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Class Information
Number: 250/396R
Name: Radiant energy > With charged particle beam deflection or focussing
Description:
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7459693 |
Ion guide for mass spectrometers |
Dec. 2, 2008 |
| 7459692 |
Electron confinement inside magnet of ion implanter |
Dec. 2, 2008 |
| 7459681 |
Scanning electron microscope |
Dec. 2, 2008 |
| 7459680 |
Method of analysis using energy loss spectrometer and transmission electron microscope equipped therewith |
Dec. 2, 2008 |
| 7459678 |
Switchable branched ion guide |
Dec. 2, 2008 |
| 7459676 |
MALDI/LDI source |
Dec. 2, 2008 |
| 7456415 |
Charged particle beam extraction system and method |
Nov. 25, 2008 |
| 7456388 |
Ion guide for mass spectrometer |
Nov. 25, 2008 |
| 7453077 |
EUV light source |
Nov. 18, 2008 |
| 7453076 |
Bi-polar treatment facility for treating target cells with both positive and negative ions |
Nov. 18, 2008 |
| 7453074 |
Ion implanter with ionization chamber electrode design |
Nov. 18, 2008 |
| 7453069 |
Bushing unit with integrated conductor in ion accelerating device and related method |
Nov. 18, 2008 |
| 7453062 |
Energy-filtering cathode lens microscopy instrument |
Nov. 18, 2008 |
| 7446327 |
Apparatus for amplifying a stream of charged particles |
Nov. 4, 2008 |
| 7446320 |
Electronically-variable immersion electrostatic lens |
Nov. 4, 2008 |
| 7442945 |
Faraday assembly of ion implantation apparatus |
Oct. 28, 2008 |
| 7442944 |
Ion beam implant current, spot width and position tuning |
Oct. 28, 2008 |
| 7442929 |
Scanning electron microscope |
Oct. 28, 2008 |
| 7442924 |
Repetitive circumferential milling for sample preparation |
Oct. 28, 2008 |
| 7439520 |
Ion optics systems |
Oct. 21, 2008 |
| 7439502 |
Electron beam apparatus and device production method using the electron beam apparatus |
Oct. 21, 2008 |
| 7435977 |
Ion beam angle measurement systems and methods for ion implantation systems |
Oct. 14, 2008 |
| 7435972 |
Focused ion beam apparatus and liquid metal ion source |
Oct. 14, 2008 |
| 7435969 |
Method of manufacturing electrostatic deflector, and electrostatic deflector |
Oct. 14, 2008 |
| 7429743 |
Irradiation system ion beam and method to enhance accuracy of irradiation |
Sep. 30, 2008 |
| 7429730 |
SIFT-MS instruments |
Sep. 30, 2008 |
| 7427765 |
Electron beam column for writing shaped electron beams |
Sep. 23, 2008 |
| 7425708 |
Secondary electron detector unit for a scanning electron microscope |
Sep. 16, 2008 |
| 7423277 |
Ion beam monitoring in an ion implanter using an imaging device |
Sep. 9, 2008 |
| 7423276 |
Irradiation system with ion beam/charged particle beam |
Sep. 9, 2008 |
| 7423268 |
Projection imaging type electron microscope |
Sep. 9, 2008 |
| 7423266 |
Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus |
Sep. 9, 2008 |
| 7423262 |
Precision segmented ion trap |
Sep. 9, 2008 |
| 7420167 |
Apparatus and method for electron beam inspection with projection electron microscopy |
Sep. 2, 2008 |
| 7417242 |
Method of measuring ion beam position |
Aug. 26, 2008 |
| 7417234 |
Spatial-phase locking of energy beams for determining two-dimensional location and beam shape |
Aug. 26, 2008 |
| 7417233 |
Beam exposure correction system and method |
Aug. 26, 2008 |
| 7414355 |
Charged particle beam extraction and formation apparatus |
Aug. 19, 2008 |
| 7414251 |
Method for providing an operable filter system for filtering particles out of a beam of radiation, filter system, apparatus and lithographic apparatus comprising the filter system |
Aug. 19, 2008 |
| 7411361 |
Method and apparatus for radio frequency cavity |
Aug. 12, 2008 |
| 7411192 |
Focused ion beam apparatus and focused ion beam irradiation method |
Aug. 12, 2008 |
| 7408172 |
Charged particle beam apparatus and charged particle beam irradiation method |
Aug. 5, 2008 |
| 7405402 |
Method and apparatus for aberration-insensitive electron beam imaging |
Jul. 29, 2008 |
| 7405401 |
Ion extraction devices, mass spectrometer devices, and methods of selectively extracting ions and performing mass spectrometry |
Jul. 29, 2008 |
| 7405400 |
Adjusting field conditions in linear ion processing apparatus for different modes of operation |
Jul. 29, 2008 |
| 7405399 |
Field conditions for ion excitation in linear ion processing apparatus |
Jul. 29, 2008 |
| 7402963 |
Programmable radio frequency waveform generator for a synchrocyclotron |
Jul. 22, 2008 |
| 7402821 |
Application of digital frequency and phase synthesis for control of electrode voltage phase in a high-energy ion implantation machine, and a means for accurate calibration of electrode voltage |
Jul. 22, 2008 |
| 7402816 |
Electron injection in ion implanter magnets |
Jul. 22, 2008 |
| 7394083 |
Systems and methods for EUV light source metrology |
Jul. 1, 2008 |
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