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Class Information
Number: 250/559.45
Name: Radiant energy > Photocells; circuits and apparatus > With circuit for evaluating a web, strand, strip, or sheet > With indication of presence of material or feature > With defect discrimination circuitry
Description: Subject matter wherein the circuit provides the capability to identify the presence of a flaw in the material from variations in a detected light signal.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7616805 |
Pattern defect inspection method and apparatus |
Nov. 10, 2009 |
| 7592616 |
Detecting micropipes |
Sep. 22, 2009 |
| 7589339 |
Paper sheets metal thread part or magnetic element pattern detector or paper sheets metal thread part or magnetic element pattern detection method |
Sep. 15, 2009 |
| 7582856 |
Out of round detector |
Sep. 1, 2009 |
| 7576348 |
One-dimensional phase contrast microscopy with a traveling lens generated by a step function change |
Aug. 18, 2009 |
| 7576347 |
Method and apparatus for optically inspecting an object using a light source |
Aug. 18, 2009 |
| 7570797 |
Methods and systems for generating an inspection process for an inspection system |
Aug. 4, 2009 |
| 7551769 |
Data structures and algorithms for precise defect location by analyzing artifacts |
Jun. 23, 2009 |
| 7505619 |
System and method for conducting adaptive fourier filtering to detect defects in dense logic areas of an inspection surface |
Mar. 17, 2009 |
| 7491959 |
Defect inspection apparatus |
Feb. 17, 2009 |
| 7488965 |
System and method for associating container defect information to a specific path of manufacturing |
Feb. 10, 2009 |
| 7465948 |
Sheet-surface analyser and method of analysing a sheet-surface |
Dec. 16, 2008 |
| 7457455 |
Pattern defect inspection method and apparatus |
Nov. 25, 2008 |
| 7453080 |
System for locating a physical alteration in a structure and a method thereof |
Nov. 18, 2008 |
| 7447610 |
Method and system for reliability similarity of semiconductor devices |
Nov. 4, 2008 |
| 7440606 |
Defect detector and defect detection method |
Oct. 21, 2008 |
| 7437278 |
Simulation method, simulation apparatus, and computer program product for simulation |
Oct. 14, 2008 |
| 7427768 |
Apparatus, unit and method for testing image sensor packages |
Sep. 23, 2008 |
| 7427767 |
Apparatus for identifying the condition of a conveyor belt |
Sep. 23, 2008 |
| 7425719 |
Method and apparatus for selectively providing data from a test head to a processor |
Sep. 16, 2008 |
| 7417724 |
Wafer inspection systems and methods for analyzing inspection data |
Aug. 26, 2008 |
| 7417243 |
High-sensitivity optical scanning using memory integration |
Aug. 26, 2008 |
| 7411207 |
Method and its apparatus for inspecting particles or defects of a semiconductor device |
Aug. 12, 2008 |
| 7382461 |
Analysis method and apparatus utilizing attenuated total reflection |
Jun. 3, 2008 |
| 7375362 |
Method and apparatus for reducing or eliminating stray light in an optical test head |
May. 20, 2008 |
| 7372062 |
Defect inspection device and substrate manufacturing system using the same |
May. 13, 2008 |
| 7358517 |
Method and apparatus for imager quality testing |
Apr. 15, 2008 |
| 7355193 |
Dust and scratch detection for an image scanner |
Apr. 8, 2008 |
| 7345753 |
Apparatus and methods for analyzing defects on a sample |
Mar. 18, 2008 |
| 7333192 |
Apparatus and method for inspecting defects |
Feb. 19, 2008 |
| 7330248 |
Method and apparatus for inspecting defects |
Feb. 12, 2008 |
| 7301133 |
Tracking auto focus system |
Nov. 27, 2007 |
| 7301165 |
Methods and apparatus for inspecting an object |
Nov. 27, 2007 |
| 7299147 |
Systems for managing production information |
Nov. 20, 2007 |
| 7292949 |
Method and apparatus for estimating surface moisture content of wood chips |
Nov. 6, 2007 |
| 7280200 |
Detection of a wafer edge using collimated light |
Oct. 9, 2007 |
| 7262425 |
Method and its apparatus for inspecting particles or defects of a semiconductor device |
Aug. 28, 2007 |
| 7256412 |
Method and its apparatus for inspecting particles or defects of a semiconductor device |
Aug. 14, 2007 |
| 7239588 |
Method and apparatus for detecting foreign body on object surface, and optical disk apparatus |
Jul. 3, 2007 |
| 7235805 |
Paper sheets theft prevention ink detector and paper sheets theft prevention ink detection method |
Jun. 26, 2007 |
| 7233841 |
Vision system |
Jun. 19, 2007 |
| 7227166 |
System and method for associating container defect information to a specific path of manufacturing |
Jun. 5, 2007 |
| 7220978 |
System and method for detecting defects in semiconductor wafers |
May. 22, 2007 |
| 7176475 |
Adjusting apparatus, production processing system, and method of controlling adjusting apparatus |
Feb. 13, 2007 |
| 7177458 |
Reduction of false alarms in PCB inspection |
Feb. 13, 2007 |
| 7173270 |
Detector system for detecting a height of a particle, and lithographic apparatus and device manufacturing method including the same. |
Feb. 6, 2007 |
| 7166856 |
Apparatus and method to inspect display panels |
Jan. 23, 2007 |
| 7164146 |
System for detecting structural defects and features utilizing blackbody self-illumination |
Jan. 16, 2007 |
| 7149343 |
Methods for analyzing defect artifacts to precisely locate corresponding defects |
Dec. 12, 2006 |
| 7131539 |
Paper sheets corner fold detection method and paper sheets corner fold detection program |
Nov. 7, 2006 |
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