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Browse by Category: Main > Electrical & Energy
Class Information
Number: 250/305
Name: Radiant energy > Electron energy analysis
Description: Subject matter having means for or method of separating electrons according to their respective energies (including velocity and momentum) and detecting the separated electrons.










Patents under this class:
1 2 3 4 5 6 7 8 9 10 11

Patent Number Title Of Patent Date Issued
8710452 Charged particle source with integrated electrostatic energy filter Apr. 29, 2014
8669522 Mask inspection apparatus and mask inspection method Mar. 11, 2014
8658973 Auger elemental identification algorithm Feb. 25, 2014
8642956 Transmission electron microscope and method of operating a transmission electron microscope Feb. 4, 2014
8633438 Ultrafast electron diffraction device Jan. 21, 2014
8629395 Charged particle beam apparatus Jan. 14, 2014
8610059 Method and system for non-destructive distribution profiling of an element in a film Dec. 17, 2013
8598525 Particle beam system Dec. 3, 2013
8592764 X-ray detector for electron microscope Nov. 26, 2013
8592761 Monochromator for charged particle beam apparatus Nov. 26, 2013
8586919 Low-voltage transmission electron microscopy Nov. 19, 2013
8575548 Analyzing the transport of plasmonic particles through mineral formations Nov. 5, 2013
8552369 Obtaining elemental concentration profile of sample Oct. 8, 2013
8530835 Imaging energy filter for electrically charged particles and spectroscope having same Sep. 10, 2013
8513603 In-situ determination of thin film and multilayer structure and chemical composition using x-ray fluorescence induced by grazing incidence electron beams during thin film growth Aug. 20, 2013
8507853 Method and system for determining depth profiling Aug. 13, 2013
8487250 Method for detecting information of an electronic potential on a sample and charged particle beam apparatus Jul. 16, 2013
8481931 Electron spectroscopy Jul. 9, 2013
8481963 Ion slicer with accelleration and decelleration optics Jul. 9, 2013
8476588 Method of electron diffraction tomography Jul. 2, 2013
8466415 Methods for performing circuit edit operations with low landing energy electron beams Jun. 18, 2013
8466416 Electron detecting mechanism and charged particle beam system equipped therewith Jun. 18, 2013
8461525 Charged particle source with integrated energy filter Jun. 11, 2013
8455823 Charged particle beam device Jun. 4, 2013
8450685 Electron probe microanalyzer and data processing method implemented therein May. 28, 2013
8450684 Quantification method of functional groups of organic layer May. 28, 2013
8450681 Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal off May. 28, 2013
8436300 Method for characterisation of dielectric layers by ultraviolet photo-emission spectroscopy May. 7, 2013
8426811 Electron microscope Apr. 23, 2013
8421030 Charged-particle energy analyzer Apr. 16, 2013
8421007 X-ray detection system Apr. 16, 2013
8415620 Determining doping type and level in semiconducting nanostructures Apr. 9, 2013
8410439 X-ray detector for electron microscope Apr. 2, 2013
8373122 Spheroidal charged particle energy analysers Feb. 12, 2013
8344320 Electron microscope with electron spectrometer Jan. 1, 2013
8334512 Detector system for use with transmission electron microscope spectroscopy Dec. 18, 2012
8334508 Mirror energy filter for electron beam apparatus Dec. 18, 2012
8309923 Sample observing method and scanning electron microscope Nov. 13, 2012
8299430 Electron microscope and observation method Oct. 30, 2012
8294093 Wide aperature wien ExB mass filter Oct. 23, 2012
8283631 In-situ differential spectroscopy Oct. 9, 2012
8283629 Aberration-corrected wien ExB mass filter with removal of neutrals from the Beam Oct. 9, 2012
8274046 Monochromator for charged particle beam apparatus Sep. 25, 2012
8269167 Method and system for non-destructive distribution profiling of an element in a film Sep. 18, 2012
8263936 Transmission electron microscope having electron spectroscope Sep. 11, 2012
8263934 Method for detecting information of an electric potential on a sample and charged particle beam apparatus Sep. 11, 2012
8232518 Device and method for characterizing surfaces Jul. 31, 2012
8222598 Method for quantitative analysis of a material Jul. 17, 2012
8203119 Charged particle beam device with retarding field analyzer Jun. 19, 2012
8183526 Mirror monochromator for charged particle beam apparatus May. 22, 2012

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