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Class Information
Number: 250/440.11
Name: Radiant energy > Inspection of solids or liquids by charged particles > Analyte supports
Description: Subject matter comprising structure for positioning or holding against gravity a material to be examined by particle irradiation.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7435973 |
Material processing system and method |
Oct. 14, 2008 |
| 7431813 |
Multi-chambered substrate processing equipment having sealing structure between chambers thereof, and method of assembling such equipment |
Oct. 7, 2008 |
| 7432511 |
Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation |
Oct. 7, 2008 |
| 7427755 |
Integrated electron beam tip and sample heating device for a scanning tunneling microscope |
Sep. 23, 2008 |
| 7425712 |
Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation |
Sep. 16, 2008 |
| 7417236 |
Sheet beam-type testing apparatus |
Aug. 26, 2008 |
| 7414355 |
Charged particle beam extraction and formation apparatus |
Aug. 19, 2008 |
| 7394075 |
Preparation of integrated circuit device samples for observation and analysis |
Jul. 1, 2008 |
| 7391038 |
Technique for isocentric ion beam scanning |
Jun. 24, 2008 |
| 7381971 |
Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope |
Jun. 3, 2008 |
| 7381968 |
Charged particle beam apparatus and specimen holder |
Jun. 3, 2008 |
| 7348570 |
Unsupported, electron transparent films and related methods |
Mar. 25, 2008 |
| 7348571 |
Scanning mechanism for scanning probe microscope and scanning probe microscope |
Mar. 25, 2008 |
| 7345288 |
Sample holder and ion-beam processing system |
Mar. 18, 2008 |
| 7345289 |
Sample support prepared by semiconductor silicon process technique |
Mar. 18, 2008 |
| 7342237 |
Lithographic apparatus and device manufacturing method |
Mar. 11, 2008 |
| 7323695 |
Reciprocating drive for scanning a workpiece |
Jan. 29, 2008 |
| 7315023 |
Method of preparing a sample for examination in a TEM |
Jan. 1, 2008 |
| 7304313 |
Low-pressure chamber for scanning electron microscopy in a wet environment |
Dec. 4, 2007 |
| 7291847 |
Specimen tip and tip holder assembly |
Nov. 6, 2007 |
| 7282707 |
Method and apparatus for handling a sample plate for use in mass analysis |
Oct. 16, 2007 |
| 7263162 |
Sample mounts for microcrystal crystallography |
Aug. 28, 2007 |
| 7259380 |
Scanning mechanism of an ion implanter |
Aug. 21, 2007 |
| 7253419 |
Apertured plate support mechanism and charged-particle beam instrument equipped therewith |
Aug. 7, 2007 |
| 7253418 |
Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope |
Aug. 7, 2007 |
| 7238953 |
Specimen holder for an electron microscope and method for reducing thermal drift in a microscope |
Jul. 3, 2007 |
| 7235784 |
Transmission electron microscope and image observation method using it |
Jun. 26, 2007 |
| 7217934 |
Wafer scanning device |
May. 15, 2007 |
| 7196338 |
Ultra-thin sample preparation for transmission electron microscopy |
Mar. 27, 2007 |
| 7191092 |
Methods and systems for controlling motion of and tracking a mechanically unattached probe |
Mar. 13, 2007 |
| 7189969 |
Methods and systems for controlling motion of and tracking a mechanically unattached probe |
Mar. 13, 2007 |
| 7173253 |
Object-moving method, object-moving apparatus, production process and produced apparatus |
Feb. 6, 2007 |
| 7157702 |
High resolution atom probe |
Jan. 2, 2007 |
| 7154092 |
Method of three-dimensional image reconstruction and transmission electron microscope |
Dec. 26, 2006 |
| 7151269 |
Sample inspection apparatus |
Dec. 19, 2006 |
| 7126133 |
Kit for preparing a tem sample holder |
Oct. 24, 2006 |
| 7126132 |
Apparatus for preparing a TEM sample holder |
Oct. 24, 2006 |
| 7119344 |
Electron beam device having a specimen holder |
Oct. 10, 2006 |
| 7119343 |
Mechanical oscillator for wafer scan with spot beam |
Oct. 10, 2006 |
| 7115882 |
TEM sample holder |
Oct. 3, 2006 |
| 7112790 |
Method to prepare TEM samples |
Sep. 26, 2006 |
| 7109487 |
Particle beam device |
Sep. 19, 2006 |
| 7109481 |
Matrix-assisted laser desorption and ionization (MALDI) sample plate releasably coupled to a sample plate adapter |
Sep. 19, 2006 |
| 7109477 |
Automatic sample loader for use with a mass spectrometer |
Sep. 19, 2006 |
| 7091497 |
Particle-optical device for irradiating an object |
Aug. 15, 2006 |
| 7091496 |
Electron microscopic inspection apparatus |
Aug. 15, 2006 |
| 7087906 |
Bellows with spring anti-gravity device |
Aug. 8, 2006 |
| 7078706 |
Chamber, exposure apparatus, and device manufacturing method |
Jul. 18, 2006 |
| 7067807 |
Charged particle beam column and method of its operation |
Jun. 27, 2006 |
| 7053383 |
Method and apparatus for rapid sample preparation in a focused ion beam microscope |
May. 30, 2006 |
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