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Q-Star Test N.V. Patents |
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Assignee: Q-Star Test N.V.
Address: Bruges, BE
No. of patents: 3
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 7315974 |
Method for detecting faults in electronic devices, based on quiescent current measurements |
January 1, 2008 |
| The present invention is related to a method for testing a micro-electronic device, by applying a plurality of test vectors to said device, and measuring for each test vector, the quiescent supply current I.sub.DDQ, to said device, wherein each I.sub.DDQ measured value is divided by |
| 7315180 |
Device for monitoring quiescent current of an electronic device |
January 1, 2008 |
| The present invention is related to a device (1) for measuring the quiescent current I.sub.DDQ drawn by an electronic device such as a CMOS device or an IC, from a supply voltage. The quiescent current is drawn in between switching peaks, and is a measure for the quality of a device |
| 6927592 |
Device for monitoring quiescent current of an electronic device |
August 9, 2005 |
| The present invention is related to a device (1) for measuring the quiescent current I.sub.DDQ drawn by an electronic device such as a CMOS device or an IC, from a supply voltage. The quiescent current is drawn in between switching peaks, and is a measure for the quality of a device |
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