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Class Information
Number: 250/559.39
Name: Radiant energy > Photocells; circuits and apparatus > With circuit for evaluating a web, strand, strip, or sheet > With comparison to reference or standard
Description: Subject matter wherein evaluation of the material includes comparing the circuit output to a reference or stored value.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7440093 |
Apparatus and methods for providing selective defect sensitivity |
Oct. 21, 2008 |
| 7427767 |
Apparatus for identifying the condition of a conveyor belt |
Sep. 23, 2008 |
| 7423280 |
Web inspection module including contact image sensors |
Sep. 9, 2008 |
| 7417749 |
Method and apparatus for protecting an optical transmission measurement when sensing transparent materials |
Aug. 26, 2008 |
| 7408180 |
Compensation apparatus for image scan |
Aug. 5, 2008 |
| 7399983 |
Quality inspection method and quality inspection device |
Jul. 15, 2008 |
| 7391043 |
Self calibrating media edge sensor |
Jun. 24, 2008 |
| 7378675 |
Security markers for indicating condition of an item |
May. 27, 2008 |
| 7336374 |
Methods and apparatus for generating a mask |
Feb. 26, 2008 |
| 7271891 |
Apparatus and methods for providing selective defect sensitivity |
Sep. 18, 2007 |
| 7199385 |
Method and an apparatus for the detection of objects moved on a conveyor means by means of an optoelectronic sensor |
Apr. 3, 2007 |
| 7196300 |
Dynamic focusing method and apparatus |
Mar. 27, 2007 |
| 7145163 |
Apparatus for detecting light-transmissive sheet-like body |
Dec. 5, 2006 |
| 7116817 |
Method and apparatus for inspecting a semiconductor device |
Oct. 3, 2006 |
| 7084965 |
Arrangement and method for inspecting unpatterned wafers |
Aug. 1, 2006 |
| 7075086 |
Measurement of metal polish quality |
Jul. 11, 2006 |
| 6998628 |
Method of media type differentiation in an imaging apparatus |
Feb. 14, 2006 |
| 6974963 |
Substrate inspecting device, coating/developing device and substrate inspecting method |
Dec. 13, 2005 |
| 6965120 |
Method and apparatus for quality control in the manufacture of foundry cores or core packets |
Nov. 15, 2005 |
| 6952492 |
Method and apparatus for inspecting a semiconductor device |
Oct. 4, 2005 |
| 6943363 |
Apparatus for detecting light-transmissive sheet-like body |
Sep. 13, 2005 |
| 6895108 |
Method for inspecting defects in the shape of object |
May. 17, 2005 |
| 6874420 |
System and method for register mark recognition |
Apr. 5, 2005 |
| 6845178 |
Automatic separation of subject pixels using segmentation based on multiple planes of measurement data |
Jan. 18, 2005 |
| 6826298 |
Automated wafer defect inspection system and a process of performing such inspection |
Nov. 30, 2004 |
| 6812479 |
Sample positioning method for surface optical diagnostics using video imaging |
Nov. 2, 2004 |
| 6753542 |
Defect detection apparatus and storage medium readable by computer |
Jun. 22, 2004 |
| 6684164 |
True defect monitoring through repeating defect deletion |
Jan. 27, 2004 |
| 6657218 |
Method and apparatus for measuring gap, method and apparatus for measuring shape and method for manufacturing liquid crystal device |
Dec. 2, 2003 |
| 6627863 |
System and methods to determine the settings of multiple light sources in a vision system |
Sep. 30, 2003 |
| 6597007 |
Optical position detection device and distance measurement device |
Jul. 22, 2003 |
| 6552716 |
Transmission of differential optical detector signal over a single line |
Apr. 22, 2003 |
| 6515771 |
Image reading apparatus having a reference image and measurement means for measuring distortion based on reading the reference image |
Feb. 4, 2003 |
| 6498339 |
Displacement diagnosing method applied to an image read-out apparatus |
Dec. 24, 2002 |
| 6476914 |
Process and device for ascertaining whether two successive shafts are in alignment |
Nov. 5, 2002 |
| 6452150 |
Cassette measuring system |
Sep. 17, 2002 |
| 6360005 |
Apparatus and method for microscopic inspection of articles |
Mar. 19, 2002 |
| 6347150 |
Method and system for inspecting a pattern |
Feb. 12, 2002 |
| 6320199 |
Process for improving the reliability of operation of optical gas sensors |
Nov. 20, 2001 |
| 6264591 |
Plug combiner inspection system and method |
Jul. 24, 2001 |
| 6205240 |
Optical profile sensor |
Mar. 20, 2001 |
| 6137115 |
Film inspecting apparatus |
Oct. 24, 2000 |
| 6118132 |
System for measuring the velocity, displacement and strain on a moving surface or web of material |
Sep. 12, 2000 |
| 6091485 |
Method and apparatus for optically determining physical parameters of underlayers |
Jul. 18, 2000 |
| 6088111 |
Selection and control device for bars and relative method |
Jul. 11, 2000 |
| 6064058 |
Printed paper identification system |
May. 16, 2000 |
| 6016751 |
Device and method for monitoring the amount of a fluid sprayed across the width of moving material webs for the moistening thereof |
Jan. 25, 2000 |
| 5970433 |
Laser obstacle detection method and sensor |
Oct. 19, 1999 |
| 5963314 |
Laser imaging system for inspection and analysis of sub-micron particles |
Oct. 5, 1999 |
| 5914495 |
Inspection apparatus for inspecting a defect of an optical disc |
Jun. 22, 1999 |
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