| Patent Number |
Title Of Patent |
Date Issued |
| 7391508 |
Arc/spark optical emission spectroscopy correlated with spark location |
June 24, 2008 |
| Two or more high-frequency microphones are used to determine where an individual spark or other excitation beam strikes a sample in an optical emission spectroscopy (OES) instrument. The position of the spark can be correlated with the elemental composition of the material in the sample |
| 7375359 |
Portable X-ray fluorescence instrument with tapered absorption collar |
May 20, 2008 |
| An instrument and method for measuring the elemental composition of a test material. The instrument has a source of penetrating radiation for irradiating an irradiated region of the test material, a detector for detecting fluorescence emission by the test material and for generating a |
| 7375358 |
Radiation shield for portable x-ray fluorescence instruments |
May 20, 2008 |
| A radiation shield and method for reducing ambient radiation levels at a distance from a surface irradiated by penetrating radiation emanating from an instrument substantially along a propagation axis. The shield attaches to an end of the instrument proximate to an irradiated surface |
| 7302034 |
Analysis of elemental composition and thickness in multilayered materials |
November 27, 2007 |
| A method and computer program software product for establishing an areal density of an elemental constituent of one layer of a stack of layers of material overlying a substrate. Incident penetrating radiation excites characteristic x-ray fluorescent radiation in multiple lines associated |
| 7266178 |
Calibration source for X-ray detectors |
September 4, 2007 |
| A method and device for calibrating the energy response of detectors of photons in the range from about 0.5 keV to at least 100 keV. The device makes use of the inherent property of a polarizable crystal such as a pyroelectric crystal to produce monoenergetic x-rays when the crystal is |
