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Class Information
Number: 250/559.46
Name: Radiant energy > Photocells; circuits and apparatus > With circuit for evaluating a web, strand, strip, or sheet > With indication of presence of material or feature > With defect discrimination circuitry > With camera or plural detectors
Description: Subject matter under 559.45 wherein the detection means comprises plural detectors or a detection array camera.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7560720 |
Methods and apparatuses of detecting foreign particles or faults in a plurality of filled containers |
Jul. 14, 2009 |
| 7542821 |
Multi-unit process spatial synchronization of image inspection systems |
Jun. 2, 2009 |
| 7476834 |
Diagnosis system including correlating radiographed image data with patient information |
Jan. 13, 2009 |
| 7456948 |
Method for detecting particles and defects and inspection equipment thereof |
Nov. 25, 2008 |
| 7417244 |
Surface inspection apparatus and method thereof |
Aug. 26, 2008 |
| 7394084 |
Method of generating image and illumination device for inspecting substrate |
Jul. 1, 2008 |
| 7330583 |
Integrated visual imaging and electronic sensing inspection systems |
Feb. 12, 2008 |
| 7242016 |
Surface inspection apparatus and method thereof |
Jul. 10, 2007 |
| 7227628 |
Wafer inspection systems and methods for analyzing inspection data |
Jun. 5, 2007 |
| 7202491 |
Method for sensing wafers located inside a closed wafer cassette |
Apr. 10, 2007 |
| 7173270 |
Detector system for detecting a height of a particle, and lithographic apparatus and device manufacturing method including the same. |
Feb. 6, 2007 |
| 7166856 |
Apparatus and method to inspect display panels |
Jan. 23, 2007 |
| 7104127 |
Nondestructive method for inspecting cladding tubes |
Sep. 12, 2006 |
| 7015445 |
Method for optimizing inspection speed in low, and fluorescent light applications without sacrificing signal to noise ratio, resolution, or focus quality |
Mar. 21, 2006 |
| 7004421 |
Inspection device of winding appearance of tape and improvement processing method for the same |
Feb. 28, 2006 |
| 6989548 |
Inspection device for metal rings of a continuously variable transmission belt |
Jan. 24, 2006 |
| 6972422 |
Method for measuring particles in glass substrate |
Dec. 6, 2005 |
| 6936836 |
Method and apparatus for examining fiber material traveling in a fiber processing machine |
Aug. 30, 2005 |
| 6919557 |
Device for continuous movement of objects with symmetry, use for visual inspection and control |
Jul. 19, 2005 |
| 6894302 |
Surface inspection apparatus and method thereof |
May. 17, 2005 |
| 6797976 |
Method and apparatus for examining defects in or on sheet material |
Sep. 28, 2004 |
| 6794635 |
Apparatus and method for detecting an amount of depolarization of a linearly polarized beam |
Sep. 21, 2004 |
| 6784447 |
Vision system with reflective device for industrial parts |
Aug. 31, 2004 |
| 6753542 |
Defect detection apparatus and storage medium readable by computer |
Jun. 22, 2004 |
| 6750466 |
Web inspection system |
Jun. 15, 2004 |
| 6747697 |
Method and apparatus for digital image defect correction and noise filtering |
Jun. 8, 2004 |
| 6686602 |
Patterned wafer inspection using spatial filtering |
Feb. 3, 2004 |
| 6683687 |
Method and apparatus for assessing the effect of yarn faults on woven or knitted fabrics |
Jan. 27, 2004 |
| 6671397 |
Measurement system having a camera with a lens and a separate sensor |
Dec. 30, 2003 |
| 6646280 |
Device and method for inspecting and cutting strips of security documents |
Nov. 11, 2003 |
| 6633052 |
Discriminating paper sensor |
Oct. 14, 2003 |
| 6566674 |
Method and apparatus for inspecting substrates |
May. 20, 2003 |
| 6548821 |
Method and apparatus for inspecting substrates |
Apr. 15, 2003 |
| 6546126 |
Method for automatically setting intensity of illumination fpr positional recognion and quality controlde |
Apr. 8, 2003 |
| 6531707 |
Machine vision method for the inspection of a material for defects |
Mar. 11, 2003 |
| 6525333 |
System and method for inspecting containers with openings with pipeline image processing |
Feb. 25, 2003 |
| 6525331 |
Ball grid array (BGA) package on-line non-contact inspection method and system |
Feb. 25, 2003 |
| 6521906 |
Method and apparatus for measuring the distortion angle of a strip of textile, wherein a sensor array scans at progressively altered angles |
Feb. 18, 2003 |
| 6493076 |
Method and arrangement for measuring wood |
Dec. 10, 2002 |
| 6486946 |
Method for discriminating between holes in and particles on a film covering a substrate |
Nov. 26, 2002 |
| 6437357 |
Glass inspection system including bright field and dark field illumination |
Aug. 20, 2002 |
| 6433353 |
Method and apparatus for inspecting surface irregularities of transparent plate |
Aug. 13, 2002 |
| 6407404 |
Apparatus for the examining defect of monolithic substrate and method for examining the same |
Jun. 18, 2002 |
| 6384421 |
Vision system for industrial parts |
May. 7, 2002 |
| 6346986 |
Non-intrusive pellicle height measurement system |
Feb. 12, 2002 |
| 6342704 |
Method and apparatus for detecting nitride residue on semiconductor wafers |
Jan. 29, 2002 |
| 6216432 |
Method for inspecting spinning bobbins and system for implementing such method |
Apr. 17, 2001 |
| 6207946 |
Adaptive lighting system and method for machine vision apparatus |
Mar. 27, 2001 |
| 6166393 |
Method and apparatus for automatic inspection of moving surfaces |
Dec. 26, 2000 |
| 6153889 |
Method and an apparatus for inspecting articles |
Nov. 28, 2000 |
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