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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Orbotech, Ltd. Patents
Assignee:
Orbotech, Ltd.
Address:
Yavne, IL
No. of patents:
90
Patents:


1 2










Patent Number Title Of Patent Date Issued
RE38716 Automatic visual inspection system March 22, 2005
A binary map of an object having edges is produced by first producing a digital grey scale image of the object with a given resolution, and processing the grey scale image to produce a binary map of the object at a resolution greater than said given resolution. Processing of the grey
8290239 Automatic repair of electric circuits October 16, 2012
An apparatus and method for automatically inspecting and repairing printed circuit boards includes an inspection functionality automatically inspecting printed circuit boards and providing a machine readable indication of regions thereon requiring repair. An automatic repair function
8144973 Multi-modal imaging March 27, 2012
A method for scanning a surface with a number of different illumination configurations, the method comprises capturing a plurality of images in a sequential manner during a single sweep, each image including one or more lines of pixels, sequentially altering an illumination configuration
8119969 Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor February 21, 2012
An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to
8077307 Illumination system for optical inspection December 13, 2011
Apparatus for optical inspection includes an illumination assembly, including multiple parallel rows of light sources for emitting light and illumination optics associated with each row for directing the light onto an object under inspection. The multiple parallel rows include at least a
8054553 Illumination angle control using dichroic filters November 8, 2011
A method of controlling the illumination angle onto a target, including, illuminating onto the target with light from at least two light sources of pre-selected wavelengths; wherein each point on the target is illuminated by light from the light sources with a respective maximal illu
7986404 Inspection system employing illumination that is selectable over a continuous range angles July 26, 2011
An illumination device and method for inspecting objects having microscopic features is provided. The device includes an illuminator which provides a solid angle of angularly specific illumination defining an illumination angle, selected by a user from among a continuous range of pos
7947922 Multiple beam micro-machining system and method May 24, 2011
A system for delivering energy to a substrate includes a laser energy source providing a plurality of laser beams, wherein each of the beams is steered to an independently selectable location on a target, and is independently focused onto the target.
7945087 Alignment of printed circuit board targets May 17, 2011
A method for micromachining a material, including configuring an optical system to provide illumination of an illumination wavelength to a site via a given element of the optical system, the illumination generating returning radiation from the site. The method further includes config
7925073 Multiple optical input inspection system April 12, 2011
A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by employing the other
7897902 Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor March 1, 2011
An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to
7795887 Photoconductive based electrical testing of transistor arrays September 14, 2010
An apparatus is provided for testing microelectronic components on a substrate, including a scanner operative to scan a light beam over a plurality of thin film transistors disposed on a substrate, one transistor at a time, so as to induce a photoconductive response in the plurality
7663111 Variable collimation in radiation detection February 16, 2010
Apparatus for detecting radiation emitted from a number of volume elements of a body. The apparatus includes a first plurality of detector elements, each detector element being configured to output signals indicative of an intensity of radiation that is incident thereon. The apparatus al
7642484 Multiple beam micro-machining system and method January 5, 2010
A system for delivering energy to a substrate including a dynamically directable source of radiant energy providing a plurality of beams of radiation, each propagating in a dynamically selectable direction. Independently positionable beam steering elements in a plurality of beam stee
7641365 Linear light concentrator January 5, 2010
An optical element including a unitary, non-circularly-symmetrical, piece of optically-transmissive material, which has at least first and second surfaces for concentrating light from a light source onto a linear target region, such that at least one of the first and second surfaces is
7636466 System and method for inspecting workpieces having microscopic features December 22, 2009
