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Class Information
Number: 250/559.47
Name: Radiant energy > Photocells; circuits and apparatus > With circuit for evaluating a web, strand, strip, or sheet > With indication of presence of material or feature > With defect discrimination circuitry > With counting means
Description: Subject matter having means to count the number of defects or numbers of types of defects which are detected over a period of time.


Patents under this class:

Patent Number Title Of Patent Date Issued
7095763 Semiconductor wafer carrier mapping sensor Aug. 22, 2006
7027637 Adaptive threshold determination for ball grid array component modeling Apr. 11, 2006
6683321 Disc counter Jan. 27, 2004
6346986 Non-intrusive pellicle height measurement system Feb. 12, 2002
6130437 Sensor and detection system having wide diverging beam optics Oct. 10, 2000
6049075 Method for detecting origin point of position sensor Apr. 11, 2000
6033503 Adhesive sensing assembly for end jointed beam Mar. 7, 2000
5955728 Method for detecting origin point of position sensor Sep. 21, 1999
5900639 Apparatus for detecting the presence and speed of a record medium May. 4, 1999
5672863 Anti-dither optical container sensor with sensors separation measurement Sep. 30, 1997
5614709 Method for accurately counting conveyed workpieces regardless of variations in conveyor speed Mar. 25, 1997
5283623 Method and system for the detection of faults in a length of textile Feb. 1, 1994
5220178 Apparatus and process for detecting the presence of defects on a moving sheet of material Jun. 15, 1993
5033095 Scanning image analyzer for accumulating quantifiable contaminants of webs Jul. 16, 1991
5006722 Flaw annunciator with a controllable display means for an automatic inspection system Apr. 9, 1991
4916629 Method for determination of pith location relative to lumber surfaces Apr. 10, 1990
4831545 Method for determination of pith location relative to lumber surfaces May. 16, 1989
4743749 Self compensating circuit for measuring rapidly occurring optoelectronically detectable events May. 10, 1988
4655349 System for automatically inspecting transparent containers for sidewall and dimensional defects Apr. 7, 1987
4581632 Optical inspection apparatus for moving articles Apr. 8, 1986
4508450 System for checking defects on a flat surface of an object Apr. 2, 1985
4467350 Method and apparatus for rapidly extracting significant data from a sparse object Aug. 21, 1984
4467214 Method of and apparatus for detecting external defects of a circular sealing member Aug. 21, 1984
4446481 Automatic product inspection system May. 1, 1984
4389575 Fabric inspection system Jun. 21, 1983
4376583 Surface inspection scanning system Mar. 15, 1983
4268172 Method of and system for automatically adjusting a threshold level of a pulse generating circuit to inspect a web May. 19, 1981
4253113 Method and apparatus for detecting surface defects on a band travelling at high speed Feb. 24, 1981
4249081 Defect detection system Feb. 3, 1981
4205769 Methods of and system for counting holes and for detecting missing holes in a web Jun. 3, 1980
4194127 Process and device for checking substrate wafers Mar. 18, 1980
4166029 Apparatus for sorting objects Aug. 28, 1979
4093866 Diffraction pattern amplitude analysis for use in fabric inspection Jun. 6, 1978
4075498 Non-woven fabric defect detecting device Feb. 21, 1978
4060907 Media skew compensator Dec. 6, 1977
4057350 Apparatus for counting crimp in fibers Nov. 8, 1977
4014615 Detection of faults in a predetermined area of a surface Mar. 29, 1977



 
 
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