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Class Information
Number: 250/292
Name: Radiant energy > Ionic separation or analysis > Cyclically varying ion selecting field means > Laterally resonant ion path
Description: Subject matter wherein the selecting means comprises field means causing alternating deflection of the ions normal to their general forward motion.










Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19

Patent Number Title Of Patent Date Issued
4650999 Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap Mar. 17, 1987
4540884 Method of mass analyzing a sample by use of a quadrupole ion trap Sep. 10, 1985
4535236 Apparatus for and method of operating quadrupole mass spectrometers in the total pressure mode Aug. 13, 1985
4506227 Mass spectrometer Mar. 19, 1985
4486664 Arrangement and process for adjusting imaging systems Dec. 4, 1984
4481415 Quadrupole mass spectrometer Nov. 6, 1984
4377745 Mass spectrometer for chemical ionization, electron impact ionization and mass spectrometry/mass spectrometry operation Mar. 22, 1983
4362936 Apparatus for monitoring and/or controlling plasma processes Dec. 7, 1982
4329582 Tandem mass spectrometer with synchronized RF fields May. 11, 1982
4328420 Tandem mass spectrometer with open structure AC-only rod sections, and method of operating a mass spectrometer system May. 4, 1982
4283626 Methods and apparatus for analysis of mixtures by mass spectrometry Aug. 11, 1981
4230943 Mass spectrometer Oct. 28, 1980
4223223 Broad-range ion mass spectrometer Sep. 16, 1980
4214160 Mass spectrometer system and method for control of ion energy for different masses Jul. 22, 1980
4213043 Method for flowing a large volume of plasma through an excitation region Jul. 15, 1980
4198539 System for producing electric field with predetermined characteristics and edge terminations for resistance planes therefor Apr. 15, 1980
4174479 Mass spectrometer Nov. 13, 1979
4151414 Method and apparatus for detection of extremely small particulate matter and vapors Apr. 24, 1979
4136280 Positive and negative ion recording system for mass spectrometer Jan. 23, 1979
4132892 Raster scanning ion microscope with quadrupole mass filter Jan. 2, 1979
4117321 Electrode system for multipoles and especially for multipole or monopole mass spectrometers Sep. 26, 1978
4106744 Mandrel for formation of mass spectrometer filter Aug. 15, 1978
4107527 Ion-emission microanalyzer microscope Aug. 15, 1978
4105917 Method and apparatus for mass spectrometric analysis at ultra-low pressures Aug. 8, 1978
4105916 Methods and apparatus for simultaneously producing and electronically separating the chemical ionization mass spectrum and the electron impact ionization mass spectrum of the same sample mater Aug. 8, 1978
4093855 Detector for heavy ions following mass analysis Jun. 6, 1978
4090075 Method and apparatus for mass analysis by multi-pole mass filters May. 16, 1978
4079254 Mass spectrometer filter Mar. 14, 1978
4075479 Focusing ion lens system for mass spectrometer for separating charged and neutral particles Feb. 21, 1978
4066894 Positive and negative ion recording system for mass spectrometer Jan. 3, 1978
4058724 Ion Scattering spectrometer with two analyzers preferably in tandem Nov. 15, 1977
4039828 Quadrupole mass spectrometer Aug. 2, 1977
4032782 Temperature stable multipole mass filter and method therefor Jun. 28, 1977
4013887 Methods and apparatus for spatial separation of ac and dc electric fields with application to fringe fields in quadrupole mass filters Mar. 22, 1977
3973121 Detector for heavy ions following mass analysis Aug. 3, 1976
3970854 High speed ion beam switching arrangement for use in the production of determinate solid body dopings by means of ion implantation Jul. 20, 1976
3946229 Gain control for a quadrupole mass spectrometer Mar. 23, 1976
3940616 Mass spectrometers Feb. 24, 1976
3939344 Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers Feb. 17, 1976
3937954 Methods and apparatus for spatial separation of AC and DC electric fields, with application to fringe fields in quadrupole mass filters Feb. 10, 1976
3936634 Method and apparatus for improved focusing of ion currents in quadrupole mass filter Feb. 3, 1976
3935452 Quadrupole mobility spectrometer Jan. 27, 1976
3935453 Quadrupole field mass analyser Jan. 27, 1976

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