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Class Information
Number: 250/559.04
Name: Radiant energy > Photocells; circuits and apparatus > With circuit for evaluating a web, strand, strip, or sheet > Evaluation by regions, zones, or pixels
Description: Subject matter wherein discrete sections of the material are detected and evaluated independently.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7465948 |
Sheet-surface analyser and method of analysing a sheet-surface |
Dec. 16, 2008 |
| 7398733 |
Inline measurement and closed loop control method in printing machines |
Jul. 15, 2008 |
| 7365310 |
Increased depth of field for high resolution imaging for a matrix-based ion source |
Apr. 29, 2008 |
| 7220978 |
System and method for detecting defects in semiconductor wafers |
May. 22, 2007 |
| 7199387 |
Apparatus and method for detecting a predetermined pattern on a moving printed product |
Apr. 3, 2007 |
| 7092082 |
Method and apparatus for inspecting a semiconductor wafer |
Aug. 15, 2006 |
| 6970194 |
Defect correction in electronic imaging systems |
Nov. 29, 2005 |
| 6941009 |
Method for evaluating pattern defects on a water surface |
Sep. 6, 2005 |
| 6936835 |
Method and its apparatus for inspecting particles or defects of a semiconductor device |
Aug. 30, 2005 |
| 6920249 |
Method and measuring instrument for determining the position of an edge of a pattern element on a substrate |
Jul. 19, 2005 |
| 6909105 |
Method and device for representing an object |
Jun. 21, 2005 |
| 6904164 |
Method of inspecting accuracy in stitching pattern elements |
Jun. 7, 2005 |
| 6797975 |
Method and its apparatus for inspecting particles or defects of a semiconductor device |
Sep. 28, 2004 |
| 6747697 |
Method and apparatus for digital image defect correction and noise filtering |
Jun. 8, 2004 |
| 6743337 |
Process and apparatus for determining the properties of a traveling material web |
Jun. 1, 2004 |
| 6655777 |
Automatic horizontal and vertical head-to-head alignment method and sensor for an ink jet printer |
Dec. 2, 2003 |
| 6640716 |
Imaging print media |
Nov. 4, 2003 |
| 6563129 |
Method and device for the contactless measurement of the deformation of a specimen to be measured |
May. 13, 2003 |
| 6561706 |
Critical dimension monitoring from latent image |
May. 13, 2003 |
| 6538252 |
Method and device for determining the alignment of line formations in areal, especially longitudinally moved, webs of a structural formed body |
Mar. 25, 2003 |
| 6515293 |
Method and apparatus for detecting thickness of thin layer formed on a wafer |
Feb. 4, 2003 |
| 6272440 |
Method and apparatus for measuring color and/or composition |
Aug. 7, 2001 |
| 6264591 |
Plug combiner inspection system and method |
Jul. 24, 2001 |
| 6192141 |
Apparatus and method for automatically recognizing print media |
Feb. 20, 2001 |
| 6173071 |
Apparatus and method for processing video data in automatic optical inspection |
Jan. 9, 2001 |
| 6137570 |
System and method for analyzing topological features on a surface |
Oct. 24, 2000 |
| 5974160 |
Measuring method and apparatus of gloss irregularity and printing unevenness |
Oct. 26, 1999 |
| 5955741 |
Methods of measuring currency limpness |
Sep. 21, 1999 |
| 5949584 |
Wafer |
Sep. 7, 1999 |
| 5936353 |
High-density solid-state lighting array for machine vision applications |
Aug. 10, 1999 |
| 5917589 |
Surface inspection tool |
Jun. 29, 1999 |
| 5877899 |
Imaging system and method for imaging indicia on wafer |
Mar. 2, 1999 |
| 5771411 |
Photometry device and method |
Jun. 23, 1998 |
| 5686729 |
Device for counting products stacked side-by-side |
Nov. 11, 1997 |
| 5672885 |
Surface displacement detection and adjustment system |
Sep. 30, 1997 |
| 5620854 |
Method for identifying biochemical and chemical reactions and micromechanical processes using nanomechanical and electronic signal identification |
Apr. 15, 1997 |
| 5436463 |
Sedimentary deposition of photoresist on semiconductor wafers |
Jul. 25, 1995 |
| 5416335 |
Automated visual inspection system for determining the set positions of a row of dip switches |
May. 16, 1995 |
| 5408104 |
Apparatus and process with an annular fluorescent tube for detection in a moving mode of surface defects on long metallic products |
Apr. 18, 1995 |
| 5340994 |
Method for inspecting the length of a flexible thin object having binarizing and thinning steps |
Aug. 23, 1994 |
| 5283443 |
Method for inspecting garments for holes having a contrasting background |
Feb. 1, 1994 |
| RE34345 |
Fiber optic imaging system for on-line monitoring |
Aug. 17, 1993 |
| 5218211 |
System for sampling the sizes, geometrical distribution, and frequency of small particles accumulating on a solid surface |
Jun. 8, 1993 |
| 5187376 |
Print monitoring apparatus with data processing |
Feb. 16, 1993 |
| 5155372 |
Optical inspection system utilizing wedge shaped spatial filter |
Oct. 13, 1992 |
| 4982102 |
Apparatus for detecting three-dimensional configuration of object employing optical cutting method |
Jan. 1, 1991 |
| 4882498 |
Pulsed-array video inspection lighting system |
Nov. 21, 1989 |
| 4801809 |
Sheet inspection apparatus and methods providing simultaneous resolution of measurement zones and wavelength bands |
Jan. 31, 1989 |
| 4792696 |
Method and an apparatus for determining surface shape utilizing object self-shadowing |
Dec. 20, 1988 |
| 4767935 |
System and method for measurement of traveling webs |
Aug. 30, 1988 |
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