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Class Information
Number: 179/1.3D
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Patents under this class:

Patent Number Title Of Patent Date Issued

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Method and system for testing indirect bandgap semiconductor devices using luminescence imaging
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Multi user MIMO detection utilizing averaged spatial whitening
Image signal processing apparatus and image signal processing method
Information processing apparatus, non-transitory computer-readable recording medium, and information processing method
Parallel processing computer systems with reduced power consumption and methods for providing the same
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