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Class Information
Number: 205/790.5
Name: Electrolysis: processes, compositions used therein, and methods of preparing the compositions > Electrolytic analysis or testing (process and electrolyte composition) > For properties of solid material (e.g., surface area, etc.)
Description: Subject matter in which a physical, chemical, or electrical property of a solid material (including manufactured articles or subassemblies) is determined (e.g., surface area, etc.).
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7556725 |
Sealing ring assembly and mounting method |
Jul. 7, 2009 |
| 7156965 |
Scanning electrochemical potential microscope |
Jan. 2, 2007 |
| 7125482 |
Use of electrochemistry to detect buried service lead (Pb) and copper (Cu) water pipes |
Oct. 24, 2006 |
| 6884333 |
Electrochemical system for analyzing performance and properties of electrolytic solutions |
Apr. 26, 2005 |
| 6843904 |
Inspection and repair of active type substrate |
Jan. 18, 2005 |
| 6613218 |
Methods for estimating adsorption isotherms in electrochemical systems |
Sep. 2, 2003 |
| 6245204 |
Vibrating tip conducting probe microscope |
Jun. 12, 2001 |
| 6214210 |
Electrochemical surface analysis using deoxygenated gel electrolyte |
Apr. 10, 2001 |
| 6123817 |
Probe of scanning electrochemical microscope |
Sep. 26, 2000 |
| 6080293 |
Electrolytic test machine |
Jun. 27, 2000 |
| 5882719 |
Solid tantalum capacitor test |
Mar. 16, 1999 |
| 5858204 |
Electrochemical sensor and process for assessing hydrogen permeation |
Jan. 12, 1999 |
| 5851376 |
Catalyst degradation determination apparatus and method |
Dec. 22, 1998 |
| 5849174 |
Electrodes and their use in analysis |
Dec. 15, 1998 |
| 5846398 |
CMP slurry measurement and control technique |
Dec. 8, 1998 |
| 5820746 |
Metal surface state evaluation method and semiconductor device production method |
Oct. 13, 1998 |
| 5496451 |
Method for detecting chemical substances |
Mar. 5, 1996 |
| 5382336 |
Tip position modulation and lock-in detection in scanning electrochemical microscopy |
Jan. 17, 1995 |
| 5281814 |
System for imaging and detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance by reflection of an AC electrical signal |
Jan. 25, 1994 |
| 5202018 |
Process for electrochemical dissolution of semiconductors |
Apr. 13, 1993 |
| 5202004 |
Scanning electrochemical microscopy |
Apr. 13, 1993 |
| 4886552 |
Method for monitoring the removal of a metallic contaminant from the surface of a metallic article |
Dec. 12, 1989 |
| 4840708 |
Process for the precise determination of the surface area of an electrically conducting shaped body |
Jun. 20, 1989 |
| 4820643 |
Process for determining the activity of a palladium-tin catalyst |
Apr. 11, 1989 |
| 4715218 |
Method of determining degree of embrittlement of low alloy steel |
Dec. 29, 1987 |
| 4551209 |
Method of calibrating conductive metal oxide electrodes |
Nov. 5, 1985 |
| 4545863 |
Automated membrane test cell apparatus and method for so using |
Oct. 8, 1985 |
| 4487661 |
Method and device for determining the physical characteristics of a semiconductor material |
Dec. 11, 1984 |
| 4483748 |
Automated membrane test cell apparatus and method for so using |
Nov. 20, 1984 |
| 4379029 |
Method of measuring metallic cation and water transport numbers for cation exchange hydraulically impermeable membranes and test cell therefor |
Apr. 5, 1983 |
| 4278508 |
Method of detecting a cathodic corrosion site on a metallized substrate |
Jul. 14, 1981 |
| 4168212 |
Determining semiconductor characteristic |
Sep. 18, 1979 |
| 4133722 |
Process for determining properties of materials |
Jan. 9, 1979 |
| 4129480 |
Method and apparatus for determining the immersed surface area of one of the electrodes of an electro-chemical bath |
Dec. 12, 1978 |
| 4090924 |
Method to determine the suitability of diaphragm for use in an electrolytic cell |
May. 23, 1978 |
| 4028207 |
Measuring arrangements |
Jun. 7, 1977 |
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