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Class Information
Number: 250/559.22
Name: Radiant energy > Photocells; circuits and apparatus > With circuit for evaluating a web, strand, strip, or sheet > Measuring dimensions > Profile
Description: Subject matter wherein the circuit output is indicative of a surface contour of the material.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7623249 |
Automated product profiling apparatus and product slicing system using same |
Nov. 24, 2009 |
| 7564569 |
Optical wheel evaluation |
Jul. 21, 2009 |
| 7561269 |
Optical measurement system with systematic error correction |
Jul. 14, 2009 |
| 7532331 |
Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method |
May. 12, 2009 |
| 7525672 |
Efficient characterization of symmetrically illuminated symmetric 2-D gratings |
Apr. 28, 2009 |
| 7525673 |
Optimizing selected variables of an optical metrology system |
Apr. 28, 2009 |
| 7525668 |
Apparatus and method for appearance inspection |
Apr. 28, 2009 |
| 7505153 |
Model and parameter selection for optical metrology |
Mar. 17, 2009 |
| 7495208 |
Portable optical wound scanner |
Feb. 24, 2009 |
| 7468506 |
Spot grid array scanning system |
Dec. 23, 2008 |
| 7450232 |
Generic interface for an optical metrology system |
Nov. 11, 2008 |
| 7450247 |
Automated product profiling apparatus and product slicing system using same |
Nov. 11, 2008 |
| 7427747 |
Optical image pickup apparatus for imaging living body tissue |
Sep. 23, 2008 |
| 7414732 |
Method and device for determining the 3D profile of an object |
Aug. 19, 2008 |
| 7379194 |
Method and system for determining mail piece dimensions using swept laser beam |
May. 27, 2008 |
| 7376261 |
Surface scan measuring device and method of forming compensation table for scanning probe |
May. 20, 2008 |
| 7365862 |
Methods and apparatus for inspecting an object |
Apr. 29, 2008 |
| 7336374 |
Methods and apparatus for generating a mask |
Feb. 26, 2008 |
| 7330279 |
Model and parameter selection for optical metrology |
Feb. 12, 2008 |
| 7324218 |
Method and device for distance measurement |
Jan. 29, 2008 |
| 7312879 |
Distance determination in a scanned beam image capture device |
Dec. 25, 2007 |
| 7310154 |
Shape measurement system |
Dec. 18, 2007 |
| 7286246 |
Method and apparatus for non-contact three-dimensional surface measurement |
Oct. 23, 2007 |
| 7280227 |
Device, method and system for measuring the distribution of selected properties in a material |
Oct. 9, 2007 |
| 7274472 |
Resolution enhanced optical metrology |
Sep. 25, 2007 |
| 7274469 |
Method and apparatus for calibrating laser 3D digitizing sensor |
Sep. 25, 2007 |
| 7271902 |
Generic interface for an optical metrology system |
Sep. 18, 2007 |
| 7259871 |
Apparatus and method for rapid and precise scanning of three-dimensional occlusal profile of dental cast |
Aug. 21, 2007 |
| 7247825 |
Method and apparatus for scanning a specimen using an optical imaging system |
Jul. 24, 2007 |
| 7245387 |
Three-dimensional measuring instrument |
Jul. 17, 2007 |
| 7236256 |
Range finder and method |
Jun. 26, 2007 |
| 7208749 |
System and method for locating and positioning an ultrasonic signal generator for testing purposes |
Apr. 24, 2007 |
| 7189984 |
Object data input apparatus and object reconstruction apparatus |
Mar. 13, 2007 |
| 7173268 |
Method of measuring pattern dimension and method of controlling semiconductor device process |
Feb. 6, 2007 |
| 7170075 |
Inspection tool with a 3D point sensor to develop a focus map |
Jan. 30, 2007 |
| 7167584 |
Device for acquiring a three-dimensional shape by optoelectronic process |
Jan. 23, 2007 |
| 7157726 |
Method and apparatus for measuring shape of sheet |
Jan. 2, 2007 |
| 7151855 |
Pattern measurement method, manufacturing method of semiconductor device, pattern measurement apparatus, and program |
Dec. 19, 2006 |
| 7136170 |
Method and device for determining the spatial co-ordinates of an object |
Nov. 14, 2006 |
| 7126144 |
Method for the contactless measurement of an object |
Oct. 24, 2006 |
| 7092110 |
Optimized model and parameter selection for optical metrology |
Aug. 15, 2006 |
| 7065239 |
Automated repetitive array microstructure defect inspection |
Jun. 20, 2006 |
| 7064829 |
Generic interface for an optical metrology system |
Jun. 20, 2006 |
| 7064845 |
Method for measuring the geometry of an object by means of a co-ordination measuring device |
Jun. 20, 2006 |
| 7057743 |
Device, method and system for measuring the distribution of selected properties in a material |
Jun. 6, 2006 |
| 7046375 |
Edge roughness measurement in optical metrology |
May. 16, 2006 |
| 7045763 |
Object-recognition lock |
May. 16, 2006 |
| 7019848 |
Three-dimensional measuring instrument, filter striped plate, and illuminating means |
Mar. 28, 2006 |
| 7012271 |
Electromagnetic radiation structure control system |
Mar. 14, 2006 |
| 7002699 |
Identification and labeling of beam images of a structured beam matrix |
Feb. 21, 2006 |
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