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Class Information
Number: 205/791.5
Name: Electrolysis: processes, compositions used therein, and methods of preparing the compositions > Electrolytic analysis or testing (process and electrolyte composition) > For properties of solid material (e.g., surface area, etc.) > Defects
Description: Subject matter which involves detecting undesirable localized variations in a solid material or component (e.g., localized microstructure defects in a solid metal article which may result in mechanical or electrical failure, etc.).
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7368050 |
Quantitative transient analysis of localized corrosion |
May. 6, 2008 |
| 7063988 |
Circuit for detecting arcing in an etch tool during wafer processing |
Jun. 20, 2006 |
| 6884333 |
Electrochemical system for analyzing performance and properties of electrolytic solutions |
Apr. 26, 2005 |
| 6843904 |
Inspection and repair of active type substrate |
Jan. 18, 2005 |
| 6620309 |
Method for monitoring aluminum electrolytic cells |
Sep. 16, 2003 |
| 6365034 |
High throughput electrochemical test for measuring corrosion resistance |
Apr. 2, 2002 |
| 6328878 |
Adhesive tape sensor for detecting and evaluating coating and substrate degradation utilizing electrochemical processes |
Dec. 11, 2001 |
| 6224746 |
Method and device for testing the quality of a sheet-like element comprising a membrane |
May. 1, 2001 |
| 6162349 |
Method for package partitioning wall testing |
Dec. 19, 2000 |
| 6118280 |
Method for detecting defects in dielectric film |
Sep. 12, 2000 |
| 6080293 |
Electrolytic test machine |
Jun. 27, 2000 |
| 6054038 |
Portable, hand-held, in-situ electrochemical sensor for evaluating corrosion and adhesion on coated or uncoated metal structures |
Apr. 25, 2000 |
| 5980711 |
Electrolytic test machine |
Nov. 9, 1999 |
| 5972186 |
Electrolytic test machine |
Oct. 26, 1999 |
| 5882719 |
Solid tantalum capacitor test |
Mar. 16, 1999 |
| 5851376 |
Catalyst degradation determination apparatus and method |
Dec. 22, 1998 |
| 5820746 |
Metal surface state evaluation method and semiconductor device production method |
Oct. 13, 1998 |
| 5612621 |
Method for monitoring cracks and critical concentration by using phase angle |
Mar. 18, 1997 |
| 5518601 |
Extended use planar sensors |
May. 21, 1996 |
| 5505827 |
Method of detecting carbides in alloy steels by electrochemical polarization |
Apr. 9, 1996 |
| 5316633 |
Method and apparatus for measuring sensitization of structural members |
May. 31, 1994 |
| 5286357 |
Corrosion sensors |
Feb. 15, 1994 |
| 5262034 |
Electrochemical sensor for monitoring electrochemical potentials of fuel cell components |
Nov. 16, 1993 |
| 5227033 |
Electrolytic etching of metals to reveal internal quality |
Jul. 13, 1993 |
| 5015346 |
Electrochemical method for defect delineation in silicon-on-insulator wafers |
May. 14, 1991 |
| 4718992 |
Test medium and method for detecting phosphorus segregates in metallic material |
Jan. 12, 1988 |
| 4715218 |
Method of determining degree of embrittlement of low alloy steel |
Dec. 29, 1987 |
| 4518464 |
Method of detecting embrittlement of heat-resisting steel |
May. 21, 1985 |
| 4498960 |
Electrochemical method for visual detection of nonmetallic surface inclusions in metallic substrates |
Feb. 12, 1985 |
| 4473795 |
System for resist defect measurement |
Sep. 25, 1984 |
| 4451970 |
System and method for eliminating short circuit current paths in photovoltaic devices |
Jun. 5, 1984 |
| 4427496 |
Method for improving the inspection of printed circuit boards |
Jan. 24, 1984 |
| 4217180 |
Method of determining susceptibility of alloys to stress corrosion cracking |
Aug. 12, 1980 |
| 4190501 |
Process for measuring internal metal stress |
Feb. 26, 1980 |
| 4180439 |
Anodic etching method for the detection of electrically active defects in silicon |
Dec. 25, 1979 |
| 4160702 |
Electrochemical measurement of fatigue damage |
Jul. 10, 1979 |
| 4125440 |
Method for non-destructive testing of semiconductor articles |
Nov. 14, 1978 |
| 4063644 |
Process for nondestructive inspection |
Dec. 20, 1977 |
| 4006063 |
Method for measuring surface characteristics of metals and metalloids |
Feb. 1, 1977 |
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