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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Teradyne, Inc. Patents
Assignee:
Teradyne, Inc.
Address:
Boston, MA
No. of patents:
528
Patents:


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Patent Number Title Of Patent Date Issued
RE36063 Timing generator with edge generators, utilizing programmable delays, providing synchronized tim January 26, 1999
A system for providing a plurality of synchronous timing signals having period values that are not even multiples of the clock period including a plurality of local edge generators receiving the clock signals, each local generator including local programmable means to count clock signals
RE29513 Electrical connection apparatus January 10, 1978
Electrical socket apparatus for integrated circuit packages and like devices has a contact for receiving the male connection element of the circuit device through an aperture in a folded spring section and for seating the male element at the mouth of the folded section. The shank of
D291559 Remote isolation device module August 25, 1987
8289039 Pin electronics liquid cooled multi-module for high performance, low cost automated test equipme October 16, 2012
In one embodiment, a channel board-to-DIB junction multi-module is provided which includes performance critical channel electronics modules within an enclosure encasing the plurality of performance critical channel electronics modules. A coolant distribution apparatus is provided wit
8279603 Test slot cooling system for a storage device testing system October 2, 2012
A test slot cooling system for a storage device testing system includes a storage device transporter having first and second portions. The first portion of the storage device transporter includes an air director and the second portion of the storage device transporter is configured to
8269520 Using pattern generators to control flow of data to and from a semiconductor device under test September 18, 2012
A semiconductor device tester includes programmable hardware configured to test a semiconductor device under test. The programmable hardware is programmed with two or more pattern generators to control a flow of data to and from the semiconductor device under test.
8238099 Enclosed operating area for disk drive testing systems August 7, 2012
A disk drive testing system includes one or more test racks, and one or more test slots housed by the one or more test racks, each test slot being configured to receive and support a disk drive transporter carrying a disk drive for testing. The disk drive testing system also includes a
8195419 General purpose protocol engine June 5, 2012
In one embodiment, a protocol aware circuit for automatic test equipment, which includes a protocol generation circuit constructed to retrieve protocol unique data and format the protocol unique data with a selected protocol definition corresponding to a device under test for testing the
8160739 Transferring storage devices within storage device testing systems April 17, 2012
A method of transferring storage devices within a storage device testing system includes actuating an automated transporter to substantially simultaneously retrieve multiple storage devices presented for testing, and actuating the automated transporter to substantially simultaneously
8140182 Bulk feeding disk drives to disk drive testing systems March 20, 2012
A method of supplying disk drives to a disk drive testing system includes placing a disk drive tote, carrying multiple disk drives, in a presentation position accessible to an automated transporter of the disk drive testing system. The method includes actuating the automated transpor
8131387 Integrated high-efficiency microwave sourcing control process March 6, 2012
A technique for controlling instrumentation in an automatic test system includes providing a group of hardware resources that can be configured in a variety of ways to realize different instrument configurations, which generally correspond to different traditional instrument types. An
8128417 Methods and apparatus for connecting printed circuit boards using zero-insertion wiping force co March 6, 2012
A circuit board assembly includes a primary board, and a connector mounted to a mounting location of the primary board. The connector includes compliant conductors, each compliant conductor having a first end and a second end. The connector further includes a connector body supported
8117480 Dependent temperature control within disk drive testing systems February 14, 2012
A method of controlling a temperature of a subject test slot in a cluster of test slots includes evaluating a request for a temperature change for the subject test slot to determine if sufficient power is available to achieve the requested temperature change, and inhibiting the requested
8116079 Storage device testing system cooling February 14, 2012
A storage device transporter includes a transporter body having first and second body portions. The first body portion is configured to be engaged by automated machinery for manipulation of the storage device transporter. The second body portion is configured to receive and support a
8102173 Thermal control system for test slot of test rack for disk drive testing system with thermoelect January 24, 2012
A disk drive test slot thermal control system includes a test slot including a housing having an outer surface, an internal cavity defined by the housing and including a test compartment for receiving and supporting a disk drive transporter carrying a disk drive for testing, and an i
8098181 Attenuator circuit January 17, 2012
An attenuator circuit includes a high-frequency circuit path to produce an attenuated first signal; a low-frequency circuit path to produce an attenuated second signal, where the attenuated first signal has a higher frequency than the attenuated second signal; and a transistor that i
8095234 Transferring disk drives within disk drive testing systems January 10, 2012
A method of transferring disk drives within a disk drive testing system includes actuating an automated transporter to retrieve multiple disk drives presented for testing, and actuating the automated transporter to deliver each retrieved disk drive to a respective test slot of the disk
8094766 Tracker circuit and method for automated test equipment systems January 10, 2012
A digital data signal capture circuit for synchronization of received digital data signals includes a transition detector for determining a state transition of the received digital data signal. The transition detector samples the received digital data signal at a first time, a second
