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Class Information
Number: 250/299
Name: Radiant energy > Ionic separation or analysis > Static field-type ion path-bending selecting means > Magnetic field path-bending means > With detector
Description: Subject matter including signalling means responsive to the selected ions.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7459677 |
Mass spectrometer for trace gas leak detection with suppression of undesired ions |
Dec. 2, 2008 |
| 7449687 |
Methods and compositions for combining ions and charged particles |
Nov. 11, 2008 |
| 7442920 |
Optical bench for a mass spectrometer system |
Oct. 28, 2008 |
| 7427751 |
High sensitivity slitless ion source mass spectrometer for trace gas leak detection |
Sep. 23, 2008 |
| 7427752 |
Mass spectrometer |
Sep. 23, 2008 |
| 7423259 |
Mass spectrometer and method for enhancing dynamic range |
Sep. 9, 2008 |
| 7417223 |
Method, system and computer software product for specific identification of reaction pairs associated by specific neutral differences |
Aug. 26, 2008 |
| 7417235 |
Particle detector for secondary ions and direct and or indirect secondary electrons |
Aug. 26, 2008 |
| 7402799 |
MEMS mass spectrometer |
Jul. 22, 2008 |
| 7399957 |
Coded mass spectroscopy methods, devices, systems and computer program products |
Jul. 15, 2008 |
| 7381373 |
System and method for preparative mass spectrometry |
Jun. 3, 2008 |
| 7378651 |
High field asymmetric waveform ion mobility spectrometer FAIMS |
May. 27, 2008 |
| 7361311 |
System and method for the preparation of arrays of biological or other molecules |
Apr. 22, 2008 |
| 7351957 |
Broad ion fragmentation coverage in mass spectrometry by varying the collision energy |
Apr. 1, 2008 |
| 7348554 |
Mass spectrometer |
Mar. 25, 2008 |
| 7326941 |
Apparatus and methods for ion beam implantation using ribbon and spot beams |
Feb. 5, 2008 |
| 7312444 |
Atmosperic pressure quadrupole analyzer |
Dec. 25, 2007 |
| 7291834 |
Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitions |
Nov. 6, 2007 |
| 7282709 |
Charged particle beam detection system |
Oct. 16, 2007 |
| 7259369 |
Dual mode ion mobility spectrometer and method for ion mobility spectrometry |
Aug. 21, 2007 |
| 7256396 |
Sensitive glow discharge ion source for aerosol and gas analysis |
Aug. 14, 2007 |
| 7242008 |
Bipolar ion detector |
Jul. 10, 2007 |
| 7201878 |
Aerosol particle analyzer for measuring an analyte in airborne particles |
Apr. 10, 2007 |
| 7201879 |
Aerosol into liquid collector for depositing particles from a large volume of gas into a small volume of liquid |
Apr. 10, 2007 |
| 7199361 |
Broad ion fragmentation coverage in mass spectrometry by varying the collision energy |
Apr. 3, 2007 |
| 7176452 |
Microfabricated beam modulation device |
Feb. 13, 2007 |
| 7153475 |
Aerosol particle analyzer for measuring the amount of analyte in airborne particles |
Dec. 26, 2006 |
| 7145134 |
Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitions |
Dec. 5, 2006 |
| 7125518 |
Aerosol particle analyzer for measuring the amount of analyte in airborne particles |
Oct. 24, 2006 |
| 7112789 |
High aspect ratio, high mass resolution analyzer magnet and system for ribbon ion beams |
Sep. 26, 2006 |
| 7081623 |
Wafer-based ion traps |
Jul. 25, 2006 |
| 7057170 |
Compact ion gauge using micromachining and MISOC devices |
Jun. 6, 2006 |
| 7038200 |
Ion cyclotron resonance mass spectrometer |
May. 2, 2006 |
| 7012248 |
Time of flight system on a chip |
Mar. 14, 2006 |
| 6995363 |
Reduction of matrix interference for MALDI mass spectrometry analysis |
Feb. 7, 2006 |
| 6982413 |
Method of automatically calibrating electronic controls in a mass spectrometer |
Jan. 3, 2006 |
| 6979818 |
Mass spectrometer for both positive and negative particle detection |
Dec. 27, 2005 |
| 6967323 |
Mass spectrometer |
Nov. 22, 2005 |
| 6906321 |
Time-of-flight mass spectrometer |
Jun. 14, 2005 |
| 6900434 |
Method and device for separating ion mass, and ion doping device |
May. 31, 2005 |
| 6881952 |
Residual gas analyzer of semiconductor device manufacturing equipment |
Apr. 19, 2005 |
| 6847035 |
Devices and methods for the detection of particles |
Jan. 25, 2005 |
| 6844543 |
Quantitation of absorbed or deposited materials on a substrate that measures energy deposition |
Jan. 18, 2005 |
| 6831276 |
Microscale mass spectrometric chemical-gas sensor |
Dec. 14, 2004 |
| 6828553 |
Compact very high resolution time-of flight mass spectrometer |
Dec. 7, 2004 |
| 6815673 |
Use of notched broadband waveforms in a linear ion trap |
Nov. 9, 2004 |
| 6797949 |
Mass spectrometer |
Sep. 28, 2004 |
| 6784424 |
Apparatus and method for focusing and selecting ions and charged particles at or near atmospheric pressure |
Aug. 31, 2004 |
| 6680476 |
Summed time-of-flight mass spectrometry utilizing thresholding to reduce noise |
Jan. 20, 2004 |
| 6653637 |
X-ray detector and charged-particle apparatus |
Nov. 25, 2003 |
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