| Patent Number |
Title Of Patent |
Date Issued |
| RE38716 |
Automatic visual inspection system |
March 22, 2005 |
| A binary map of an object having edges is produced by first producing a digital grey scale image of the object with a given resolution, and processing the grey scale image to produce a binary map of the object at a resolution greater than said given resolution. Processing of the grey |
| 7598688 |
Tilting device |
October 6, 2009 |
| A flat surface tilting device including a selectably positionable flat surface element assembly defining a flat surface element having a flat surface and a pivot location portion, the pivot location portion being generally centered with respect to the flat surface, a pivot support el |
| 7525098 |
High resolution energy detector |
April 28, 2009 |
| Apparatus for detecting radiation, including a semiconductor which is arranged to interact with photons of the radiation, and a plurality of electrodes which are configured to sense respective charge distributions in response to interactions of the photons with a region of the semico |
| 7521651 |
Multiple beam micro-machining system and method |
April 21, 2009 |
| A system for delivering energy to a substrate including a dynamically directable source of radiant energy providing a plurality of beams of radiation, each propagating in a dynamically selectable direction. Independently positionable beam steering elements in a plurality of beam stee |
| 7508515 |
System and method for manufacturing printed circuit boards employing non-uniformly modified imag |
March 24, 2009 |
| A system and method for fabricating an electrical circuit in which a digital control image (46) is generated by non-uniformly modifying (44) a representation of an electrical circuit (40), such that an electrical circuit pattern (72) recorded on a substrate (12) using the digital con |
| 7453486 |
Pulse light pattern writer |
November 18, 2008 |
| Apparatus for transmitting information at a data rate, such as for recording an image on a photosensitive surface, including a pulsed light source that produces pulsed light having a pulsed repetition rate and a modulator that asynchronously modulates the pulsed light at the date rat |
| 7417243 |
High-sensitivity optical scanning using memory integration |
August 26, 2008 |
| An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to |
| 7391510 |
System and method for inspecting patterned devices having microscopic conductors |
June 24, 2008 |
| An inspection system operative to inspect patterned devices having microscopic conductors, the system comprising a camera viewing a location of a candidate defect on a patterned substrate and acquiring thereat at least one image of the location, the camera defining an optical axis, the |
| 7388978 |
Apparatus and methods for the inspection of objects |
June 17, 2008 |
| An electrical circuit inspection method including, for each of a plurality of types of local characteristics, each type occurring at least once within electrical circuitry to be inspected, identifying at least one portion of interest within the electrical circuitry whereat the local |
| 7355692 |
System and method for inspecting electrical circuits utilizing reflective and fluorescent imager |
April 8, 2008 |
| A method for inspecting an electrical circuit including optically inspecting at least a portion of an electrical circuit by detecting light reflected therefrom in a first image during a first time interval, optically inspecting light emitted from at least a portion of the electrical |
| 7347530 |
Inkjet printing of color filters |
March 25, 2008 |
| A method for printing includes providing a substrate on which a matrix of color elements is defined, the color elements having respective center lines. A printhead assembly is positioned over the substrate. The printhead assembly includes multiple controllable nozzles. At least one o |
| 7317522 |
Verification of non-recurring defects in pattern inspection |
January 8, 2008 |
| A system and method for verifying defects in electrical circuit patterns including supplying a plurality of like electrical circuit patterns to a defect verification assembly after identification of candidate defects at an automated inspection assembly; verifying selected candidate defec |
| 7295696 |
Automatic optical inspection system and method |
November 13, 2007 |
| A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article. |
| 7283660 |
Multi-layer printed circuit board fabrication system and method |
October 16, 2007 |
| A method for aligning an image to be recorded by a direct image scanner on an upper layer of a printed circuit board with an image recorded on a lower layer thereof, the method comprising: visually imaging a portion of the image on the lower layer; and recording a pattern on the upper |
| 7253891 |
Method and apparatus for simultaneous 2-D and topographical inspection |
August 7, 2007 |
| Apparatus for sensing information regarding a surface including a first plurality of optical elements arranged to acquire two dimensional information about a surface, a second plurality of optical elements arranged to acquire topographical information about the surface, wherein the f |
| 7253120 |
Selectable area laser assisted processing of substrates |
August 7, 2007 |
| A system and method for selectable area laser treatment of a substrate, such as thin film transistors, the system including a holder holding a substrate in proximity to reactant, and laser beams each addressing independently selectable mutually set apart locations on the substrate to |
| 7231080 |
Multiple optical input inspection system |
June 12, 2007 |
| A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by employing the other |
| 7218771 |
Cam reference for inspection of contour images |
