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Class Information
Number: 250/252.1
Name: Radiant energy > Calibration or standardization methods
Description: Subject matter which includes methods to establish a reference indication of invisible radiation or invisible radiation level, or methods of error determination or correction using a reference indication or radiation level.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| RE37970 |
Pulse oximetry testing |
Jan. 28, 2003 |
| 6512232 |
Method and apparatus for improving the sensitivity of a gamma camera |
Jan. 28, 2003 |
| 6507018 |
Ditherless non-uniformity compensation for infrared detector arrays with recursive spatial low pass filtering |
Jan. 14, 2003 |
| 6502448 |
Chromatography detection system and method |
Jan. 7, 2003 |
| 6501974 |
Compensation of human variability in pulse oximetry |
Dec. 31, 2002 |
| 6498041 |
Optical sensors for rapid, sensitive detection and quantitation of bacterial spores |
Dec. 24, 2002 |
| 6498340 |
Method for calibrating mass spectrometers |
Dec. 24, 2002 |
| 6490336 |
Phantom for measuring slice thicknesses, slice sensitivity profiles and the axial modulation transfer function in an X-ray computed tomography apparatus |
Dec. 3, 2002 |
| 6476392 |
Method and apparatus for temperature compensation of an uncooled focal plane array |
Nov. 5, 2002 |
| 6471916 |
Apparatus and method for calibration of a microarray scanning system |
Oct. 29, 2002 |
| 6473205 |
Image sensor module adjustable in six degrees of freedom for use with an image acquisition device |
Oct. 29, 2002 |
| 6472659 |
Method for measuring ionic currents, and a catching device therefor |
Oct. 29, 2002 |
| 6467952 |
Virtual blackbody radiation system and radiation temperature measuring system |
Oct. 22, 2002 |
| 6459482 |
Grainless material for calibration sample |
Oct. 1, 2002 |
| 6452164 |
Apparatus and method for calibrating gamma cameras |
Sep. 17, 2002 |
| 6444983 |
Microbolometer focal plane array with controlled bias |
Sep. 3, 2002 |
| 6437325 |
System and method for calibrating time-of-flight mass spectra |
Aug. 20, 2002 |
| 6437345 |
Sensing unit provided with separated detection light guiding |
Aug. 20, 2002 |
| 6437347 |
Target locking system for electron beam lithography |
Aug. 20, 2002 |
| 6433333 |
Infrared sensor temperature compensated response and offset correction |
Aug. 13, 2002 |
| 6429425 |
Method for forming a calibation standard to adjust a micro-bar of an electron microscope |
Aug. 6, 2002 |
| 6426501 |
Defect-review SEM, reference sample for adjustment thereof, method for adjustment thereof, and method of inspecting contact holes |
Jul. 30, 2002 |
| 6420702 |
Non-charging critical dimension SEM metrology standard |
Jul. 16, 2002 |
| 6420703 |
Method for forming a critical dimension SEM calibration standard of improved definition and standard formed |
Jul. 16, 2002 |
| 6420700 |
Charged-particle-beam exposure device and charged-particle-beam exposure method |
Jul. 16, 2002 |
| 6414305 |
Automated system for determining minimum resolvable temperature differences |
Jul. 2, 2002 |
| 6410912 |
Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation |
Jun. 25, 2002 |
| 6410919 |
Positron gun for pet attenuation measurements |
Jun. 25, 2002 |
| 6396056 |
Gas detectors and gas analyzers utilizing spectral absorption |
May. 28, 2002 |
| 6392239 |
Optical array converting UV radiation |
May. 21, 2002 |
| 6387709 |
Method of operating an optical sensor adapted for selective analyte-sensing contact with a plurality of samples |
May. 14, 2002 |
| 6388250 |
Personal radiation dosimeters |
May. 14, 2002 |
| 6388253 |
Integrated critical dimension control for semiconductor device manufacturing |
May. 14, 2002 |
| 6384408 |
Calibration of a scanning electron microscope |
May. 7, 2002 |
| 6377300 |
Compact flat-field calibration apparatus |
Apr. 23, 2002 |
| 6373050 |
Focal plane infrared readout circuit with automatic background suppression |
Apr. 16, 2002 |
| 6369381 |
Apparatus and method for calibration of nuclear gauges |
Apr. 9, 2002 |
| 6369386 |
IR sensor with reflective calibration |
Apr. 9, 2002 |
| 6362477 |
Bulk material analyser for on-conveyor belt analysis |
Mar. 26, 2002 |
| 6362471 |
Design of a calibration phantom for in vivo measurement of stable lead or radioactivity in bone |
Mar. 26, 2002 |
| 6362472 |
Method for calibrating a radiation detection system |
Mar. 26, 2002 |
| 6353223 |
Infrared camera |
Mar. 5, 2002 |
| 6350985 |
Method for calculating gain correction factors in a digital imaging system |
Feb. 26, 2002 |
| 6342698 |
Method for calibrating photomultiplier tubes in a scintillation camera |
Jan. 29, 2002 |
| 6342947 |
Optical power high accuracy standard enhancement (OPHASE) system |
Jan. 29, 2002 |
| 6337217 |
Method and apparatus for improved focus in optical processing |
Jan. 8, 2002 |
| 6329651 |
Process and device for real time sorting of detection events from a gamma ray detector and correction of the uniformity of detection elements from the detector |
Dec. 11, 2001 |
| 6322555 |
Method and apparatus for monitoring laser surgery |
Nov. 27, 2001 |
| 6320187 |
Magnification and rotation calibration patterns for particle beam projection system |
Nov. 20, 2001 |
| 6320661 |
Method for measuring transmittance of optical members for ultraviolent use, synthetic silica glass, and photolithography apparatus using the same |
Nov. 20, 2001 |
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