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Republic of France Patents
Assignee:
Republic of France
Address:
Paris, FR
No. of patents:
1
Patents:




Patent Number Title Of Patent Date Issued
3930730 Interferometric device for measurement of variations in length of a sample under the influence o January 6, 1976
An interferometric device is provided for measurement of the variations in length of a sample under the influence of temperature, the length of the sample being within a plane of reference and a plane of measurement defined by two plane terminal faces of the sample. The device comprises

 
 
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