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Class Information
Number: 250/398
Name: Radiant energy > With charged particle beam deflection or focussing > With target means
Description: Subject matter having means to hold, position or accommodate an object to be irradiated by the beam, or such an object itself in combination with the lens.

Sub-classes under this class:

Class Number Class Name Patents
250/399 Secondary emissive type 110
250/400 With means to convey or guide the target 118

Patents under this class:

Patent Number Title Of Patent Date Issued
8710452 Charged particle source with integrated electrostatic energy filter Apr. 29, 2014
8704197 Accelerator and method for irradiating a target volume Apr. 22, 2014
8704175 Scanning electron microscope Apr. 22, 2014
8680480 Beam control assembly for ribbon beam of ions for ion implantation Mar. 25, 2014
8674318 Particle beam irradiation apparatus and particle beam therapy system Mar. 18, 2014
8653485 Projection lens arrangement Feb. 18, 2014
8653474 Charged particle extraction device and method of design there for Feb. 18, 2014
8648318 Multiple beam charged particle optical system Feb. 11, 2014
8637819 Cross-section processing and observation apparatus Jan. 28, 2014
8633457 Background reduction system including louver Jan. 21, 2014
8627822 Semi-vertical positioning method and apparatus used in conjunction with a charged particle cancer therapy system Jan. 14, 2014
8618500 Multi channel detector, optics therefor and method of operating thereof Dec. 31, 2013
8610083 Systems and methods providing electron beam writing to a medium Dec. 17, 2013
8604411 Charged particle beam modulator Dec. 10, 2013
8586949 Charged particle lithography system with intermediate chamber Nov. 19, 2013
8586941 Particle beam therapy system and adjustment method for particle beam therapy system Nov. 19, 2013
8575563 Compact isocentric gantry Nov. 5, 2013
8569717 Intensity modulated three-dimensional radiation scanning method and apparatus Oct. 29, 2013
8569693 Distortion free stigmation of a TEM Oct. 29, 2013
8563952 Charged particle beam writing apparatus Oct. 22, 2013
8563944 Ion beam device Oct. 22, 2013
8563943 Particle beam irradiation apparatus, particle beam therapy system, and data display program Oct. 22, 2013
8563927 Shielding member having a charge control electrode, and a charged particle beam apparatus Oct. 22, 2013
8558198 Beam line system of ion implanter Oct. 15, 2013
8558196 Charged particle lithography system with aperture array cooling Oct. 15, 2013
8558190 Charged particle beam column and method of operating same Oct. 15, 2013
8552397 Focused ion beam device and focused ion beam processing method Oct. 8, 2013
8541756 Systems and methods for generating X-rays and neutrons using a single linear accelerator Sep. 24, 2013
8530835 Imaging energy filter for electrically charged particles and spectroscope having same Sep. 10, 2013
8525133 Particle beam irradiation system and particle beam irradiation method Sep. 3, 2013
8513619 Non-planar extractor structure for electron source Aug. 20, 2013
8507873 Drift measuring method, charged particle beam writing method, and charged particle beam writing apparatus Aug. 13, 2013
8507855 Inductive modulation of focusing voltage in charged beam system Aug. 13, 2013
8497486 Ion source having a shutter assembly Jul. 30, 2013
8492731 Charged particle multi-beamlet lithography system with modulation device Jul. 23, 2013
8487269 Combined radiation therapy and magnetic resonance unit Jul. 16, 2013
8487252 Particle beam microscope and method for operating the particle beam microscope Jul. 16, 2013
8481964 Charged particle beam drawing apparatus and method Jul. 9, 2013
8481963 Ion slicer with accelleration and decelleration optics Jul. 9, 2013
8481962 Distributed potential charged particle detector Jul. 9, 2013
8481959 Apparatus and method for multi-directionally scanning a beam of charged particles Jul. 9, 2013
8471228 Fast scanning of a target region Jun. 25, 2013
8466430 Electrostatic lens Jun. 18, 2013
8466428 Particle beam irradiation apparatus and particle beam therapy system Jun. 18, 2013
8461558 System and method for ion implantation with dual purpose mask Jun. 11, 2013
8461554 Apparatus and method for charge neutralization during processing of a workpiece Jun. 11, 2013
8461553 Masked ion implant with fast-slow scan Jun. 11, 2013
8455847 Mask health monitor using a faraday probe Jun. 4, 2013
RE44240 Electron beam exposure system May. 28, 2013
8445870 Charged particle beam system having multiple user-selectable operating modes May. 21, 2013

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