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VG Instruments Group, Limited Patents
Assignee:
VG Instruments Group, Limited
Address:
Crawley, GB
No. of patents:
35
Patents:












Patent Number Title Of Patent Date Issued
RE33275 Electron Spectrometer July 24, 1990
There is provided an electron spectrometer operable to produce an image of an electron emitting surface, said spectrometer comprising in sequence:(a) means for causing electrons to be emitted from said surface;(b) a first electrostatic lens system arranged to project at least some of said el
5184016 Glow discharge spectrometry February 2, 1993
The invention provides glow discharge optical or mass spectrometers wherein a solid sample may be mounted in a unitary source assembly adjacent to a first electrode means. A second electrode means, spaced from sample by an insulating washer, is also part of the source assembly and engage
5159194 Method and apparatus for mass spectrometry October 27, 1992
A method of mass spectrometry and a mass spectrometer for the analysis of a sample, the mass spectrometer comprising means for producing ions from the sample and a magnetic sector for analyzing the ions, wherein the magnetic field of the magnetic sector is generated by passage of a magne
5146088 Method and apparatus for surface analysis September 8, 1992
Method and apparatus for analyzing organic material present in a surface region (5) of a sample (1), the apparatus comprising: an evacuable sample receiving chamber (2); means (3) for generating an energetic beam (4) of particles or photons and for directing the beam onto the sample wher
5134287 Double-focussing mass spectrometer July 28, 1992
The invention relates to a variable dispersion double-focusing mass spectrometer comprising at least a magnetic sector analyzer (4) preceding an electrostatic analyzer (6), which analyzers cooperate to form a direction and velocity focused image on a multichannel detector (34) locata
5091645 Selectable-resolution charged-particle beam analyzers February 25, 1992
A method of selecting the resolution of a charged-particle energy or momentum analyzer wherein an analyzing field disperses the particles in an analyzing plane. An electrostatic field generator is adjusted to cause the dispersed particles leaving the field to pass through either of two
5068534 High resolution plasma mass spectrometer November 26, 1991
There is disclosed a double-focusing mass spectrometer in which ions are generated from a sample in a microwave-induced or inductively-coupled plasma (3). Ions are sampled from the plasma (3) through an aperture in a sampling cone (19) and pass through a skimmer cone (28) and several
5051584 Plasma mass spectrometer September 24, 1991
The invention comprises a mass spectrometer wherein a sample is ionized in a plasma (14), especially an inductively-coupled or microwave-induced plasma. Ions are sampled from the plasma (14) through an orifice (16) in a sampling member (15), a second orifice (37) in a hollow tapered memb
5036195 Gas analyzer July 30, 1991
A mass spectrometer for the analysis of substances in a gas comprises means for generating a plasma in an enclosure through which a gas flows, conduit means for conveying the gas from the enclosure to a sampling member, and a mass analyzer for mass analyzing ions characteristic of the su
5034605 Secondary ion mass spectrometer with independently variable extraction field July 23, 1991
A method and apparatus for the micro-analysis of a sample surface wherein a mass analyzer is used to analyze secondary ions emitted from the surface in response to the impact of primary radiation. The method comprises: extracting the secondary ions in an electric extraction field maintai
5026454 Vacuum evaporation and deposition June 25, 1991
Method and apparatus for the deposition of material onto a substrate, the method comprising evaporating material from a source, controlling the dosage of material at the substrate by moving a shutter between an open position and a closed position, with a closing step comprising beginning
4945774 Sample treatment apparatus August 7, 1990
An apparatus for the treatment of a sample in a vacuum enclosure having a wall on which a vacuum-tight feedthrough is mounted; the sample being supported on an elongate hollow rotor rotatable about an axis and disposed within the vacuum enclosure, the sample having a front face which is
4943718 Mass spectrometer July 24, 1990
The invention provides a mass spectrometer comprising an ion source provided with an electron emitting source and magnets which are cooperable to produce a collimated electron beam within the ion source; a mass analyzer; first and second electrodes which cooperate to limit the angular
4942296 Super-critical fluid mass spectrometer July 17, 1990
The invention provides a mass spectrometer for the analysis of a sample dissolved in a super-critical fluid. The fluid is expanded directly into an ionization chamber without a liquid-gas transition and the sample is ionized by means of a glow discharge established in the chamber. Pr
4916313 Method and apparatus for the determination of isotopic composition April 10, 1990
The invention provides a method and apparatus for the mass spectrometric determination of the isotopic composition of an element comprised in a sample by gas chromatography-isotopic ratio mass spectrometry. As a sample elutes from the column of the gas chromatograph it enters a sample
4912327 Pulsed microfocused ion beams March 27, 1990
An ion gun for producing a pulsed microfocused beam of ions comprises an ion source arranged to produce a continuous ion beam along a z-axis toward a collector having an aperture on the axis. A deflector is arranged to maintain the beam substantially stationary and incident on the apertu
4912324 Glow discharge spectrometer March 27, 1990
The invention provides a mass spectrometer in an optical emission spectrometer having a glow discharge source which is suitable for the analysis of solid non-conducting samples. The source comprises a chamber into which an inert gas is introduced and maintained at a pressure substant
4891515 Solution analyzing mass spectrometer January 2, 1990
