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Systems Research Laboratories, Inc. Patents
Assignee:
Systems Research Laboratories, Inc.
Address:
Dayton, OH
No. of patents:
24
Patents:




Patent Number Title Of Patent Date Issued
5779907 Magnetic microplate separator July 14, 1998
An apparatus for immunoassay using a 96-well microplate includes a mechanism for supporting the microplate in a relatively fixed position, a magnetic microplate assembly containing multiple cylindrical magnets positioned in 4.times.6 arrays for insertion from the bottom of the microp
5381337 No skid brake control January 10, 1995
The present invention is a brake control system for preventing the skidding of a wheel on a surface. The phase relationship between the brake pressure applied to the brakes and the torque created from the braking applied is determined. This relationship allows the present brake control s
5291136 Variable angle eddy current probe March 1, 1994
An eddy current probe for nondestructive testing, having a rotatable shoe that holds the eddy current coil. The probe is attached to an arm of automated eddy current test equipment, and has a coil-containing shoe that may be rotated to a desired angle with respect to the surface to be
5276450 Phase coherent heterodyne anti-jam method and apparatus January 4, 1994
Method and apparatus for reducing the effects of noise jamming on coherent frequency or phase modulated signals employs a two channel radio signal processing system (15, 20) which accepts an input signal containing a desired signal (S) and a jamming signal (J) from a receiver input circu
5111142 Eddy current proble with adjustable position rotating head May 5, 1992
A detachable, articulated rotating eddy current inspection tool includes a body member having a connector at one end for mechanically and electrically attaching the body member to a rotating drive member while at the other an eddy current probe is supported for radial movement with r
5059904 Control circuit for variable characteristic rotating eddy current probe October 22, 1991
A detachable, articulated rotating eddy current inspection tool includes a body member having a connector at one end for mechanically and electrically attaching the body member to a rotating drive member while at the other an eddy current probe is supported for radial movement with r
5056056 Data recorder including a recirculating non-volatile memory October 8, 1991
A light weight data recorder employs a non-volatile electronic memory to store several channels of data occurring before and after a triggering event. Data may be retained in the memory with the aid of a NiCad battery. Upon the occurrence of a triggering event, which may be user defined,
4912334 Infrared aircraft beacon light March 27, 1990
An infrared aircraft lighting system designed for use in connection with night vision goggles includes a ring structure containing infrared lights that is installed between an existing visible light beacon and the aircraft outer surface, without requiring modification of either the a
4854156 Pneumatic surface-following control system August 8, 1989
An apparatus for maintaining the end of a probe carrying a sensor, such as an eddy current probe, a predetermined distance from a workpiece includes a housing in which a piston is permitted to move. Air under pressure, introduced into a first chamber formed within the housing, acts on a
4731515 Method of making powders by electro-discharge machining in a cryogenic dielectric March 15, 1988
Powders, and particularly metallic powders, are produced by electro-discharge machining of electrically conductive electrodes made of the desired materials in a cryogenic dielectric. When a sufficient quantity of powder has been produced, the cryogenic dielectric is allowed to evapor
4590408 Linear/resonant CRT beam deflection circuit May 20, 1986
In a dual mode CRT deflection circuit, a capacitor for effecting rapid retrace of the CRT beam by means of resonant nonlinear operation is selectively shunted such that beam deflection may be linearly controlled. A bidirectional switch preferably comprising a field effect transistor
4582680 Multiphase backing materials for piezoelectric broadband transducers April 15, 1986
An acoustical transducer is provided with an acoustically absorbant backing material having an acoustical impedance precisely matching the impedance of the piezoelectric element in the transducer. The backing material is a multiphase mixture of selected materials, such as a low melting p
4581070 Multiphase backing materials for piezoelectric broadband transducers April 8, 1986
An acoustical transducer is provided with an acoustically absorbant backing material having an acoustical impedance precisely matching the impedance of the piezoelectric element in the transducer. The backing material is a multiphase mixture of selected materials, such as a low melting p
4515478 Coherent light detecting system including passive averaging network May 7, 1985
Interference patterns are generated in response to temporally coherent light incident upon an interferometer which directs the interference patterns upon an array of photosensitive elements. The photosensitive elements are connected to generate signals representative of the optical e
4482835 Multiphase backing materials for piezoelectric broadband transducers November 13, 1984
An acoustical transducer is provided with an acoustically absorbant backing material having an acoustical impedance precisely matching the impedance of the piezoelectric element in the transducer. The backing material is a multiphase mixture of selected materials, such as a low melting p
4470696 Laser doppler velocimeter September 11, 1984
Reflections, having positive and negative Doppler frequency shifts, from a laser beam directed at a moving surface are passed through spatial filters, combined by a beam splitter, and focussed on an observation plane of a photodetector to provide a fringe pattern having an amplitude
4457174 Ultrasonic inspection of composite materials July 3, 1984
A method of ultrasonically inspecting the internal structure of a multi-ply composite material using ultrasonic transducers includes the steps of positioning an ultrasonic transmitter in acoustical contact with one surface of the material, directing a beam of acoustic energy into the
4376742 Fugitive liquid phase densification of silicon nitride March 15, 1983
Dense silicon nitride bodies are fabricated using conventional hot-pressing techniques using cerium oxide as a densification aid. The bodies are then further treated in a flowing inert atmosphere at a temperature of from 1400.degree.-1600.degree. C. for from several hours to 48 hours to
4292848 Walking-gate ultrasonic flaw detector October 6, 1981
A microprocessor-based ultrasonic inspection system reliably detects fatigue cracks smaller than 0.030 inch under installed fasteners by means of a unique signal-processing method. The signal-processing used in this invention takes advantage of the fact that crack signals "walk" in time
4097849 Electronic comparator for process control June 27, 1978
An optical micrometer scans an article passing through its zone of measurement to provide a series of pulses representing the dimension of an article. Each new measurement is compared against a previous measurement, or an average of a predetermined number of previous measurements, and th
4097158 Half-maximum threshold circuit for optical micrometer June 27, 1978
An optical micrometer includes circuit means for determining accurately the passage of a scanning beam of light across the edges of an article placed within the zone of measurement. By sensing the half power point of the beam as received by a photodetector, the accuracy of the measuremen
4082463 Calibrated optical micrometer April 4, 1978
A method and apparatus for calibrating an optical micrometer utilizes a precisely dimensioned grate which is temporarily introduced into the optical path of the instrument within its zone of measurement. A beam of light is scanned through the zone of measurement and across the grate, and
4074938 Optical dimension measuring device employing an elongated focused beam February 21, 1978
In an optical dimension gauging instrument, commonly referred to as a laser micrometer, particularly for use in measuring the outside dimension of elongated cylindrical objects, such as coated wires or steel tubes, in hostile optical environments, including a laser for generating a beam
4007992 Light beam shape control in optical measuring apparatus February 15, 1977
A narrow collimated light beam, such as a laser beam, is directed towards a mirror which is rotated to effect rotary planar scanning or sweeping of a lens constructed to convert the rotary scanning beam into a parallel scanning beam. An article to be measured is positioned in the path of

 
 
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