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Class Information
Number: 250/225
Name: Radiant energy > Photocells; circuits and apparatus > Optical or pre-photocell system > Polarizing
Description: Subject matter having a polarizer in the optical path between light source and photocell.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6653152 |
Sensor disk having radial grooves and optical assaying method using same |
Nov. 25, 2003 |
| 6621067 |
Polarization independent photodetector device and method of making same |
Sep. 16, 2003 |
| 6620622 |
Method of polarimetry and method of urinalysis using the same |
Sep. 16, 2003 |
| 6600148 |
Polarization mode dispersion measuring method and polarization mode dispersion measuring system |
Jul. 29, 2003 |
| 6583415 |
Method and system for dynamically polarizing electro-optic signals |
Jun. 24, 2003 |
| 6576886 |
Dynamic control of polarization of an optical signal |
Jun. 10, 2003 |
| 6570707 |
Touch panel with high operability in low temperature environments |
May. 27, 2003 |
| 6552317 |
Optical pickup device |
Apr. 22, 2003 |
| 6549283 |
Method and system for determining the degree of polarization of light |
Apr. 15, 2003 |
| 6548801 |
System and method for optical heterodyne detection of an optical signal |
Apr. 15, 2003 |
| 6542233 |
Method and apparatus for the measurement of erbium optical amplifiers |
Apr. 1, 2003 |
| 6535285 |
Combination thermal wave and optical spectroscopy measurement system |
Mar. 18, 2003 |
| 6526086 |
Band narrowing laser |
Feb. 25, 2003 |
| 6521905 |
Method and device for detecting the position of a transparent moving conveyor belt |
Feb. 18, 2003 |
| 6521884 |
Distance measuring device with magneto-optical effect and measuring chain incorporating same |
Feb. 18, 2003 |
| 6520056 |
Method and apparatus for cutting optical films having precision alignment of optical axes with optical film edges |
Feb. 18, 2003 |
| 6522406 |
Correcting the system polarization sensitivity of a metrology tool having a rotatable polarizer |
Feb. 18, 2003 |
| 6515467 |
Method and system for optically detecting an electric current by means of light signals having different wavelengths |
Feb. 4, 2003 |
| 6515745 |
Optical measurement system using polarized light |
Feb. 4, 2003 |
| 6507012 |
Method and apparatus for detecting malfunctions in communication systems |
Jan. 14, 2003 |
| 6492635 |
Method and device for automatically controlling a polarizing filter |
Dec. 10, 2002 |
| 6489044 |
Process for fabricating polarized organic photonics devices, and resultant articles |
Dec. 3, 2002 |
| 6472651 |
Optical information storage device having phase compensating mechanism and polarization plane rotating mechanism |
Oct. 29, 2002 |
| 6455841 |
Optical wavelength router based on polarization interferometer |
Sep. 24, 2002 |
| 6441902 |
Method for evaluating sample system anisotropic refractive indices and orientations thereof in multiple dimensions |
Aug. 27, 2002 |
| 6437319 |
Optical device |
Aug. 20, 2002 |
| 6437318 |
Encoder using polarized filters |
Aug. 20, 2002 |
| 6434285 |
Fiber optic difference current sensor |
Aug. 13, 2002 |
| 6429669 |
Temperature-insensitive electro-optic probe |
Aug. 6, 2002 |
| 6417921 |
Apparatus for analyzing multi-layer thin film stacks on semiconductors |
Jul. 9, 2002 |
| 6414302 |
High photon energy range reflected light characterization of solids |
Jul. 2, 2002 |
| 6410906 |
Electro-optic probe |
Jun. 25, 2002 |
| 6403946 |
Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical system |
Jun. 11, 2002 |
| 6380533 |
Method for measurement of first-and second-order polarization mode dispersion vectors in optical fibers |
Apr. 30, 2002 |
| 6376829 |
Method of and apparatus for inspecting surface irregularities of transparent plate |
Apr. 23, 2002 |
| 6376852 |
Surface inspection using the ratio of intensities of s--and p-polarized light components of a laser beam reflected a rough surface |
Apr. 23, 2002 |
| 6369377 |
Multiple-beam holographic optical pick-up head |
Apr. 9, 2002 |
| 6369375 |
Detection apparatus having an object gradient detection |
Apr. 9, 2002 |
| 6356347 |
Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface |
Mar. 12, 2002 |
| 6353197 |
Determination of characteristics of material |
Mar. 5, 2002 |
| 6348966 |
Measuring method of liquid crystal pretilt angle and measuring equipment of liquid crystal pretilt angle |
Feb. 19, 2002 |
| 6348786 |
High voltage measuring device utilizing a poled optical fiber |
Feb. 19, 2002 |
| 6342696 |
Object detection method and apparatus employing polarized radiation |
Jan. 29, 2002 |
| 6333498 |
Reduction of integrating cavity effect in scanners using polarizing filters |
Dec. 25, 2001 |
| RE37473 |
Diffraction anomaly sensor having grating coated with protective dielectric layer |
Dec. 18, 2001 |
| 6326608 |
Polarization-type laser detection system |
Dec. 4, 2001 |
| 6323947 |
Angle of incidence accuracy in ultrathin dielectric layer ellipsometry measurement |
Nov. 27, 2001 |
| 6316781 |
Microfluidic devices and systems incorporating integrated optical elements |
Nov. 13, 2001 |
| 6313913 |
Surface inspection apparatus and method |
Nov. 6, 2001 |
| 6307627 |
Optical measurement system using polarized light |
Oct. 23, 2001 |
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