Resources Contact Us Home Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE     Pycon, Inc. Patents Assignee: Pycon, Inc. Address: Santa Clara, CA No. of patents: 7 Patents: Patent Number Title Of Patent Date Issued 7038479 Method and apparatus to provide a burn-in board with increased monitoring capacity May 2, 2006 A method and apparatus are described for allowing the testing and monitoring of an increased number of devices on a standard burn-in board by implementing a PLD and a group of switches to get the result of a multiplexor on the burn-in board. The test data output (TDO) signals from th 6788083 Method and apparatus to provide a burn-in board with increased monitoring capacity September 7, 2004 A method and apparatus are described for allowing the testing and monitoring of an increased number of device on a standard burn-in board by implementing a PLD and a group of switches to get the result of a multiplexor on the burn-in board. The test data output (TDO) signals from the 6433569 Apparatus for testing an integrated circuit in an oven during burn-in August 13, 2002 An apparatus for testing an integrated circuit in an oven during burn-in. A burn-in board in the oven is electrically connected to a plurality of integrated circuit ("ICE") components. A driver/interface board outside the oven is electrically connected to the burn-in board through a 6160411 Apparatus for testing an integrated circuit in an oven during burn-in December 12, 2000 An apparatus for testing an integrated circuit in an oven during burn-in. A burn-in board in the oven is electrically connected to a plurality of integrated circuit ("IC") components. A driver/interface board outside the oven is electrically connected to the burn-in board through a plura 6127834 Apparatus for testing an integrated circuit in an oven during burn-in October 3, 2000 An apparatus for testing an integrated circuit in an oven during burn-in. A burn-in board in the oven is electrically connected to a plurality of integrated circuit ("IC") components. A driver/interface board outside the oven is electrically connected to the burn-in board through a plura 5966021 Apparatus for testing an integrated circuit in an oven during burn-in October 12, 1999 An apparatus for testing an integrated circuit in an oven during burn-in. A burn-in board in the oven is electrically connected to a plurality of integrated circuit ("IC") components. A driver/interface board outside the oven is electrically connected to the burn-in board through a plura 5805471 Driver board apparatus having SRAM and burn-in system and method using host computer September 8, 1998 The present invention provides a driver board which can be used with a wide range of test patterns and devices, and includes the capability to modify the edge connector configuration. The driver board contains a CPU module for communicating with a host computer. The board also utilizes S       Recently Added Patents Implementation of double data rate embedded memory in programmable devices Apparatus and method for transmitting and receiving a cell identification code in a mobile communication system Suitcase Canister Locking tailpiece Clothing article Footwear upper portion   Randomly Featured Patents CMOS circuit for generating a current reference, the circuit comprising a transistor in a weak inversion region Thermostructural composite structure with a compositional gradient and its manufacturing process Method of manufacturing semiconductor device Thermal cutoff heater Voltage level shift circuit Pigment concentrates containing dimerdiolalkoxylate additives, and methods of preparing same Fishing spreader connector and combination thereof CMOS active pixel image sensor with extended dynamic range and sensitivity Intraocular lens and method of forming the lens Processes for conversion of sulfurous anhydride to sulfuric anhydride and vice versa with a Fe, Cu, alkali metal containing catalyst © 2006. PatentGenius. All Rights Reserved.