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Class Information
Number: 250/304
Name: Radiant energy > Methods including separation or nonradiant treatment of test materials
Description: Subject matter which includes methods of preparing a material or separating one material from other materials for an invisible radiation test or controlling a material while being tested by invisible radiation and subjecting the material so prepared, separated or controlled to a radiation test.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7453073 |
Method and equipment for specimen preparation |
Nov. 18, 2008 |
| 7442924 |
Repetitive circumferential milling for sample preparation |
Oct. 28, 2008 |
| 7432501 |
Ionising particle analyser enabling for example the separation of the fluorescent yield (FY) and the total electron yield (TEY) in EXAPS (extended X-ray absorption fine structure) measurements |
Oct. 7, 2008 |
| 7427753 |
Method of cross-section milling with focused ion beam (FIB) device |
Sep. 23, 2008 |
| 7423261 |
Curved conduit ion sampling device and method |
Sep. 9, 2008 |
| 7423263 |
Planar view sample preparation |
Sep. 9, 2008 |
| 7394075 |
Preparation of integrated circuit device samples for observation and analysis |
Jul. 1, 2008 |
| 7297944 |
Ion beam device and ion beam processing method, and holder member |
Nov. 20, 2007 |
| 7291837 |
Apparatus and method for preparing samples for radiocarbon dating |
Nov. 6, 2007 |
| 7196338 |
Ultra-thin sample preparation for transmission electron microscopy |
Mar. 27, 2007 |
| 7189968 |
Sample measurement method and measurement sample base material |
Mar. 13, 2007 |
| 7180061 |
Method for electron beam-initiated coating for application of transmission electron microscopy |
Feb. 20, 2007 |
| 7112790 |
Method to prepare TEM samples |
Sep. 26, 2006 |
| 7038218 |
Inspection by a transmission electron microscope of a sample |
May. 2, 2006 |
| 7034299 |
Transmission electron microscope system and method of inspecting a specimen using the same |
Apr. 25, 2006 |
| 7005636 |
Method and apparatus for manipulating a microscopic sample |
Feb. 28, 2006 |
| 6924481 |
Scanning microscope with brightness control |
Aug. 2, 2005 |
| 6867413 |
High-flow rate, low-noise, gas sampling apparatus and methods for collecting and detecting particulate in a gas |
Mar. 15, 2005 |
| 6847033 |
Method and device for quickly and continually detecting changes in the concentration of radon gas that is dissolved in water |
Jan. 25, 2005 |
| 6826971 |
Fabrication method for sample to be analyzed |
Dec. 7, 2004 |
| 6784427 |
Samples for transmission electron microscopy |
Aug. 31, 2004 |
| 6700121 |
Methods of sampling specimens for microanalysis |
Mar. 2, 2004 |
| 6674072 |
Preparation of thin lead samples for alpha particle emission test |
Jan. 6, 2004 |
| 6576900 |
Methods of sampling specimens for microanalysis |
Jun. 10, 2003 |
| 6495835 |
Device for determining nuclide contents of radioactive inert gases |
Dec. 17, 2002 |
| 6433335 |
Geiger-Mueller triode for sensing the direction of incident ionizing gamma radiation |
Aug. 13, 2002 |
| 6362474 |
Semiconductor sample for transmission electron microscope and method of manufacturing the same |
Mar. 26, 2002 |
| 6326213 |
Acoustic standing-wave enhancement of a fiber-optic Salmonella biosensor |
Dec. 4, 2001 |
| 6124103 |
Arrangement and method of examining hydrophilic macromolecules in an aqueous solution |
Sep. 26, 2000 |
| 5990478 |
Method for preparing thin specimens consisting of domains of different materials |
Nov. 23, 1999 |
| 5952655 |
Ultra-high sensitivity radiation detection apparatus and method |
Sep. 14, 1999 |
| 5932818 |
Near real time vapor detection and enhancement using aerosol adsorption |
Aug. 3, 1999 |
| 5780852 |
Dimension measurement of a semiconductor device |
Jul. 14, 1998 |
| 5619038 |
Method and apparatus for determining the polymer content of a cellulose/polymer mixture and associated calibration |
Apr. 8, 1997 |
| 5614724 |
Filter type gas sampler with filter consolidation |
Mar. 25, 1997 |
| 5604348 |
Measurement of acid sulfate levels in aerosols |
Feb. 18, 1997 |
| RE35317 |
Potentiostatic preparation of molecular adsorbates for scanning probe microscopy |
Aug. 27, 1996 |
| 5521377 |
Measurement of trace element concentration distribution, and evaluation of carriers, in semiconductors, and preparation of standard samples |
May. 28, 1996 |
| 5468968 |
Air quality monitoring system and process |
Nov. 21, 1995 |
| 5353112 |
Optical inspection method and apparatus |
Oct. 4, 1994 |
| 5352898 |
Method and apparatus for preparing slurry specimens for cryo-scanning electron microscopy |
Oct. 4, 1994 |
| 5235190 |
Continuous air monitoring system |
Aug. 10, 1993 |
| 5155361 |
Potentiostatic preparation of molecular adsorbates for scanning probe microscopy |
Oct. 13, 1992 |
| 5145785 |
Determination of aromatics in hydrocarbons by near infrared spectroscopy and calibration therefor |
Sep. 8, 1992 |
| 5081352 |
Technique for the analysis of insulating materials by glow discharge mass spectrometry |
Jan. 14, 1992 |
| 5053625 |
Surface characterization apparatus and method |
Oct. 1, 1991 |
| 5045703 |
Cold trapping apparatus for infrared transmission analysis including a method and substrate therefor |
Sep. 3, 1991 |
| 5023452 |
Method and apparatus for detecting trace contaminents |
Jun. 11, 1991 |
| 5004920 |
Method of preparing membrane filters for transmission electron microscopy |
Apr. 2, 1991 |
| H901 |
Method of identifying the composition of a material sample |
Mar. 5, 1991 |
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