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Class Information
Number: 118/713
Name: Coating apparatus > With indicating, testing, inspecting, or measuring means > With means for visual observation
Description: Apparatus wherein a means is provided to facilitate the visual examination of (a) the coating apparatus, (b) the work, or (c) the material applied by an operator.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7404861 |
Imaging and inspection system for a dispenser and method for same |
Jul. 29, 2008 |
| 7387682 |
Liquid drop discharge device, printer, printing method, and electro-optical device |
Jun. 17, 2008 |
| 7350476 |
Method and apparatus to determine consumable part condition |
Apr. 1, 2008 |
| 7338560 |
Apparatus for forming alignment layer and auto-calibration method thereof |
Mar. 4, 2008 |
| 7330346 |
Etching apparatus, method for measuring self-bias voltage, and method for monitoring etching apparatus |
Feb. 12, 2008 |
| 7294206 |
Apparatus and method for simultaneously coating and measuring parts |
Nov. 13, 2007 |
| 7255748 |
Apparatus for integrated monitoring of wafers and for process control in semiconductor manufacturing and a method for use thereof |
Aug. 14, 2007 |
| 7256833 |
Method and apparatus for automatically optimizing optical contrast in automated equipment |
Aug. 14, 2007 |
| 7241397 |
Honeycomb optical window deposition shield and method for a plasma processing system |
Jul. 10, 2007 |
| 7238234 |
Device and method for fabricating display panel having ink-jet printing applied thereto |
Jul. 3, 2007 |
| 7235136 |
Device for reading the rotational speed of a paint sprayer provided with a rotating bowl |
Jun. 26, 2007 |
| 7226510 |
Film forming apparatus |
Jun. 5, 2007 |
| 7201802 |
Apparatus for providing a substrate with viscous medium |
Apr. 10, 2007 |
| 7192505 |
Wafer probe for measuring plasma and surface characteristics in plasma processing environments |
Mar. 20, 2007 |
| 7169254 |
Plasma processing system and apparatus and a sample processing method |
Jan. 30, 2007 |
| 7143464 |
Device for sucking off specified surface areas on powder-coated vehicle wheels |
Dec. 5, 2006 |
| 7139620 |
Prediction method and apparatus of a processing result |
Nov. 21, 2006 |
| 7112246 |
Device for applying adhesive to a workpiece |
Sep. 26, 2006 |
| 7108752 |
Liquid processing apparatus and liquid processing method |
Sep. 19, 2006 |
| 7105058 |
Apparatus for forming a microfiber coating |
Sep. 12, 2006 |
| 7105059 |
Reaction apparatus for atomic layer deposition |
Sep. 12, 2006 |
| 7087119 |
Atomic layer deposition with point of use generated reactive gas species |
Aug. 8, 2006 |
| 7063744 |
Coating device |
Jun. 20, 2006 |
| 7063747 |
Coating control system for use on a spherical object |
Jun. 20, 2006 |
| 7059705 |
Workpiece processing and liquid droplet ejection inspection apparatus |
Jun. 13, 2006 |
| 7037556 |
Process and apparatus for preparation of a no-jam vending machine plastic card |
May. 2, 2006 |
| 7018476 |
Device for applying a coating agent |
Mar. 28, 2006 |
| 6997990 |
Device and method for fabricating display panel having ink-jet printing applied thereto |
Feb. 14, 2006 |
| 6977013 |
Powder coating system central controller |
Dec. 20, 2005 |
| 6966950 |
Method and apparatus for treating underground pipeline |
Nov. 22, 2005 |
| 6939586 |
Method and installation for hot process and continuous dip coating of a metal strip |
Sep. 6, 2005 |
| 6936107 |
Coating film forming apparatus and coating unit |
Aug. 30, 2005 |
| 6923885 |
Plasma processing system and apparatus and a sample processing method |
Aug. 2, 2005 |
| 6863772 |
Dual-port end point window for plasma etcher |
Mar. 8, 2005 |
| 6837936 |
Semiconductor manufacturing device |
Jan. 4, 2005 |
| 6835276 |
Window for allowing end point of etching process to be detected and etching device comprising the same |
Dec. 28, 2004 |
| 6835275 |
Reducing deposition of process residues on a surface in a chamber |
Dec. 28, 2004 |
| 6832577 |
Apparatus and method for simultaneously coating and measuring parts |
Dec. 21, 2004 |
| 6818064 |
Photoresist dispense arrangement by compensation for substrate reflectivity |
Nov. 16, 2004 |
| 6818065 |
Systems, devices and methods for applying solution to filaments |
Nov. 16, 2004 |
| 6806949 |
Monitoring material buildup on system components by optical emission |
Oct. 19, 2004 |
| 6802905 |
Manufacturing apparatus for plasma display panel |
Oct. 12, 2004 |
| 6796269 |
Apparatus and method for monitoring plasma processing apparatus |
Sep. 28, 2004 |
| 6776845 |
Coating film forming method and system |
Aug. 17, 2004 |
| 6750977 |
Apparatus for monitoring thickness of deposited layer in reactor and dry processing method |
Jun. 15, 2004 |
| 6736901 |
Vertical chemical vapor deposition system |
May. 18, 2004 |
| 6726774 |
Bubble detection system for detecting bubbles in photoresist tube |
Apr. 27, 2004 |
| 6715413 |
Apparatus and method of screen printing |
Apr. 6, 2004 |
| 6712927 |
Chamber having process monitoring window |
Mar. 30, 2004 |
| 6692572 |
Active compensation metering system |
Feb. 17, 2004 |
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