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Class Information
Number: 117/201
Name: Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor > Apparatus > With means for measuring, testing, or sensing
Description: Subject matter which includes means for measuring, testing, or sensing a process condition or parameter during the process.


Sub-classes under this class:

Class Number Class Name Patents
117/203 With a window or port for visual observation or examination 30
117/202 With responsive control means 251


Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
7625446 High temperature high pressure capsule for processing materials in supercritical fluids Dec. 1, 2009
7597758 Chemical precursor ampoule for vapor deposition processes Oct. 6, 2009
7582162 Semiconductor device and semiconductor device production system Sep. 1, 2009
RE40871 Method of producing plasma display panel with protective layer of an alkaline earth oxide Aug. 18, 2009
7572335 Crystallization apparatus and crystallization method Aug. 11, 2009
7540921 Crystallization apparatus, crystallization method, phase modulation element, device and display apparatus Jun. 2, 2009
7537657 Silicon wafer and process for producing it May. 26, 2009
7524374 Method and apparatus for generating a precursor for a semiconductor processing system Apr. 28, 2009
7513949 Method and apparatus for producing semiconductor device Apr. 7, 2009
7501024 Carbon nanohorn producing device and carbon nanohorn producing method Mar. 10, 2009
7470326 Apparatus for manufacturing silicon single crystal, method for manufacturing silicon single crystal, and silicon single crystal Dec. 30, 2008
7462237 Systems and methods for generating images of crystals Dec. 9, 2008
7445674 Crystallization apparatus, crystallization method, device, optical modulation element, and display apparatus Nov. 4, 2008
7431768 System for performing crystallization trials Oct. 7, 2008
7422634 Three inch silicon carbide wafer with low warp, bow, and TTV Sep. 9, 2008
7413605 Method for manufacturing silicon single crystal Aug. 19, 2008
7402207 Method and apparatus for controlling the thickness of a selective epitaxial growth layer Jul. 22, 2008
7402208 Method and equipment for producing biopolymer crystal Jul. 22, 2008
7368011 Apparatus for manufacturing silicon single crystal, method for manufacturing silicon single crystal, and silicon single crystal May. 6, 2008
7361221 Light irradiation apparatus, crystallization apparatus, crystallization method, semiconductor device and light modulation element Apr. 22, 2008
7347897 Crystallization apparatus, crystallization method, and phase modulation device Mar. 25, 2008
7344596 System and method for crystal growing Mar. 18, 2008
7335261 Apparatus for forming a semiconductor thin film Feb. 26, 2008
7332032 Precursor mixtures for use in preparing layers on substrates Feb. 19, 2008
7326292 Quality evaluation method for single crystal ingot Feb. 5, 2008
7318866 Systems and methods for inducing crystallization of thin films using multiple optical paths Jan. 15, 2008
7314519 Vapor-phase epitaxial apparatus and vapor phase epitaxial method Jan. 1, 2008
7314523 Manufacturing equipment of SiC single crystal and method for manufacturing SiC single crystal Jan. 1, 2008
7311773 Biopolymer crystal mounting device and manufacturing method thereof Dec. 25, 2007
7300520 Crystallization reagent matrices and related methods and kits Nov. 27, 2007
7294197 Formation of a silicon sheet by cold surface casting Nov. 13, 2007
7285168 Method and apparatus for the measurement, orientation and fixation of at least one single crystal Oct. 23, 2007
7270709 Method and apparatus of generating PDMAT precursor Sep. 18, 2007
7235128 Process for producing single-crystal semiconductor and apparatus for producing single-crystal semiconductor Jun. 26, 2007
7217319 Crystallization apparatus and crystallization method May. 15, 2007
7214270 Crystallization apparatus, crystallization method, device and phase modulation element May. 8, 2007
7211145 Substrate processing apparatus and substrate processing method May. 1, 2007
7195670 High throughput screening of crystallization of materials Mar. 27, 2007
7125452 Process for calibrating the temperature control unit of an oven and oven for carrying out this process Oct. 24, 2006
7105048 Laser irradiation apparatus Sep. 12, 2006
7101433 High pressure/high temperature apparatus with improved temperature control for crystal growth Sep. 5, 2006
7101436 Crystallization apparatus, optical member for use in crystallization apparatus, crystallization method, manufacturing method of thin film transistor, and manufacturing method of matrix circuit Sep. 5, 2006
7097709 Laser annealing apparatus Aug. 29, 2006
7063743 Apparatus and method for pulling single crystal Jun. 20, 2006
7052545 High throughput screening of crystallization of materials May. 30, 2006
7033070 Method and apparatus for measuring temperature Apr. 25, 2006
7022184 Atomic layer CVD Apr. 4, 2006
7014706 Crystal forming apparatus and method for using same Mar. 21, 2006
7014705 Microfluidic device with diffusion between adjacent lumens Mar. 21, 2006
7011709 Crystallization apparatus, optical member for use in crystallization apparatus, crystallization method, thin film transistor, and display Mar. 14, 2006

1 2 3 4


 
 
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