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Class Information
Number: 250/296
Name: Radiant energy > Ionic separation or analysis > Static field-type ion path-bending selecting means > Plural diverse-type static path-bending fields
Description: Subject matter including in addition to a first type static field ion selecting means, another static field of a different type ion path bending means which may be for the purpose of selecting ions of one charge-to-mass ration from ions of another charge-to-mass ratio or for some other purpose such as accelerating or focusing the ions.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7402799 |
MEMS mass spectrometer |
Jul. 22, 2008 |
| 7378651 |
High field asymmetric waveform ion mobility spectrometer FAIMS |
May. 27, 2008 |
| 7351955 |
Reduction of chemical noise in a MALDI mass spectrometer by in-trap photodissociation of matrix cluster ions |
Apr. 1, 2008 |
| 7211788 |
Mass spectrometer and mass filters therefor |
May. 1, 2007 |
| 7176452 |
Microfabricated beam modulation device |
Feb. 13, 2007 |
| 7115861 |
Spectrograph time of flight system for low energy neutral particles |
Oct. 3, 2006 |
| 7012248 |
Time of flight system on a chip |
Mar. 14, 2006 |
| 6984821 |
Mass spectrometer and methods of increasing dispersion between ion beams |
Jan. 10, 2006 |
| 6924478 |
Tandem mass spectrometry method |
Aug. 2, 2005 |
| 6906321 |
Time-of-flight mass spectrometer |
Jun. 14, 2005 |
| 6831276 |
Microscale mass spectrometric chemical-gas sensor |
Dec. 14, 2004 |
| 6815666 |
Single stage accelerator mass spectrometer |
Nov. 9, 2004 |
| 6815674 |
Mass spectrometer and related ionizer and methods |
Nov. 9, 2004 |
| 6762407 |
Mass spectrometer including a quadrupole mass analyzer arrangement |
Jul. 13, 2004 |
| 6717140 |
Selective ion source for high intensity focused and collimated ion beams--coupling with high resolution cycloidal path sector |
Apr. 6, 2004 |
| 6650527 |
Article comprising a casimir force modulator and methods therefor |
Nov. 18, 2003 |
| 6646252 |
Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisition |
Nov. 11, 2003 |
| 6639227 |
Apparatus and method for charged particle filtering and ion implantation |
Oct. 28, 2003 |
| 6633034 |
Method and apparatus for imaging a specimen using low profile electron detector for charged particle beam imaging apparatus including electrostatic mirrors |
Oct. 14, 2003 |
| 6596991 |
Isotopomer mass spectrometer |
Jul. 22, 2003 |
| 6593566 |
Method and apparatus for particle acceleration |
Jul. 15, 2003 |
| 6590207 |
Microscale mass spectrometric chemical-gas sensor |
Jul. 8, 2003 |
| 6573110 |
Combinatorial chemistry system and method of use |
Jun. 3, 2003 |
| 6573517 |
Ion implantation apparatus |
Jun. 3, 2003 |
| 6541769 |
Mass spectrometer |
Apr. 1, 2003 |
| 6541781 |
Waveguide for microwave excitation of plasma in an ion beam guide |
Apr. 1, 2003 |
| 6541780 |
Particle beam current monitoring technique |
Apr. 1, 2003 |
| 6501076 |
Electron analyzer having an integrated low pass filter |
Dec. 31, 2002 |
| 6501074 |
Double-focusing mass spectrometer apparatus and methods regarding same |
Dec. 31, 2002 |
| 6297501 |
Simultaneous detection isotopic ratio mass spectrometer |
Oct. 2, 2001 |
| 6252224 |
Closed magnetic field line separator |
Jun. 26, 2001 |
| 5872356 |
Spatially-resolved electrical deflection mass spectrometry |
Feb. 16, 1999 |
| 5723862 |
Mass spectrometer utilizing high energy product density permanent magnets |
Mar. 3, 1998 |
| 5661298 |
Mass spectrometer |
Aug. 26, 1997 |
| 5650618 |
Compact mass spectrometer for plasma discharge ion analysis |
Jul. 22, 1997 |
| 5621209 |
Attomole detector |
Apr. 15, 1997 |
| 5616920 |
Apparatus for removing ions from an electron beam |
Apr. 1, 1997 |
| 5559327 |
Ion filter and mass spectrometer using arcuate hyperbolic quadrapoles |
Sep. 24, 1996 |
| 5552599 |
Mass spectrometer having an ICP source |
Sep. 3, 1996 |
| 5534699 |
Device for separating and recombining charged particle beams |
Jul. 9, 1996 |
| 5466933 |
Dual electron analyzer |
Nov. 14, 1995 |
| 5466933 |
Dual electron analyzer |
Nov. 14, 1995 |
| 5453614 |
Mass spectrometry probe, particularly in magnetized plasma |
Sep. 26, 1995 |
| 5376787 |
Mass spectrometer with adjustable aperture mechanism |
Dec. 27, 1994 |
| 5352893 |
Isotopic-ratio plasma source mass spectrometer |
Oct. 4, 1994 |
| 5313061 |
Miniaturized mass spectrometer system |
May. 17, 1994 |
| 5304799 |
Cycloidal mass spectrometer and ionizer for use therein |
Apr. 19, 1994 |
| 5278407 |
Secondary-ion mass spectrometry apparatus using field limiting method |
Jan. 11, 1994 |
| 5237174 |
Single atom detection of chlorine-36 by triple-stage accelerator mass spectrometry |
Aug. 17, 1993 |
| 5198666 |
Mass spectrometer having a multichannel detector |
Mar. 30, 1993 |
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