Apparatus for high resolution processing of a generally planar workpiece having microscopic features to be imaged, comprising a video camera acquiring at least two candidate images of a microscopic portion on generally planar workpiece; a motion controller operative to effect motion,
7633036 Micro-machining system employing a two stage beam steering mechanism December 15, 2009
A system for delivering energy to a substrate including a dynamically directable source of radiant energy providing a plurality of beams of radiation, each propagating in a dynamically selectable direction. Independently positionable beam steering elements in a plurality of beam stee
7629555 Multiple beam micro-machining system and method December 8, 2009
A system for delivering energy to a substrate including a dynamically directable source of radiant energy providing a plurality of beams of radiation, each propagating in a dynamically selectable direction. Independently positionable beam steering elements in a plurality of beam stee
7598688 Tilting device October 6, 2009
A flat surface tilting device including a selectably positionable flat surface element assembly defining a flat surface element having a flat surface and a pivot location portion, the pivot location portion being generally centered with respect to the flat surface, a pivot support el
7525098 High resolution energy detector April 28, 2009
Apparatus for detecting radiation, including a semiconductor which is arranged to interact with photons of the radiation, and a plurality of electrodes which are configured to sense respective charge distributions in response to interactions of the photons with a region of the semico
7521651 Multiple beam micro-machining system and method April 21, 2009
A system for delivering energy to a substrate including a dynamically directable source of radiant energy providing a plurality of beams of radiation, each propagating in a dynamically selectable direction. Independently positionable beam steering elements in a plurality of beam stee
7508515 System and method for manufacturing printed circuit boards employing non-uniformly modified imag March 24, 2009
A system and method for fabricating an electrical circuit in which a digital control image (46) is generated by non-uniformly modifying (44) a representation of an electrical circuit (40), such that an electrical circuit pattern (72) recorded on a substrate (12) using the digital con
7453486 Pulse light pattern writer November 18, 2008
Apparatus for transmitting information at a data rate, such as for recording an image on a photosensitive surface, including a pulsed light source that produces pulsed light having a pulsed repetition rate and a modulator that asynchronously modulates the pulsed light at the date rat
7417243 High-sensitivity optical scanning using memory integration August 26, 2008
An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to
7391510 System and method for inspecting patterned devices having microscopic conductors June 24, 2008
An inspection system operative to inspect patterned devices having microscopic conductors, the system comprising a camera viewing a location of a candidate defect on a patterned substrate and acquiring thereat at least one image of the location, the camera defining an optical axis, the
7388978 Apparatus and methods for the inspection of objects June 17, 2008
An electrical circuit inspection method including, for each of a plurality of types of local characteristics, each type occurring at least once within electrical circuitry to be inspected, identifying at least one portion of interest within the electrical circuitry whereat the local
7355692 System and method for inspecting electrical circuits utilizing reflective and fluorescent imager April 8, 2008
A method for inspecting an electrical circuit including optically inspecting at least a portion of an electrical circuit by detecting light reflected therefrom in a first image during a first time interval, optically inspecting light emitted from at least a portion of the electrical
7347530 Inkjet printing of color filters March 25, 2008
A method for printing includes providing a substrate on which a matrix of color elements is defined, the color elements having respective center lines. A printhead assembly is positioned over the substrate. The printhead assembly includes multiple controllable nozzles. At least one o
7317522 Verification of non-recurring defects in pattern inspection January 8, 2008
A system and method for verifying defects in electrical circuit patterns including supplying a plurality of like electrical circuit patterns to a defect verification assembly after identification of candidate defects at an automated inspection assembly; verifying selected candidate defec
7295696 Automatic optical inspection system and method November 13, 2007
A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.