May 15, 2007 |
| This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more than two different types of regions and an analysis subsystem for analyzing the inspection ou |
| 7215417 |
Illuminator for inspecting substantially flat surfaces |
May 8, 2007 |
| Illuminating apparatus for illuminating a workpiece during visual inspection thereof, including a first light source emitting light over a continuous angle of illumination toward the workpiece, blocking element arranged to block light over a portion of the continuous angle such that |
| 7203355 |
Automatic optical inspection system and method |
April 10, 2007 |
| A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article. |
| 7200259 |
Optical inspection system |
April 3, 2007 |
| This invention discloses a method for determining a location of a border in a color image, the image comprising at least two color populations, between a first color region associated with a first one of the two color populations and a second color region associated with a second one of |
| 7181059 |
Apparatus and methods for the inspection of objects |
February 20, 2007 |
| A method for inspecting electrical circuits, and a system for carrying out the method, generating a representation of boundaries of elements in an image of an electrical circuit which is under inspection, and analyzing at least some locations of at least some boundaries in the representa |
| 7176409 |
Multiple beam micromachining system for removing at least two different layers of a substrate |
February 13, 2007 |
| A system for delivering energy to a substrate including a dynamically directable source of radiant energy providing a plurality of beams of radiation, each propagating in a dynamically selectable direction. Independently positionable beam steering elements in a plurality of beam stee |
| 7129509 |
High-sensitivity optical scanning using memory integration |
October 31, 2006 |
| An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to |
| 7127099 |
Image searching defect detector |
October 24, 2006 |
| An image of an article to be inspected is divided into image portions, and a search engine makes a comparison with the image portion and a library of reference images. The reference images have predetermined labels that indicate whether each indicates a defect or no defect. The one of th |
| 7092000 |
Pulse light pattern writer |
August 15, 2006 |
| Apparatus far transmitting information at a data rate, such as for recording an image on a photosensitive surface, including a pulsed light source that produces pulsed light having a pulsed repetition rate and a modulator that asynchronously modulates the pulsed light at the data rat |
| 7078650 |
Micro-machining employing multiple independently focused and independently steered beams |
July 18, 2006 |
| A system for delivering energy to a substrate includes a laser energy source providing at least two laser beams, wherein each of the beams is steered to an independently selectable location on a target, and is independently focused onto the target. |
| 7064338 |
Two-dimensional radiation detector |
June 20, 2006 |
| A two-dimensional, pixellated, monolithic semiconductor radiation detector, in which each detector pixel is essentially a perpendicular mode detector. This is achieved by an arrangement of anode spots, one for each pixel located on the flux-exposed front surface of the detector subst |
| 7062354 |
Multi-layer printed circuit board fabrication system and method |
June 13, 2006 |
| A method for aligning an image to be recorded by a direct image scanner on an upper layer of a printed circuit board with an image recorded on a lower layer thereof, the method comprising visually imaging a portion of the image on the lower layer and recording a pattern on the upper laye |
| 7058474 |
Multi-layer printed circuit board fabrication system and method |
June 6, 2006 |
| A method for aligning an image to be recorded by a direct image scanner on an upper layer of a printed circuit board with an image recorded on a lower layer thereof, the method comprising: visually imaging a portion of the image on the lower layer; and recording a pattern on the upper |
| 7009163 |
High-sensitivity optical scanning using memory integration |
March 7, 2006 |
| An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to |
| 7006212 |
Electrical circuit conductor inspection |
February 28, 2006 |
| A first inspection functionality is provided to obtain information about a first attribute at a conductor location on an electrical circuit. A second inspection functionality is provided to obtain information about a second attribute at the conductor location. A combination of first |
| 6990227 |
Method for printed circuit board inspection |
January 24, 2006 |
| This invention discloses a method for printed circuit board (PCB) inspection, including providing a multiplicity of PCBs placed on an inspection panel, defining each non-identical PCB in terms of geometry and features which are to be inspected, grouping the PCBs into at least one clu |
| 6973406 |
Apparatus and method for electrical testing of electrical circuits |
December 6, 2005 |
| Apparatus for electrical testing of electrical circuits includes an array of probes arranged for selective engagement with portions of electrical circuits to be tested, testing circuitry associated with the array of probes for sensing electrical characteristics of the electrical circuits |
| 6911620 |
System and method for unveiling targets embedded in a multi-layered electrical circuit |
June 28, 2005 |
| A system for unveiling embedded targets in printed circuit board substrates includes a micro-machining device, a sensor, and a controller. The micro-machining device removes portions of an opaque layer overlaying an alignment target in a general region in which the target should be l |
