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Class Information
Number: 250/298
Name: Radiant energy > Ionic separation or analysis > Static field-type ion path-bending selecting means > Magnetic field path-bending means
Description: Subject matter wherein the ion selecting means is a magnetic field.


Sub-classes under this class:

Class Number Class Name Patents
250/299 With detector 112


Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
7427751 High sensitivity slitless ion source mass spectrometer for trace gas leak detection Sep. 23, 2008
7385187 Multi-reflecting time-of-flight mass spectrometer and method of use Jun. 10, 2008
7381949 Method and apparatus for simultaneously depositing and observing materials on a target Jun. 3, 2008
7378651 High field asymmetric waveform ion mobility spectrometer FAIMS May. 27, 2008
7326941 Apparatus and methods for ion beam implantation using ribbon and spot beams Feb. 5, 2008
7317192 High energy polyenergetic ion selection systems, ion beam therapy systems, and ion beam treatment centers Jan. 8, 2008
7223972 Stabilization of a magnetic section of a mass spectrometer May. 29, 2007
7164139 Wien filter with reduced chromatic aberration Jan. 16, 2007
7115861 Spectrograph time of flight system for low energy neutral particles Oct. 3, 2006
7112789 High aspect ratio, high mass resolution analyzer magnet and system for ribbon ion beams Sep. 26, 2006
7105839 Method and fine-control collimator for accurate collimation and precise parallel alignment of scanned ion beams Sep. 12, 2006
7078713 Electromagnetic regulator assembly for adjusting and controlling the current uniformity of continuous ion beams Jul. 18, 2006
7078852 Method and apparatus for simultaneously depositing and observing materials on a target Jul. 18, 2006
7019314 Systems and methods for ion beam focusing Mar. 28, 2006
7012248 Time of flight system on a chip Mar. 14, 2006
6984821 Mass spectrometer and methods of increasing dispersion between ion beams Jan. 10, 2006
6906333 Magnetic separator for linear dispersion and method for producing the same Jun. 14, 2005
6906453 Method and apparatus for simultaneously depositing and observing materials on a target Jun. 14, 2005
6906321 Time-of-flight mass spectrometer Jun. 14, 2005
6900434 Method and device for separating ion mass, and ion doping device May. 31, 2005
6881966 Hybrid magnetic/electrostatic deflector for ion implantation systems Apr. 19, 2005
6855939 Particle beam system having a mirror corrector Feb. 15, 2005
6843375 Magnetic separator for linear dispersion and method for producing the same Jan. 18, 2005
6838676 Particle beam processing system Jan. 4, 2005
6835930 High mass resolution magnet for ribbon beam ion implanters Dec. 28, 2004
6833545 Method and device for performing analyses in parallel Dec. 21, 2004
6831276 Microscale mass spectrometric chemical-gas sensor Dec. 14, 2004
6815880 Method and apparatus for simultaneously depositing and observing materials on a target Nov. 9, 2004
6815666 Single stage accelerator mass spectrometer Nov. 9, 2004
6781117 Efficient direct current collision and reaction cell Aug. 24, 2004
6777671 Time-of-flight/ion trap mass spectrometer, a method, and a computer program product to use the same Aug. 17, 2004
6768109 Method and apparatus for magnetic separation of ions Jul. 27, 2004
6646252 Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisition Nov. 11, 2003
6639227 Apparatus and method for charged particle filtering and ion implantation Oct. 28, 2003
6635883 Gas cluster ion beam low mass ion filter Oct. 21, 2003
6624410 Cycloidal mass spectrometer Sep. 23, 2003
6621078 Ion trapping device Sep. 16, 2003
6617576 Cycloidal mass spectrometer with time of flight characteristics and associated method Sep. 9, 2003
6611087 Method and apparatus for simultaneously depositing and observing materials on a target Aug. 26, 2003
6573110 Combinatorial chemistry system and method of use Jun. 3, 2003
6573517 Ion implantation apparatus Jun. 3, 2003
6541781 Waveguide for microwave excitation of plasma in an ion beam guide Apr. 1, 2003
6521895 Wide dynamic range ion beam scanners Feb. 18, 2003
6522056 Method and apparatus for simultaneously depositing and observing materials on a target Feb. 18, 2003
6465780 Filters for cathodic arc plasmas Oct. 15, 2002
6465793 Arc initiation in cathodic arc plasma sources Oct. 15, 2002
6452169 Wien filter Sep. 17, 2002
6429607 Constant power dynamic focus coil Aug. 6, 2002
6403956 Temperature compensation for miniaturized magnetic sector Jun. 11, 2002
6365894 Electromagnet and magnetic field generating apparatus Apr. 2, 2002

1 2 3


 
 
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