A mass spectrometer (1) suitable for the analysis of the eluent of a liquid or supercritical fluid chromatograph is disclosed. In order to maximize the flow rate of fluid which can be accepted into its ionization chamber (13), aperture closing means (13) are provided between an electron
4889319 Bakeable vacuum systems December 26, 1989
An apparatus and method providing a bakeable sealing means for a vacuum system, and thereby an improved bakeable ultra-high vacuum system; the apparatus comprising: a first sealing element composed substantially of an elastomeric material; a second sealing element comprising PTFE; and me
4883957 Mass spectrometer including cooling for the ion collection amplifiers November 28, 1989
The invention comprises a mass spectrometer adapted for the determination of isotopic ratios which has several ion-collecting means disposed along its mass focal plane. Separate current amplifier means are provided for each ion collecting means and comprise an electrometer amplifying ele
4866270 Method and apparatus for the determination of isotopic composition September 12, 1989
The invention comprises methods and apparatus for the mass spectrometric determination of the isotopic composition of an element comprised in an analysis gas (that is, a gas comprising the element in elemental form or in the form of a simple compound, e.g., nitrogen or carbon dioxide). F
4853539 Glow discharge mass spectrometer August 1, 1989
There is provided a mass spectrometer adapted for the elemental analysis of a sample, especially a solid sample, comprising a glow discharge ion source which yields ions characteristic of the elements in the sample. The background spectrum produced by such a mass spectrometer is substant
4840074 Multi-stream fluid sampling valve June 20, 1989
The invention provides a sample valve adapted to produce a sample of any one of a plurality of fluid streams for an analytical instrument (especially a mass spectrometer). It comprises a stationary plate member in which are formed a plurality of inlet ports. A sampling head is mounted
4829178 Apparatus for surface analysis May 9, 1989
An apparatus adapted for the analysis of a surface of a sample and comprising: means for stimulating a region of said surface to emit charged particles; means for moving a light reflecting means in a substantially rectilinear fashion along an optical axis of a microscope to a position
4810882 Mass spectrometer for positive and negative ions March 7, 1989
The invention provides a mass spectrometer capable of detecting both positive and negative ions. Positive ions emerging from the mass analyzer strike a conversion electrode to release secondary electrons which pass through an annular electrode to strike a phosphor, releasing photons.
4794252 Discharge ionization mass spectrometer December 27, 1988
The invention provides a mass spectrometer for the analysis of a sample dissolved in a fluid, and in particular a spectrometer for the analysis of high molecular weight compounds in the eluent of a liquid chromatograph. The fluid to be analyzed is at least partly vaporized and sprayed in
4778993 Time-of-flight mass spectrometry October 18, 1988
A method of time-of-flight mass spectrometry adapted for the analysis of ions up to a required mass limit comprises the following sequences of events:(a) producing, during a first time interval, a pulse of charged particles,(b) directing said charged particles towards the entrance of a mass
4769542 Charged particle energy analyzer September 6, 1988
The invention provides a charged-particle energy analyzer of the cylindrical mirror type (2,9,10) which incorporates beam shaping means (5,6) at one, or preferably both, ends. The beam shaping means to convert a substantially parallel beam of charged particles to an annular beam whic
4760253 Mass spectrometer July 26, 1988
The invention provides a mass spectrometer adapted for the elemental analysis of a sample in which ions are formed from the sample in an inductively coupled plasma (ICP). The flame of the plasma (14) is directed against the front surface (30) of a cone (19), and ions are sampled from
4758723 Electron spectrometer July 19, 1988
There is provided an electron spectrometer operable to produce an image of an electron emitting surface, said spectrometer comprising in sequence:(a) means for causing electrons to be emitted from said surface;(b) a first electrostatic lens system arranged to project at least some of said el
4727249 Magnetic sector mass spectrometer February 23, 1988
The invention relates to a mass spectrometer having a magnetic sector analyzer in which the magnetic field is developed neither by a permanent magnet nor by an electromagnet having the conventional ferromagnetic core. In particular, the spectrometer has a magnetic sector analyzer through
4723076 Double focusing mass spectrometers February 2, 1988
There is provided a mass spectrometer having at least three analyser sectors of the electrostatic or magnetic types, at least one sector being of the electrostatic type and at least one further sector being of the magnetic type. The spectrometer includes a focusing sector array having at
4647772 Mass spectrometers March 3, 1987
A mass spectrometer having a thermospray ion source, suitable for the analysis of liquid samples is disclosed. The source comprises a strongly heated atomizing nozzle (4) through which the sample is pumped into a spray chamber (5, 11), and an aperture in a cone (26), through which the
4593196 Charged particle energy spectrometer June 3, 1986
A charged particle energy spectrometer, typically an electron spectrometer, comprising an electrostatic dispersive charged particle analyzer, e.g. a substantially hemispherical sector analyzer (1,6), and a detector means comprising a plurality of charged particle detectors (26-28) is des
4487461 Rack mounting system December 11, 1984
A rack mounting system for securing electrical apparatus to a pair of telescopic slides or the like, comprising a pair of rigid elongated support plates forming part of or attached to the sliding members of the telescopic slides, said support plates being provided with a plurality of

 
 
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