characteristics Oct. 22, 2013
8502385 Power semiconductor device Aug. 6, 2013
8344416 Integrated circuits using guard rings for ESD, systems, and methods for forming the integrated circuits Jan. 1, 2013
8274080 Semiconductor wafer including guard ring patterns and process monitoring patterns Sep. 25, 2012
8242573 Semiconductor device with isolation formed between digital circuit and analog circuit Aug. 14, 2012
8232593 Power semiconductor device Jul. 31, 2012
8227892 Multi-track integrated circuit inductor Jul. 24, 2012
8198651 Electro static discharge protection device Jun. 12, 2012
8110853 Guard ring structures for high voltage CMOS/low voltage CMOS technology using LDMOS (lateral double-diffused metal oxide semiconductor) device fabrication Feb. 7, 2012
8108185 Electrostatic discharge voltage resistive current modeling method of electrostatic discharge protection device Jan. 31, 2012
8093676 Semiconductor component including an edge termination having a trench and method for producing Jan. 10, 2012
8076749 Semiconductor device Dec. 13, 2011
8076695 Semiconductor device Dec. 13, 2011
7968936 Quasi-vertical gated NPN-PNP ESD protection device Jun. 28, 2011
7968976 Guard ring extension to prevent reliability failures Jun. 28, 2011
7952172 Semiconductor optical element May. 31, 2011
7898001 Single photon detector and associated methods for making the same Mar. 1, 2011
7898056 Seal ring for reducing noise coupling within a system-on-a-chip (SoC) Mar. 1, 2011
7893459 Seal ring structures with reduced moisture-induced reliability degradation Feb. 22, 2011
7838377 Power semiconductor devices with mesa structures and buffer layers including mesa steps Nov. 23, 2010
7834351 Semiconductor device Nov. 16, 2010
7821028 Power semiconductor component with trench-type field ring structure Oct. 26, 2010
7816706 Power semiconductor device Oct. 19, 2010
7808014 Semiconductor device having insulated gate bipolar transistor Oct. 5, 2010
7759173 Methods for charge dissipation in integrated circuits Jul. 20, 2010
7759734 Semiconductor device Jul. 20, 2010
7741226 Optimal tungsten through wafer via and process of fabricating same Jun. 22, 2010
7719025 Integrated circuit ESD protection May. 18, 2010
7714355 Method of controlling the breakdown voltage of BSCRs and BJT clamps May. 11, 2010
7663159 Seal ring corner design Feb. 16, 2010
7649213 Semiconductor device Jan. 19, 2010
7645689 Gallium nitride-based light emitting device having ESD protection capacity and method for manufacturing the same Jan. 12, 2010
7642626 Semiconductor devices including mesa structures and multiple passivation layers Jan. 5, 2010
7629626 Semiconductor device having insulated gate bipolar transistor Dec. 8, 2009
7615454 Embedded stressed nitride liners for CMOS performance improvement Nov. 10, 2009
7615391 Solar cell and method of fabricating the same Nov. 10, 2009
7612371 Structure to monitor arcing in the processing steps of metal layer build on silicon-on-insulator semiconductors Nov. 3, 2009
7582918 Semiconductor device with enhanced breakdown voltage Sep. 1, 2009
7582916 Silicon controlled rectifier Sep. 1, 2009
7566915 Guard ring extension to prevent reliability failures Jul. 28, 2009
7566935 ESD structure without ballasting resistors Jul. 28, 2009
7547586 Method of making a self aligned ion implanted gate and guard ring structure for use in a sit Jun. 16, 2009
7538346 Semiconductor device May. 26, 2009
7525178 Semiconductor device with capacitively coupled field plate Apr. 28, 2009

1 2 3 4 5










 
 
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