7283660 Multi-layer printed circuit board fabrication system and method October 16, 2007
A method for aligning an image to be recorded by a direct image scanner on an upper layer of a printed circuit board with an image recorded on a lower layer thereof, the method comprising: visually imaging a portion of the image on the lower layer; and recording a pattern on the upper
7253891 Method and apparatus for simultaneous 2-D and topographical inspection August 7, 2007
Apparatus for sensing information regarding a surface including a first plurality of optical elements arranged to acquire two dimensional information about a surface, a second plurality of optical elements arranged to acquire topographical information about the surface, wherein the f
7253120 Selectable area laser assisted processing of substrates August 7, 2007
A system and method for selectable area laser treatment of a substrate, such as thin film transistors, the system including a holder holding a substrate in proximity to reactant, and laser beams each addressing independently selectable mutually set apart locations on the substrate to
7231080 Multiple optical input inspection system June 12, 2007
A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by employing the other
7218771 Cam reference for inspection of contour images May 15, 2007
This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more than two different types of regions and an analysis subsystem for analyzing the inspection ou
7215417 Illuminator for inspecting substantially flat surfaces May 8, 2007
Illuminating apparatus for illuminating a workpiece during visual inspection thereof, including a first light source emitting light over a continuous angle of illumination toward the workpiece, blocking element arranged to block light over a portion of the continuous angle such that
7203355 Automatic optical inspection system and method April 10, 2007
A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.
7200259 Optical inspection system April 3, 2007
This invention discloses a method for determining a location of a border in a color image, the image comprising at least two color populations, between a first color region associated with a first one of the two color populations and a second color region associated with a second one of
7181059 Apparatus and methods for the inspection of objects February 20, 2007
A method for inspecting electrical circuits, and a system for carrying out the method, generating a representation of boundaries of elements in an image of an electrical circuit which is under inspection, and analyzing at least some locations of at least some boundaries in the representa
7176409 Multiple beam micromachining system for removing at least two different layers of a substrate February 13, 2007
A system for delivering energy to a substrate including a dynamically directable source of radiant energy providing a plurality of beams of radiation, each propagating in a dynamically selectable direction. Independently positionable beam steering elements in a plurality of beam stee
7129509 High-sensitivity optical scanning using memory integration October 31, 2006
An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to
7127099 Image searching defect detector October 24, 2006
An image of an article to be inspected is divided into image portions, and a search engine makes a comparison with the image portion and a library of reference images. The reference images have predetermined labels that indicate whether each indicates a defect or no defect. The one of th
7092000 Pulse light pattern writer August 15, 2006
Apparatus far transmitting information at a data rate, such as for recording an image on a photosensitive surface, including a pulsed light source that produces pulsed light having a pulsed repetition rate and a modulator that asynchronously modulates the pulsed light at the data rat
7078650 Micro-machining employing multiple independently focused and independently steered beams July 18, 2006
A system for delivering energy to a substrate includes a laser energy source providing at least two laser beams, wherein each of the beams is steered to an independently selectable location on a target, and is independently focused onto the target.
7064338 Two-dimensional radiation detector June 20, 2006
A two-dimensional, pixellated, monolithic semiconductor radiation detector, in which each detector pixel is essentially a perpendicular mode detector. This is achieved by an arrangement of anode spots, one for each pixel located on the flux-exposed front surface of the detector subst
7062354 Multi-layer printed circuit board fabrication system and method June 13, 2006
A method for aligning an image to be recorded by a direct image scanner on an upper layer of a printed circuit board with an image recorded on a lower layer thereof, the method comprising visually imaging a portion of the image on the lower layer and recording a pattern on the upper laye
7058474 Multi-layer printed circuit board fabrication system and method June 6, 2006
A method for aligning an image to be recorded by a direct image scanner on an upper layer of a printed circuit board with an image recorded on a lower layer thereof, the method comprising: visually imaging a portion of the image on the lower layer; and recording a pattern on the upper
7009163 High-sensitivity optical scanning using memory integration March 7, 2006
An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to
7006212 Electrical circuit conductor inspection February 28, 2006
A first inspection functionality is provided to obtain information about a first attribute at a conductor location on an electrical circuit. A second inspection functionality is provided to obtain information about a second attribute at the conductor location. A combination of first
6990227 Method for printed circuit board inspection January 24, 2006
This invention discloses a method for printed circuit board (PCB) inspection, including providing a multiplicity of PCBs placed on an inspection panel, defining each non-identical PCB in terms of geometry and features which are to be inspected, grouping the PCBs into at least one clu
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