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Class Information
Number: 250/559.48
Name: Radiant energy > Photocells; circuits and apparatus > With circuit for evaluating a web, strand, strip, or sheet > With indication of presence of material or feature > With defect discrimination circuitry > With transversal scan
Description: Subject matter wherein the field of view of the photocell is scanned transversally across sections of the material.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6710868 |
Optical inspection system with dual detection heads |
Mar. 23, 2004 |
| 6670627 |
Apparatus and method for continuous surface examination comprising a light shielding member at outer ends of the examined surface |
Dec. 30, 2003 |
| 6622621 |
Device for detecting register marks |
Sep. 23, 2003 |
| 6621082 |
Automatic focusing system for scanning electron microscope equipped with laser defect detection function |
Sep. 16, 2003 |
| 6548821 |
Method and apparatus for inspecting substrates |
Apr. 15, 2003 |
| 6538252 |
Method and device for determining the alignment of line formations in areal, especially longitudinally moved, webs of a structural formed body |
Mar. 25, 2003 |
| 6462813 |
Surface defect inspection system and method |
Oct. 8, 2002 |
| 6426510 |
Device and method for inspecting pattern shapes |
Jul. 30, 2002 |
| 6219135 |
Device for optically recording, digitally, a parameter on a longitudinally moved thread-type material |
Apr. 17, 2001 |
| 6167355 |
High accuracy particle dimension measurement system |
Dec. 26, 2000 |
| 5966677 |
High accuracy particle dimension measurement system |
Oct. 12, 1999 |
| 5917590 |
Optical inspection device and lithographic apparatus provided with such a device |
Jun. 29, 1999 |
| 5808735 |
Method for characterizing defects on semiconductor wafers |
Sep. 15, 1998 |
| 5798830 |
Method of establishing thresholds for image comparison |
Aug. 25, 1998 |
| 5745244 |
Scanning device for scanning a physical property of a fibrous web |
Apr. 28, 1998 |
| 5644392 |
Scanning system for lumber |
Jul. 1, 1997 |
| 5625197 |
Method of determining a scanning interval in surface inspection |
Apr. 29, 1997 |
| 5621220 |
Apparatus for evaluating measuring values |
Apr. 15, 1997 |
| 5615777 |
Egg candling system |
Apr. 1, 1997 |
| 5591985 |
Surface state inspecting system including a scanning optical system for scanning a surface to be inspected with a first light and for simultaneously scanning a diffraction grating with a secon |
Jan. 7, 1997 |
| 5559341 |
System for detecting defects in articles using a scanning width which is less than width of portion of the article scanned |
Sep. 24, 1996 |
| 5479252 |
Laser imaging system for inspection and analysis of sub-micron particles |
Dec. 26, 1995 |
| 5471066 |
Defect inspection apparatus of rotary type |
Nov. 28, 1995 |
| 5459330 |
Process and device for the inspection of glass |
Oct. 17, 1995 |
| 5448350 |
Surface state inspection apparatus and exposure apparatus including the same |
Sep. 5, 1995 |
| 5412220 |
Optical scanning device for lumber |
May. 2, 1995 |
| 5389794 |
Surface pit and mound detection and discrimination system and method |
Feb. 14, 1995 |
| 5381225 |
Surface-condition inspection apparatus |
Jan. 10, 1995 |
| 5337140 |
Optical detecting system wtih self-correction |
Aug. 9, 1994 |
| 5331178 |
Optical surface inspecting system for inspecting the surface of a rolling roll having mechanism for keeping clean a window through which a camera detects a condition of the rolling roll |
Jul. 19, 1994 |
| 5210592 |
Method and apparatus for determining the optical quality of a transparent plate |
May. 11, 1993 |
| 5166535 |
Surface inspecting apparatus with surface inspection width adjustment |
Nov. 24, 1992 |
| 5155371 |
Apparatus for detecting deformations in pressed members |
Oct. 13, 1992 |
| 5074668 |
Surface inspection apparatus |
Dec. 24, 1991 |
| 5008558 |
System for detecting minute particles on or above a substrate |
Apr. 16, 1991 |
| 5006722 |
Flaw annunciator with a controllable display means for an automatic inspection system |
Apr. 9, 1991 |
| 4982105 |
Surface inspecting apparatus with strip width dividing means |
Jan. 1, 1991 |
| 4947684 |
System and process for detecting properties of travelling sheets in the machine direction |
Aug. 14, 1990 |
| 4933566 |
Method of detecting tape defects |
Jun. 12, 1990 |
| 4922337 |
Time delay and integration of images using a frame transfer CCD sensor |
May. 1, 1990 |
| 4914309 |
Discriminating type flaw detector for light-transmitting plate materials |
Apr. 3, 1990 |
| 4914308 |
Web defect scanning apparatus with incandescent illumination means |
Apr. 3, 1990 |
| 4903528 |
System and process for detecting properties of travelling sheets in the cross direction |
Feb. 27, 1990 |
| 4868403 |
Surface inspecting apparatus |
Sep. 19, 1989 |
| 4861984 |
Surface inspection or ranging apparatus with image derotation |
Aug. 29, 1989 |
| 4827142 |
Method and system for optically testing sawn timber for faults |
May. 2, 1989 |
| 4816666 |
Apparatus and methods for inspection of electrical materials and components |
Mar. 28, 1989 |
| 4794264 |
Surface defect detection and confirmation system and method |
Dec. 27, 1988 |
| 4764681 |
Method of and apparatus for electrooptical inspection of articles |
Aug. 16, 1988 |
| 4760270 |
Method of and apparatus for comparing data signals in an electrooptical inspection system |
Jul. 26, 1988 |
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