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Class Information
Number: 250/296
Name: Radiant energy > Ionic separation or analysis > Static field-type ion path-bending selecting means > Plural diverse-type static path-bending fields
Description: Subject matter including in addition to a first type static field ion selecting means, another static field of a different type ion path bending means which may be for the purpose of selecting ions of one charge-to-mass ration from ions of another charge-to-mass ratio or for some other purpose such as accelerating or focusing the ions.

Sub-classes under this class:

Class Number Class Name Patents
250/297 For causing complex ion path 45

Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
8598516 Method of mass-spectrometry and a device for its realization Dec. 3, 2013
8592757 Mass spectrometer and method for isotope analysis Nov. 26, 2013
8546768 Device for generating an ion beam with magnetic filter Oct. 1, 2013
8536524 Fast mud gas logging using tandem mass spectroscopy Sep. 17, 2013
8410415 Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detector Apr. 2, 2013
8373121 Magnetic achromatic mass spectrometer with double focusing Feb. 12, 2013
8357893 Ion mobility sensor system Jan. 22, 2013
8294093 Wide aperature wien ExB mass filter Oct. 23, 2012
8203119 Charged particle beam device with retarding field analyzer Jun. 19, 2012
8193490 High mass resolution with ICR measuring cells Jun. 5, 2012
8026480 Mass spectrometer Sep. 27, 2011
8013292 Mass spectrometer Sep. 6, 2011
8013296 Charged-particle condensing device Sep. 6, 2011
8013297 Ion gate for dual ion mobility spectrometer and method thereof Sep. 6, 2011
7932487 Mass spectrometer with looped ion path Apr. 26, 2011
7842919 Q-pole type mass spectrometer Nov. 30, 2010
7755036 Instrument and method for tandem time-of-flight mass spectrometry Jul. 13, 2010
7755040 Mass spectrometer and electric field source for mass spectrometer Jul. 13, 2010
7728290 Orbital ion trap including an MS/MS method and apparatus Jun. 1, 2010
7679054 Double stage charged particle beam energy width reduction system for charged particle beam system Mar. 16, 2010
7679051 Ion composition analyzer with increased dynamic range Mar. 16, 2010
7498572 Deflecting electromagnet and ion beam irradiating apparatus Mar. 3, 2009
7476854 High speed, multiple mass spectrometry for ion sequencing Jan. 13, 2009
7473905 Electrostatic deflector Jan. 6, 2009
7402799 MEMS mass spectrometer Jul. 22, 2008
7378651 High field asymmetric waveform ion mobility spectrometer FAIMS May. 27, 2008
7351955 Reduction of chemical noise in a MALDI mass spectrometer by in-trap photodissociation of matrix cluster ions Apr. 1, 2008
7211788 Mass spectrometer and mass filters therefor May. 1, 2007
7176452 Microfabricated beam modulation device Feb. 13, 2007
7115861 Spectrograph time of flight system for low energy neutral particles Oct. 3, 2006
7012248 Time of flight system on a chip Mar. 14, 2006
6984821 Mass spectrometer and methods of increasing dispersion between ion beams Jan. 10, 2006
6924478 Tandem mass spectrometry method Aug. 2, 2005
6906321 Time-of-flight mass spectrometer Jun. 14, 2005
6831276 Microscale mass spectrometric chemical-gas sensor Dec. 14, 2004
6815666 Single stage accelerator mass spectrometer Nov. 9, 2004
6815674 Mass spectrometer and related ionizer and methods Nov. 9, 2004
6762407 Mass spectrometer including a quadrupole mass analyzer arrangement Jul. 13, 2004
6717140 Selective ion source for high intensity focused and collimated ion beams--coupling with high resolution cycloidal path sector Apr. 6, 2004
6650527 Article comprising a casimir force modulator and methods therefor Nov. 18, 2003
6646252 Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisition Nov. 11, 2003
6639227 Apparatus and method for charged particle filtering and ion implantation Oct. 28, 2003
6633034 Method and apparatus for imaging a specimen using low profile electron detector for charged particle beam imaging apparatus including electrostatic mirrors Oct. 14, 2003
6596991 Isotopomer mass spectrometer Jul. 22, 2003
6593566 Method and apparatus for particle acceleration Jul. 15, 2003
6590207 Microscale mass spectrometric chemical-gas sensor Jul. 8, 2003
6573110 Combinatorial chemistry system and method of use Jun. 3, 2003
6573517 Ion implantation apparatus Jun. 3, 2003
6541781 Waveguide for microwave excitation of plasma in an ion beam guide Apr. 1, 2003
6541780 Particle beam current monitoring technique Apr. 1, 2003

1 2 3

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