| |
 |
|
Class Information
Number: 250/282
Name: Radiant energy > Ionic separation or analysis > Methods
Description: Subject matter comprising processes including the steps of selecting ions of one mass-to-charge ratio from ions of different mass-to-charge ratios and detecting or accumulating the selected ions.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6727499 |
Method and device for detecting compounds in a gas stream |
Apr. 27, 2004 |
| 6723286 |
Chemical monitoring method and apparatus, and incinerator |
Apr. 20, 2004 |
| 6723982 |
Storage reduction method and apparatus for mass spectroscopy analysis |
Apr. 20, 2004 |
| 6723983 |
High throughput of laser desorption mass spectra in time-of-flight mass spectrometers |
Apr. 20, 2004 |
| 6723984 |
Environmental sampler for mass spectrometer |
Apr. 20, 2004 |
| 6723985 |
Multiple electrospray device, systems and methods |
Apr. 20, 2004 |
| 6720190 |
Methods for screening compound libraries |
Apr. 13, 2004 |
| 6720554 |
Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps |
Apr. 13, 2004 |
| 6717130 |
Methods and apparatus for mass spectrometry |
Apr. 6, 2004 |
| 6717131 |
Clean daughter-ion spectra using time-of-flight mass spectrometers |
Apr. 6, 2004 |
| 6717132 |
Gridless time-of-flight mass spectrometer for orthogonal ion injection |
Apr. 6, 2004 |
| 6717134 |
Calibration method |
Apr. 6, 2004 |
| 6717135 |
Ion mirror for time-of-flight mass spectrometer |
Apr. 6, 2004 |
| 6713757 |
Controlling the temporal response of mass spectrometers for mass spectrometry |
Mar. 30, 2004 |
| 6713760 |
Analysis of semiconductor surfaces by secondary ion mass spectrometry and methods |
Mar. 30, 2004 |
| 6707033 |
Mass spectrometer |
Mar. 16, 2004 |
| 6707035 |
Sample introduction interface for analytical processing of a sample placed on a substrate |
Mar. 16, 2004 |
| 6707039 |
AP-MALDI target illumination device and method for using an AP-MALDI target illumination device |
Mar. 16, 2004 |
| 6703607 |
Axial ejection resolution in multipole mass spectrometers |
Mar. 9, 2004 |
| 6703608 |
Method and apparatus for generating improved daughter-ion spectra using time-of-flight mass spectrometers |
Mar. 9, 2004 |
| 6700116 |
Ion trap mass spectrometer |
Mar. 2, 2004 |
| 6700117 |
Conditioning of an ion beam for injection into a time-of-flight mass spectrometer |
Mar. 2, 2004 |
| 6700118 |
Thermal drift compensation to mass calibration in time-of-flight mass spectrometry |
Mar. 2, 2004 |
| 6700120 |
Method for improving signal-to-noise ratios for atmospheric pressure ionization mass spectrometry |
Mar. 2, 2004 |
| 6690004 |
Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry |
Feb. 10, 2004 |
| 6683299 |
Time-of-flight mass spectrometer for monitoring of fast processes |
Jan. 27, 2004 |
| 6683300 |
Method and apparatus for mass spectrometry analysis of common analyte solutions |
Jan. 27, 2004 |
| 6683302 |
Method and device for electrospray ionization |
Jan. 27, 2004 |
| 6683303 |
Ion trap mass spectrometer and spectrometry |
Jan. 27, 2004 |
| 6680475 |
Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use |
Jan. 20, 2004 |
| 6680476 |
Summed time-of-flight mass spectrometry utilizing thresholding to reduce noise |
Jan. 20, 2004 |
| 6680477 |
High spatial resolution matrix assisted laser desorption/ionization (MALDI) |
Jan. 20, 2004 |
| 6677582 |
Ion source and mass spectrometer |
Jan. 13, 2004 |
| 6677583 |
Liquid chromatograph/mass spectrometer |
Jan. 13, 2004 |
| 6677593 |
Planar flow-by electrode capacitive electrospray ion source |
Jan. 13, 2004 |
| 6674067 |
Methods and apparatus to control charge neutralization reactions in ion traps |
Jan. 6, 2004 |
| 6674068 |
Time-of-flight (TOF) mass spectrometer and method of TOF mass spectrometric analysis |
Jan. 6, 2004 |
| 6674070 |
On-line and off-line deposition of liquid samples for matrix assisted laser desorption ionization-time of flight (MALDI-TOF) mass spectroscopy |
Jan. 6, 2004 |
| 6670606 |
Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis |
Dec. 30, 2003 |
| 6670607 |
Conductive polymer coated nano-electrospray emitter |
Dec. 30, 2003 |
| 6670624 |
Ion implanter in-situ mass spectrometer |
Dec. 30, 2003 |
| 6660999 |
Helium droplet mass spectrometry (HDMS) |
Dec. 9, 2003 |
| 6661000 |
Method for measuring absorbed and interstitial fluids |
Dec. 9, 2003 |
| 6661001 |
Extended bradbury-nielson gate |
Dec. 9, 2003 |
| 6656739 |
Methods for screening compound libraries |
Dec. 2, 2003 |
| 6657190 |
Variable potential ion guide for mass spectrometry |
Dec. 2, 2003 |
| 6653622 |
Ion fragmentation by electron capture in high-frequency ion traps |
Nov. 25, 2003 |
| 6653625 |
Microfluidic system (MS) |
Nov. 25, 2003 |
| 6653627 |
FAIMS apparatus and method with laser-based ionization source |
Nov. 25, 2003 |
| 6653637 |
X-ray detector and charged-particle apparatus |
Nov. 25, 2003 |
|
|
|