8086343 Processing storage devices December 27, 2011
A storage device processing system that includes at least one automated transporter, at least one rack accessible by the at least one automated transporter, and multiple test slots housed by the at least one rack. Each test slot is configured to receive a storage device for testing. The
8063727 Conductive shielding device November 22, 2011
Devices and methods for reducing stray magnetic fields from an inductor are disclosed. In some aspects, a device includes a substantially U-shaped component configured to attach to a conductive surface of a printed circuit board and configured to substantially surround a lengthwise p
8046396 Residual Fourier-padding interpolation for instrumentation and measurement October 25, 2011
A technique for interpolating a series of samples includes constructing a mathematical model of the series that describes its large signal behavior. The model is subtracted from the original series to yield a residue. A discrete Fourier transform (DFT) is taken of the residue, and th
8041449 Bulk feeding disk drives to disk drive testing systems October 18, 2011
A method of supplying disk drives to a disk drive testing system includes placing a disk drive tote, carrying multiple disk drives, in a presentation position accessible to an automated transporter of the disk drive testing system. The method includes actuating the automated transpor
8031929 X-ray inspection of solder reflow in high-density printed circuit board applications October 4, 2011
According to one embodiment, a method for processing one or more X-ray images includes: receiving at least one image of the one or more X-ray images, the one or more X-ray images being of an assembly extending along a plane; based on the at least one image, autonomously determining a
7996174 Disk drive testing August 9, 2011
A disk drive testing system includes at least one robotic arm defining a first axis substantially normal to a floor surface. The robotic arm is operable to rotate through a predetermined arc about and extend radially from the first axis. Multiple racks are arranged around the robotic arm
7995349 Storage device temperature sensing August 9, 2011
A storage device transporter is provided for transporting a storage device and for mounting a storage device within a test slot. The storage device transporter includes a frame that is configured to receive and support a storage device, and a clamping mechanism associated with the fr
7991046 Calibrating jitter August 2, 2011
Calibrating jitter in a communication channel between test equipment and a connection for a device under test (DUT) includes sampling test data in the communication channel at about a point of the connection to produce sampled data, where the test data travels through the communication
7987063 Fast, low power formatter for automatic test system July 26, 2011
Automated test equipment (ATE) used to test semiconductor components during the manufacturing process. The ATE generates and measures signals at test points of a device under test. The ATE includes a signal formatter with an SR latch having set an reset inputs each connected through
7987018 Transferring disk drives within disk drive testing systems July 26, 2011
A method of transferring disk drives within a disk drive testing system includes actuating an automated transporter to retrieve multiple disk drives presented for testing, and actuating the automated transporter to deliver each retrieved disk drive to a respective test slot of the disk
7977583 Shielded cable interface module and method of fabrication July 12, 2011
A shielded cable interface module having cable receiving grooves extending laterally to an edge of the board, each including a center conductor groove, an insulator groove, and a shield groove. A center conductor via and a shield via extend through the board. A conductor plane on the
7957461 Calibrating automatic test equipment June 7, 2011
Calibrating automatic test equipment (ATE) includes determining an offset between a reference timing event and a channel event, where the channel event is associated with a communication channel of the ATE, and adjusting signal transmission over the communication channel based on the
7946853 Compliant electro-mechanical device May 24, 2011
In one embodiment, a compliant contactor is provided which includes a center conductor and an outer conductor with a spacer therebetween. The outer conductor has a mating end adapted to be capable of flexibly contacting an outer conductor mating surface prior to the center conductor
7945424 Disk drive emulator and method of use thereof May 17, 2011
A disk drive emulator for testing a test slot of a disk drive testing system includes an emulator housing, a testing circuit housed in the emulator housing, and an interface connector disposed on the emulator housing and in electrical communication with the testing circuit. The disk
7940529 Storage device temperature sensing May 10, 2011
A storage device transporter is provided for transporting a storage device and for mounting a storage device within a test slot. The storage device transporter includes a frame that is configured to receive and support a storage device, and a clamping mechanism associated with the fr
7933942 Low cost, high purity sign wave generator April 26, 2011
An automatic test system that includes low cost and accurate circuitry for generating sinusoidal signals. Each sinusoidal signal generator produces a series of digital values approximating a sine wave. These values are computed, avoiding the need for large memories to store tables re
7932734 Individually heating storage devices in a testing system April 26, 2011
A storage device transporter is provided for transporting a storage device and for mounting a storage device within a test slot. The storage device transporter includes a frame that is configured to receive and support a storage device. The storage device transporter also includes a
7929303 Storage device testing system cooling April 19, 2011
A storage device testing system that includes at least one rack, test slots housed by each rack, and at least one air mover in pneumatic communication with the test slots. Each test slot includes a test slot housing having an entrance and an exit, with the entrance configured to rece
7925074 Adaptive background propagation method and device therefor April 12, 2011
In one implementation, a method for reducing reconstruction artifacts in a combined image constructed of a multiple images is provided. The method may include identifying pixels in images that are in a selected range. The identified pixels are replaced the with a substitute pixel value.
