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Browse by Category: Main > Electrical & Energy
Class Information
Number: 250/396ML
Name: Radiant energy > With charged particle beam deflection or focussing > Magnetic lens
Description:


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11

Patent Number Title Of Patent Date Issued
7459692 Electron confinement inside magnet of ion implanter Dec. 2, 2008
7459680 Method of analysis using energy loss spectrometer and transmission electron microscope equipped therewith Dec. 2, 2008
7453076 Bi-polar treatment facility for treating target cells with both positive and negative ions Nov. 18, 2008
7442929 Scanning electron microscope Oct. 28, 2008
7439520 Ion optics systems Oct. 21, 2008
7429743 Irradiation system ion beam and method to enhance accuracy of irradiation Sep. 30, 2008
7429740 Electric-magnetic field-generating element and assembling method for same Sep. 30, 2008
7423267 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Sep. 9, 2008
7423276 Irradiation system with ion beam/charged particle beam Sep. 9, 2008
7423275 Erosion mitigation for collector optics using electric and magnetic fields Sep. 9, 2008
7420179 Electron microscope Sep. 2, 2008
7417233 Beam exposure correction system and method Aug. 26, 2008
7417242 Method of measuring ion beam position Aug. 26, 2008
7414249 Broad energy-range ribbon ion beam collimation using a variable-gradient dipole Aug. 19, 2008
7411192 Focused ion beam apparatus and focused ion beam irradiation method Aug. 12, 2008
7408172 Charged particle beam apparatus and charged particle beam irradiation method Aug. 5, 2008
7405410 Method and apparatus for confining, neutralizing, compressing and accelerating an ion field Jul. 29, 2008
7402816 Electron injection in ion implanter magnets Jul. 22, 2008
7385194 Charged particle beam application system Jun. 10, 2008
7381951 Charged particle beam adjustment method and apparatus Jun. 3, 2008
7381967 Non-axisymmetric charged-particle beam system Jun. 3, 2008
7378667 Particle-optical appliance provided with aberration-correcting means May. 27, 2008
7378668 Method and apparatus for applying charged particle beam May. 27, 2008
7375323 Electron beam apparatus with aberration corrector May. 20, 2008
7375357 Permanent magnet radiation dose delivery enhancement May. 20, 2008
7361892 Method to increase low-energy beam current in irradiation system with ion beam Apr. 22, 2008
7351984 Controlling the characteristics of implanter ion-beams Apr. 1, 2008
7351971 Charged-particle beam instrument and method of detection Apr. 1, 2008
7345287 Cooling module for charged particle beam column elements Mar. 18, 2008
7326927 Focusing lens and charged particle beam device for titled landing angle operation Feb. 5, 2008
7323821 Device for generating and/or influencing electromagnetic radiation from a plasma Jan. 29, 2008
7323700 Method and system for controlling beam scanning in an ion implantation device Jan. 29, 2008
7321124 Corrector for correcting first-order chromatic aberrations of the first degree Jan. 22, 2008
7317192 High energy polyenergetic ion selection systems, ion beam therapy systems, and ion beam treatment centers Jan. 8, 2008
7315034 Irradiation system with ion beam/charged particle beam Jan. 1, 2008
7315024 Monochromator and scanning electron microscope using the same Jan. 1, 2008
7312461 Laparoscopic tumor therapy using high energy electron irradiation Dec. 25, 2007
7301156 Controlling the characteristics of implanter ion-beams Nov. 27, 2007
7294834 Scanning electron microscope Nov. 13, 2007
7285785 Apparatus with permanent magnetic lenses Oct. 23, 2007
7285780 Detector system for a scanning electron microscope and a scanning electron microscope incorporating said detector system Oct. 23, 2007
7282722 Charged particle beam apparatus and charged particle beam irradiation method Oct. 16, 2007
7268358 Method of modulating laser-accelerated protons for radiation therapy Sep. 11, 2007
7253417 Multi-axis compound lens, beam system making use of the compound lens, and method using the compound lens Aug. 7, 2007
7244949 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Jul. 17, 2007
7235799 System and method for evaluation using electron beam and manufacture of devices Jun. 26, 2007
7233008 Multiple electrode lens arrangement and a method for inspecting an object Jun. 19, 2007
7223983 Charged particle beam column May. 29, 2007
7221731 X-ray microscopic inspection apparatus May. 22, 2007
7217924 Holey mirror arrangement for dual-energy e-beam inspector May. 15, 2007

1 2 3 4 5 6 7 8 9 10 11


 
 
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