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Class Information
Number: 250/309
Name: Radiant energy > Inspection of solids or liquids by charged particles > Positive ion probe or microscope type
Description: Subject matter wherein the charged particles are positively charged.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7285778 |
Probe current imaging |
Oct. 23, 2007 |
| 7285785 |
Apparatus with permanent magnetic lenses |
Oct. 23, 2007 |
| 7285792 |
Scratch repairing processing method and scanning probe microscope (SPM) used therefor |
Oct. 23, 2007 |
| 7276691 |
Ion beam device and ion beam processing method |
Oct. 2, 2007 |
| 7276693 |
Inspection method and apparatus using charged particle beam |
Oct. 2, 2007 |
| 7268358 |
Method of modulating laser-accelerated protons for radiation therapy |
Sep. 11, 2007 |
| 7268348 |
Scanning probe for data storage and microscopy |
Sep. 11, 2007 |
| 7259372 |
Processing method using probe of scanning probe microscope |
Aug. 21, 2007 |
| 7259373 |
Apparatus and method for controlled particle beam manufacturing |
Aug. 21, 2007 |
| 7253409 |
Electrochemical nano-patterning using ionic conductors |
Aug. 7, 2007 |
| 7253408 |
Environmental cell for a scanning probe microscope |
Aug. 7, 2007 |
| 7254212 |
Particulate matter analyzer, collecting filter and system for analyzing and collecting samples from fluids |
Aug. 7, 2007 |
| 7241987 |
Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe |
Jul. 10, 2007 |
| 7238952 |
Metal ion emission device and process for producing the same, ion beam irradiation device, processing apparatus and analyzing apparatus provided with emission device |
Jul. 3, 2007 |
| 7235798 |
Focused ion beam apparatus |
Jun. 26, 2007 |
| 7235784 |
Transmission electron microscope and image observation method using it |
Jun. 26, 2007 |
| 7235796 |
Method and apparatus for the generation of anionic and neutral particulate beams and a system using same |
Jun. 26, 2007 |
| 7232995 |
Method of removing particle of photomask using atomic force microscope |
Jun. 19, 2007 |
| 7232997 |
Apparatus and method for investigating or modifying a surface with a beam of charged particles |
Jun. 19, 2007 |
| 7223974 |
Charged particle beam column and method for directing a charged particle beam |
May. 29, 2007 |
| 7220973 |
Modular manipulation system for manipulating a sample under study with a microscope |
May. 22, 2007 |
| 7214935 |
Transmission electron microscopy sample preparation method for electron holography |
May. 8, 2007 |
| 7211795 |
Method for manufacturing single wall carbon nanotube tips |
May. 1, 2007 |
| 7211789 |
Programmable molecular manipulating processes |
May. 1, 2007 |
| 7205534 |
Method and apparatus for in situ depositing of neutral Cs under ultra-high vacuum to analytical ends |
Apr. 17, 2007 |
| 7200506 |
Method for failure analysis and system for failure analysis |
Apr. 3, 2007 |
| 7188031 |
Method for acquiring information of a biochip using time of flight secondary ion mass spectrometry and an apparatus for acquiring information for the application thereof |
Mar. 6, 2007 |
| 7170054 |
Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder |
Jan. 30, 2007 |
| 7164128 |
Method and apparatus for observing a specimen |
Jan. 16, 2007 |
| 7157702 |
High resolution atom probe |
Jan. 2, 2007 |
| 7141790 |
Defect inspection instrument and positron beam apparatus |
Nov. 28, 2006 |
| 7132673 |
Device and method for milling of material using ions |
Nov. 7, 2006 |
| 7129483 |
Laser desorption and ionization mass spectrometer with quantitative reproducibility |
Oct. 31, 2006 |
| 7119333 |
Ion detector for ion beam applications |
Oct. 10, 2006 |
| 7115865 |
Method of applying micro-protection in defect analysis |
Oct. 3, 2006 |
| 7109501 |
Charged particle beam lithography system, pattern drawing method, and method of manufacturing semiconductor device |
Sep. 19, 2006 |
| 7105813 |
Method and apparatus for analyzing the composition of an object |
Sep. 12, 2006 |
| 7095024 |
TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope |
Aug. 22, 2006 |
| 7095021 |
Method, apparatus and system for specimen fabrication by using an ion beam |
Aug. 22, 2006 |
| 7091484 |
Method and apparatus for crystal analysis |
Aug. 15, 2006 |
| 7084399 |
Ion beam apparatus and sample processing method |
Aug. 1, 2006 |
| 7081625 |
Charged particle beam apparatus |
Jul. 25, 2006 |
| 7078687 |
Thin film analyzing method |
Jul. 18, 2006 |
| 7067807 |
Charged particle beam column and method of its operation |
Jun. 27, 2006 |
| 7067825 |
Eye protection system on an electronically controlled fluorescence microscope |
Jun. 27, 2006 |
| 7064325 |
Apparatus with permanent magnetic lenses |
Jun. 20, 2006 |
| 7041975 |
Sample analyzer |
May. 9, 2006 |
| 7038222 |
System and method for using areas near photo global alignment marks or unpatterned areas of a semiconductor wafer to create structures for SIMS or E-Beam or XRD testing |
May. 2, 2006 |
| 7038203 |
Method for observing high-altitude neutral air and device for observing high-altitude neutral air |
May. 2, 2006 |
| 7034297 |
Method and system for use in the monitoring of samples with a charged particle beam |
Apr. 25, 2006 |
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