| 6870611 |
Electrical circuit conductor inspection |
March 22, 2005 |
| A first inspection functionality is provided to obtain information about a first attribute at a conductor location on an electrical circuit. A second inspection functionality is provided to obtain information about a second attribute at the conductor location. A combination of first attr |
| 6864498 |
Optical inspection system employing a staring array scanner |
March 8, 2005 |
| A scanner system acquires images of articles using a sensor acquiring an image of a portion of an article and defining a field of view, a displacer operative to provide mutual relative displacement between the article and the sensor at a generally uniform rate of displacement, and a fiel |
| 6847442 |
Illuminator for inspecting substantially flat surfaces |
January 25, 2005 |
| Illuminator apparatus for illuminating a workpiece during visual testing thereof, the illuminator comprising: a source of illumination that illuminates a portion of the workpiece with on-axis illumination centered at a first angular direction and having a first intensity and with off |
| 6834243 |
Apparatus and method for electrical testing of electrical circuits |
December 21, 2004 |
| Apparatus for electrical testing of electrical circuits includes an array of probes arranged for selective engagement with portions of electrical circuits to be tested, testing circuitry associated with the array of probes for sensing electrical characteristics of the electrical circuits |
| 6832843 |
Illumination for inspecting surfaces of articles |
December 21, 2004 |
| An illumination system including at least one reflector subtending an angle with respect to a location on a surface of an article, and first and second light sources, the first and second light sources each providing a light output, the light outputs from both of the first and second lig |
| 6822734 |
Apparatus and method for fabricating flat workpieces |
November 23, 2004 |
| Method and apparatus for manufacture and inspection of flat articles, such as flat planel display substrates, that are manufactured in a contamination-sensitive environment. In particular, a manufacturing step such as applying coatings to the article is performed in a self-contained |
| 6819789 |
Scaling and registration calibration especially in printed circuit board fabrication |
November 16, 2004 |
| A method is disclosed for calibrating a camera used in a scanner for scanning images onto a printed circuit board. The calibration method determines a transformation between the camera and the scanner by writing a pattern on a photosensitized substrate using the scanner, where the pa |
| 6810297 |
System and methods for imaging employing a levitating conveyor |
October 26, 2004 |
| A system and methodology for conveying generally planar substrates such as printed circuit board, flat panel display and interconnect device substrates, in a levitated state, to and from a scanning or imaging location, including an air flow conveyor having a substrate flattening func |
| 6809290 |
Laser energy delivery system outputting beams having a selectable energy |
October 26, 2004 |
| A system for delivering energy to a substrate including a dynamically directable source of radiant energy providing a plurality of beams of radiation, each propagating in a dynamically selectable direction. Independently positionable beam steering elements in a plurality of beam stee |
| 6795186 |
Adaptive tolerance reference inspection system |
September 21, 2004 |
| Method and apparatus for automatically optically inspecting electrical circuits by matching portions of an electrical circuit being inspected to corresponding portions in a reference, wherein an adaptive spatial tolerance representing a permissible deviation in the location of corres |
| 6781687 |
Illumination and image acquisition system |
August 24, 2004 |
| An inspection illuminates a generally specular surface of an electrical circuit with flashes of light. The flashed light comes form at least two spectrally different sources, and is temporally spaced. A camera forms an optical image of the circuit for each flash of light. Optical images |
| 6765934 |
Laser repetition rate multiplier |
July 20, 2004 |
| A method for recording an image on a photosensitive surface, comprising: producing a primary pulsed light beam; converting the primary light beam, in a light wavelength converter separate from the pulsed light source, to an ultraviolet pulsed light beam; modulating the ultraviolet pulse |
| 6759850 |
System and method for non-contact electrical testing employing a CAM derived reference |
July 6, 2004 |
| A system and method for electrically testing electrical circuits in which electromagnetic values that are to be sensed by an array of sensors are forecast or simulated, for use as a reference, by calculation using computer files corresponding to a board under test and to an array of |
| 6756563 |
System and method for forming holes in substrates containing glass |
June 29, 2004 |
| A system and method for micromachining substrates containing glass employing a UV laser beam generated by outputting a sub-1000 nm pulsed laser beam that is frequency converted by third harmonic generation to have a wavelength within the range of 285 nm to 333 nm. |
| 6701197 |
System and method for side to side registration in a printed circuit imager |
March 2, 2004 |
| A method of recording aligned images on two sides of a printed circuit board substrate, including: recording an image of an electrical circuit pattern on a first side of a printed circuit board substrate; forming an alignment pattern on a side of the printed circuit board substrate, |
