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Class Information
Number: 250/309
Name: Radiant energy > Inspection of solids or liquids by charged particles > Positive ion probe or microscope type
Description: Subject matter wherein the charged particles are positively charged.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 4748325 |
Method and device to discharge samples of insulating material during ion analysis |
May. 31, 1988 |
| 4740697 |
Secondary ion mass spectrometer |
Apr. 26, 1988 |
| 4740698 |
Hybrid charged particle apparatus |
Apr. 26, 1988 |
| 4713543 |
Scanning particle microscope |
Dec. 15, 1987 |
| 4704526 |
Apparatus of regulating shape of focused ion beams |
Nov. 3, 1987 |
| 4694170 |
Instrument for very high resolution ionic micro-analysis of a solid sample |
Sep. 15, 1987 |
| 4687930 |
Ion beam apparatus |
Aug. 18, 1987 |
| 4683376 |
Opposing field spectrometer for electron beam mensuration technology |
Jul. 28, 1987 |
| 4680467 |
Electron spectroscopy system for chemical analysis of electrically isolated specimens |
Jul. 14, 1987 |
| 4675524 |
Scanning particle microscope with diminished boersch effect |
Jun. 23, 1987 |
| 4670651 |
Apparatus for performing the SNMS method |
Jun. 2, 1987 |
| 4661702 |
Primary ion beam raster gating technique for secondary ion mass spectrometer system |
Apr. 28, 1987 |
| 4645929 |
Method and apparatus for the compensation of charges in secondary ion mass spectrometry (SIMS) of specimens exhibiting poor electrical conductivity |
Feb. 24, 1987 |
| 4642518 |
Installation of electron beam metalworking |
Feb. 10, 1987 |
| 4639301 |
Focused ion beam processing |
Jan. 27, 1987 |
| 4633084 |
High efficiency direct detection of ions from resonance ionization of sputtered atoms |
Dec. 30, 1986 |
| 4611120 |
Suppression of molecular ions in secondary ion mass spectra |
Sep. 9, 1986 |
| 4587458 |
Controlling current density |
May. 6, 1986 |
| 4564758 |
Process and device for the ionic analysis of an insulating sample |
Jan. 14, 1986 |
| 4556794 |
Secondary ion collection and transport system for ion microprobe |
Dec. 3, 1985 |
| 4510387 |
Ion micro-analysis |
Apr. 9, 1985 |
| 4503329 |
Ion beam processing apparatus and method of correcting mask defects |
Mar. 5, 1985 |
| 4465935 |
Electrically conductive sample support-mounting for secondary ion mass spectrometer analysis |
Aug. 14, 1984 |
| 4447724 |
Apparatus for the chemical analysis of samples |
May. 8, 1984 |
| 4442354 |
Sputter initiated resonance ionization spectrometry |
Apr. 10, 1984 |
| 4352985 |
Scanning ion microscope |
Oct. 5, 1982 |
| 4317995 |
Trace vapor detector |
Mar. 2, 1982 |
| 4310759 |
System for removal of material from the surface of a sample |
Jan. 12, 1982 |
| 4296323 |
Secondary emission mass spectrometer mechanism to be used with other instrumentation |
Oct. 20, 1981 |
| 4275301 |
Corona discharge device |
Jun. 23, 1981 |
| 4236073 |
Scanning ion microscope |
Nov. 25, 1980 |
| 4228358 |
Wafer loading apparatus for beam treatment |
Oct. 14, 1980 |
| 4172225 |
Alpha particle x-ray energy analysis system |
Oct. 23, 1979 |
| 4166952 |
Method and apparatus for the elemental analysis of solids |
Sep. 4, 1979 |
| 4163153 |
Ion beam means |
Jul. 31, 1979 |
| 4146810 |
Radiation heated acceleration |
Mar. 27, 1979 |
| 4132892 |
Raster scanning ion microscope with quadrupole mass filter |
Jan. 2, 1979 |
| 4117322 |
Ion scattering spectrometer including cylindrical mirror analyzer and ion gun axially positioned therewithin |
Sep. 26, 1978 |
| 4107527 |
Ion-emission microanalyzer microscope |
Aug. 15, 1978 |
| 4107526 |
Ion scattering spectrometer with modified bias |
Aug. 15, 1978 |
| 4100409 |
Device for analyzing a surface layer by means of ion scattering |
Jul. 11, 1978 |
| 4088895 |
Memory device utilizing ion beam readout |
May. 9, 1978 |
| 4081674 |
Ion microprobe analyzer |
Mar. 28, 1978 |
| 4063091 |
High speed switching circuit |
Dec. 13, 1977 |
| 4058724 |
Ion Scattering spectrometer with two analyzers preferably in tandem |
Nov. 15, 1977 |
| 4011449 |
Apparatus for measuring the beam current of charged particle beam |
Mar. 8, 1977 |
| 4001582 |
Local surface analysis |
Jan. 4, 1977 |
| 3986025 |
Ion microanalyzer |
Oct. 12, 1976 |
| 3963923 |
Ion microprobes |
Jun. 15, 1976 |
| 3939344 |
Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers |
Feb. 17, 1976 |
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