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Class Information
Number: 204/298.31
Name: Chemistry: electrical and wave energy > Apparatus > Coating, forming or etching by sputtering > Etching
Description: Apparatus including means for the removal of material from a workpiece (i.e., substrate) by subjecting it to bombardment by atomic particles (e.g., ions), whereby the activation energy of material removal is supplied at least in part by momentum transfer.


Sub-classes under this class:

Class Number Class Name Patents
204/298.34 Auxiliary electrode, bias means or specified power supply 230
204/298.36 Beam or directed flux etching (e.g., ion beam, etc.) 134
204/298.37 Magnetically enhanced 241
204/298.32 Measuring, analyzing or testing 186
204/298.38 Microwave excitation 209
204/298.35 Multi-chamber, load/unload means or moving workpiece 206
204/298.39 Plural parallel plates (e.g., desmearing reactor, etc.) 35
204/298.33 Specified gas feed or withdrawal 209


Patents under this class:
1 2 3 4 5 6

Patent Number Title Of Patent Date Issued
7345429 Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities Mar. 18, 2008
7320331 In-situ plasma cleaning device for cylindrical surfaces Jan. 22, 2008
7316764 System and method for performing sputter etching using independent ion and electron sources and a substrate biased with an a-symmetric bi-polar DC pulse signal Jan. 8, 2008
7294283 Penning discharge plasma source Nov. 13, 2007
7276140 Plasma accelerating apparatus for semiconductor substrate processing and plasma processing system having the same Oct. 2, 2007
7270729 System for, and method of, etching a surface on a wafer Sep. 18, 2007
7241397 Honeycomb optical window deposition shield and method for a plasma processing system Jul. 10, 2007
7012263 Ion source apparatus and electronic energy optimized method therefor Mar. 14, 2006
6991701 Plasma treatment method and apparatus Jan. 31, 2006
6955741 Semiconductor-processing reaction chamber Oct. 18, 2005
6942764 Arc-sprayed shield for pre-sputter etching chamber Sep. 13, 2005
6936546 Apparatus for shaping thin films in the near-edge regions of in-process semiconductor substrates Aug. 30, 2005
6924455 Integrated plasma chamber and inductively-coupled toroidal plasma source Aug. 2, 2005
6896775 High-power pulsed magnetically enhanced plasma processing May. 24, 2005
6887317 Reduced friction lift pin May. 3, 2005
6786998 Wafer temperature control apparatus and method Sep. 7, 2004
6736931 Inductively coupled RF plasma reactor and plasma chamber enclosure structure therefor May. 18, 2004
6679981 Inductive plasma loop enhancing magnetron sputtering Jan. 20, 2004
6664497 Toroidal low-field reactive gas source Dec. 16, 2003
6576860 Plasma processing method and apparatus for eliminating damages in a plasma process of a substrate Jun. 10, 2003
6554205 Gas polishing method, gas polishing nozzle and polishing apparatus Apr. 29, 2003
6533910 Carbonitride coated component of semiconductor processing equipment and method of manufacturing thereof Mar. 18, 2003
6531069 Reactive Ion Etching chamber design for flip chip interconnections Mar. 11, 2003
6514376 Thermal control apparatus for inductively coupled RF plasma reactor having an overhead solenoidal antenna Feb. 4, 2003
6506312 Vapor deposition chamber components and methods of making the same Jan. 14, 2003
6500314 Plasma etch reactor and method Dec. 31, 2002
6491784 Dry etching device Dec. 10, 2002
6464843 Contamination controlling method and apparatus for a plasma processing chamber Oct. 15, 2002
6454898 Inductively coupled RF Plasma reactor having an overhead solenoidal antenna and modular confinement magnet liners Sep. 24, 2002
6444085 Inductively coupled RF plasma reactor having an antenna adjacent a window electrode Sep. 3, 2002
6439244 Pedestal design for a sputter clean chamber to improve aluminum gap filling ability Aug. 27, 2002
6436253 Sputter etching chamber with improved uniformity Aug. 20, 2002
6432260 Inductively coupled ring-plasma source apparatus for processing gases and materials and method thereof Aug. 13, 2002
6409896 Method and apparatus for semiconductor wafer process monitoring Jun. 25, 2002
6395157 Method and apparatus for sputter etch conditioning a ceramic body May. 28, 2002
6375860 Controlled potential plasma source Apr. 23, 2002
6337003 Vacuum apparatus and driving mechanism therefor Jan. 8, 2002
6312569 Chemical vapor deposition apparatus and cleaning method thereof Nov. 6, 2001
6307174 Method for high-density plasma etching Oct. 23, 2001
6254719 Method for controlled removal of material from a solid surface Jul. 3, 2001
6254737 Active shield for generating a plasma for sputtering Jul. 3, 2001
6251232 Method of removing accumulated films from the surface of substrate holders in film deposition apparatus, and film deposition apparatus Jun. 26, 2001
6248219 Process and apparatus for sputter etching or sputter coating Jun. 19, 2001
6248251 Apparatus and method for electrostatically shielding an inductively coupled RF plasma source and facilitating ignition of a plasma Jun. 19, 2001
6231727 Process for stripping the surface of a substrate and apparatus for implementing this process May. 15, 2001
6221221 Apparatus for providing RF return current path control in a semiconductor wafer processing system Apr. 24, 2001
6221200 Instrument for production of semiconductor device and process for production thereof Apr. 24, 2001
6207006 Vacuum processing apparatus Mar. 27, 2001
6194680 Microwave plasma processing method Feb. 27, 2001
6190518 Device for reducing plasma etch damage and method for manufacturing same Feb. 20, 2001

1 2 3 4 5 6


 
 
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