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Class Information
Number: 148/DIG.116
Name: Metal treatment > Oxidation, differential
Description:


Patents under this class:

Patent Number Title Of Patent Date Issued
6335262 Method for fabricating different gate oxide thicknesses within the same chip Jan. 1, 2002
6239041 Method for fabricating semiconductor integrated circuit device May. 29, 2001
6168967 Reduction of surface leakage current by surface passivation of CdZn Te and other materials using hyperthermal oxygen atoms Jan. 2, 2001
6096613 Method for poly-buffered locos without pitting formation Aug. 1, 2000
5920779 Differential gate oxide thickness by nitrogen implantation for mixed mode and embedded VLSI circuits Jul. 6, 1999
5863819 Method of fabricating a DRAM access transistor with dual gate oxide technique Jan. 26, 1999
5696023 Method for making aluminum gallium arsenide semiconductor device with native oxide layer Dec. 9, 1997
5683925 Manufacturing method for ROM array with minimal band-to-band tunneling Nov. 4, 1997
5672521 Method of forming multiple gate oxide thicknesses on a wafer substrate Sep. 30, 1997
5616515 Silicon oxide germanium resonant tunneling Apr. 1, 1997
5576226 Method of fabricating memory device using a halogen implant Nov. 19, 1996
5554545 Method of forming neuron mosfet with different interpolysilicon oxide thickness Sep. 10, 1996
5532177 Method for forming electron emitters Jul. 2, 1996
5480828 Differential gate oxide process by depressing or enhancing oxidation rate for mixed 3/5 V CMOS process Jan. 2, 1996
5460985 Production method of a verticle type MOSFET Oct. 24, 1995
5385856 Manufacture of the fieldless split-gate EPROM/Flash EPROM Jan. 31, 1995
5369052 Method of forming dual field oxide isolation Nov. 29, 1994
5358894 Oxidation enhancement in narrow masked field regions of a semiconductor wafer Oct. 25, 1994
5308781 Semiconductor memory device May. 3, 1994
5258322 Method of producing semiconductor substrate Nov. 2, 1993
5225365 Method of making a substantially planar semiconductor surface Jul. 6, 1993
5223450 Method of producing semiconductor substrate having dielectric separation region Jun. 29, 1993
5106768 Method for the manufacture of CMOS FET by P+ maskless technique Apr. 21, 1992
5079191 Process for producing a semiconductor device Jan. 7, 1992
5057451 Method of forming an antifuse element with substantially reduced capacitance using the LOCOS technique Oct. 15, 1991
5001082 Self-aligned salicide process for forming semiconductor devices and devices formed thereby Mar. 19, 1991
4888300 Submerged wall isolation of silicon islands Dec. 19, 1989
4830975 Method of manufacture a primos device May. 16, 1989
4824795 Method for obtaining regions of dielectrically isolated single crystal silicon Apr. 25, 1989
4745086 Removable sidewall spacer for lightly doped drain formation using one mask level and differential oxidation May. 17, 1988
4703554 Technique for fabricating a sidewall base contact with extrinsic base-on-insulator Nov. 3, 1987
4234362 Method for forming an insulator between layers of conductive material Nov. 18, 1980
4209349 Method for forming a narrow dimensioned mask opening on a silicon body utilizing reactive ion etching Jun. 24, 1980
4192059 Process for and structure of high density VLSI circuits, having inherently self-aligned gates and contacts for FET devices and conducting lines Mar. 11, 1980
4190466 Method for making a bipolar transistor structure utilizing self-passivating diffusion sources Feb. 26, 1980
4139402 Method of manufacturing a semiconductor device utilizing doped oxides and controlled oxidation Feb. 13, 1979
3975818 Method of forming closely spaced electrodes onto semiconductor device Aug. 24, 1976
3962779 Method for fabricating oxide isolated integrated circuits Jun. 15, 1976



 
 
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