7920380 Test slot cooling system for a storage device testing system April 5, 2011
A test slot cooling system for a storage device testing system includes a storage device transporter having first and second portions. The first portion of the storage device transporter includes an air director and the second portion of the storage device transporter is configured to
7911778 Vibration isolation within disk drive testing systems March 22, 2011
A disk drive test slot includes a housing that defines a test compartment for receiving and supporting a disk drive transporter carrying a disk drive for testing. The housing also defines an open end that provides access to the test compartment for insertion and removal of disk drive
7908531 Networked test system March 15, 2011
An automatic test system that can be configured to perform any of a number of test processes. The test system contains multiple functional modules that are interconnected by a network. By using software to configure data flow between functional modules, combinations of modules can be mad
7908029 Processing storage devices March 15, 2011
A storage device processing system that includes at least one automated transporter, at least one rack accessible by the at least one automated transporter, and multiple test slots housed by the at least one rack. Each test slot is configured to receive a storage device for testing. The
7904211 Dependent temperature control within disk drive testing systems March 8, 2011
A method of controlling a temperature of a test slot in a disk drive testing system includes regulating temperature changes of a subject test slot based on one or more operating conditions of one or more other test slots neighboring the subject test slot.
7890822 Tester input/output sharing February 15, 2011
In one implementation, a method of testing multiple DUTs using a single tester channel is provided which includes providing an input signal with the single tester channel simultaneously to each of the DUTs. The method further includes providing a clock signal to each of the DUTs. The clo
7890562 Sine wave generator with dual port look-up table February 15, 2011
An automatic test system that includes low cost and accurate circuitry for generating sinusoidal signals. Each sinusoidal signal generator includes a look-up table that can, for each phase on sine wave, output two digital values representing an in-phase and a quadrature-phase value of th
7890207 Transferring storage devices within storage device testing systems February 15, 2011
A method of transferring storage devices within a storage device testing system includes actuating an automated transporter to substantially simultaneously retrieve multiple storage devices presented for testing, and actuating the automated transporter to substantially simultaneously
7888947 Calibrating automatic test equipment February 15, 2011
A method for use with automatic test equipment (ATE) includes programming the ATE to generate bursts, each of which corresponds to a signal characteristic produced by the ATE, obtaining power levels for the bursts, and determining if the power levels for the bursts correspond to expe
7885361 Method and apparatus for 0/180 degree phase detector February 8, 2011
An embodiment of the present invention provides a system for detecting a phase-shifted signal at high frequencies in data and clock recovery circuitry. An up-pulse generator, in one embodiment, provides output pulses having a duration exceeding the duration of input pulses upon detec
7881397 Wireless communication system February 1, 2011
Methods and systems for modulating a signal are described. A phase-modulated signal that includes a sequence of contiguous one-cycle sinusoidal waveforms having a frequency above 50 MHz is generated. The phases of the one-cycle sinusoidal waveforms correspond to symbols of a message
7863888 Efficient switching architecture with reduced stub lengths January 4, 2011
A switching topology for communicating signals in an automatic test system includes a plurality of switching circuits each for selectively passing signals or crossing signals. Switching circuits are connected together such that each node of any switching circuit connects to no more than
7856578 Strobe technique for test of digital signal timing December 21, 2010
A test system timing method simulates the timing of a synchronous clock on the device under test. Strobe pulses can be generated by routing an edge generator to delay elements with incrementally increasing delay values. A data signal or synchronous clock signal can be applied to the inpu
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