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Molecular Imprints, Inc. Patents
Assignee:
Molecular Imprints, Inc.
Address:
Austin, TX
No. of patents:
63
Patents:


1 2


Patent Number Title Of Patent Date Issued
7452574 Method to reduce adhesion between a polymerizable layer and a substrate employing a fluorine-con November 18, 2008
The present invention provides a method to reduce adhesion between a polymerizable layer and a substrate surface that selectively comes into contact with the polymerizable layer. The method features disposing a coating upon the surface from a composition having a perfluoro silane con
7442336 Capillary imprinting technique October 28, 2008
The present invention provides a method for patterning a substrate with a template having a mold that features positioning conformable material between the substrate and the mold and filling a volume defined between the mold and the substrate with the conformable material through cap
7420654 Method of varying dimensions of a substrate during nano-scale manufacturing September 2, 2008
The present invention is directed toward a method to vary dimensions of a substrate supported by a chuck. The method includes applying compressive forces to the substrate with the actuator assembly while facilitating movement of the actuator assembly with respect to the substrate to
7396475 Method of forming stepped structures employing imprint lithography July 8, 2008
The present invention provides a method for forming a stepped structure on a substrate that features transferring, into the substrate, an inverse shape of the stepped structure disposed on the substrate.
7387508 Compliant device for nano-scale manufacturing June 17, 2008
The present invention is directed to a compliant device comprising a support body, a floating body, and a plurality of flexure arms. Each of the plurality of flexure arms is connected between the support body and the floating body to transfer a load therebetween in parallel. To that
7357876 Eliminating printability of sub-resolution defects in imprint lithography April 15, 2008
The present invention provides a method of forming a desired pattern in a layer positioned on a substrate with a mold, the method including, inter alia, contacting the layer with the mold forming a shape therein having a plurality of features extending in a first direction; and altering
7338275 Formation of discontinuous films during an imprint lithography process March 4, 2008
The present invention is directed to a template having a body including a surface with first and second regions. The first region has first wetting characteristics for a given material and the second region has second wetting characteristics for the given material. The first wetting
7323417 Method of forming a recessed structure employing a reverse tone process January 29, 2008
The present invention provides a method of forming recesses on a substrate, the method including forming on the substrate a patterning layer having first features; trim etching the first features to define trimmed features having a shape; and transferring an inverse of the shape into
7323130 Magnification correction employing out-of-plane distortion of a substrate January 29, 2008
The present invention is directed to a method of controlling dimensional relations between an original pattern present in a mold and a recorded pattern formed in a layer of a substrate. In this manner, the size of the recorded pattern may appear to be magnified and/or reduced, when compa
7316554 System to control an atmosphere between a body and a substrate January 8, 2008
The present invention is directed towards a system to control an atmosphere about a substrate, the system including, inter alia, a body spaced-apart from a surface of the substrate a distance; a supply of fluid coupled to introduce a flow between the body and the substrate; and a wal
7309225 Moat system for an imprint lithography template December 18, 2007
The present invention is directed to a body having a first area and a second area separated by a recess. The recess is dimensioned to reduce, if not prevent, a liquid moving along a surface of the body from traveling between the first and second areas. One or more alignment marks may
7307118 Composition to reduce adhesion between a conformable region and a mold December 11, 2007
The present invention provides compositions that feature improved preferential adhesion and release characteristics with respect to a substrate and a mold having imprinting material disposed therebetween. To that end, the compositions facilitate bifurcation of the imprinting into a s
7298456 System for varying dimensions of a substrate during nanoscale manufacturing November 20, 2007
The present invention is directed toward a system to vary dimensions of a substrate, such as a template having a patterned mold. To that end, the system includes a substrate chuck adapted to position the substrate in a region; a pliant member; and an actuator sub-assembly elastically cou
7292326 Interferometric analysis for the manufacture of nano-scale devices November 6, 2007
The present invention features a system to determine relative spatial parameters between two coordinate systems, which may be a mold and a region of a substrate in which mold is employed to generate a pattern. The system senses relative alignment between the two coordinate systems at
7282550 Composition to provide a layer with uniform etch characteristics October 16, 2007
The present invention includes a composition to form a layer on a substrate having uniform etch characteristics. To that end, the composition has a plurality of components, a subset of which has substantially similar rates of evaporation for an interval of time.
7281921 Scatterometry alignment for imprint lithography October 16, 2007
Described are methods for patterning a substrate by imprint lithography. Imprint lithography is a process in which a liquid is dispensed onto a substrate. A template is brought into contact with the liquid and the liquid is cured. The cured liquid includes an imprint of any patterns
7281919 System for controlling a volume of material on a mold October 16, 2007
A system for controlling a volume of liquid on a mold that features a body defining a volume with an aperture formed into the body and positioned proximate to the mold. A pump system is in fluid communication with the body, and the aperture and the pump system are established to create a
7279113 Method of forming a compliant template for UV imprinting October 9, 2007
A method of forming a lithographic template having an elastomer layer positioned between a body and an imprinting layer, the imprinting layer having a pattern formed thereon.
7270533 System for creating a turbulent flow of fluid between a mold and a substrate September 18, 2007
The present invention is directed toward a system for introducing a flow of a fluid between a mold, disposed on a template, and a substrate, the system including, a fluid supply system; and a chuck body having a baffle and first and second apertures, the first and second apertures dispos
7261831 Positive tone bi-layer imprint lithography method August 28, 2007
The present invention provides a method to pattern a substrate which features creating a multi-layered structure by forming, on the substrate, a patterned layer having protrusions and recessions. Formed upon the patterned layer is a conformal layer, with the multi-layered structure h
7261830 Applying imprinting material to substrates employing electromagnetic fields August 28, 2007
The present invention comprises a method for applying a liquid, such as imprinting material, to a substrate that features use of an electromagnetic field to rapidly spread the liquid over a desired portion of the substrate, while confining the same to the desired region.
7259102 Etching technique to planarize a multi-layer structure August 21, 2007
The present invention is directed to a method of etching a multi-layer structure formed from a layer of a first material and a layer of a second material differing from the first material to obtain a desired degree of planarization. To that end, the method includes creating a first set o
7256131 Method of controlling the critical dimension of structures formed on a substrate August 14, 2007
The present invention provides a method of patterning a substrate, the method including, inter alia, forming a multi-layered structure on the substrate formed from first, second and third materials. The first, second and third materials are exposed to an etch chemistry, with the firs
7252777 Method of forming an in-situ recessed structure August 7, 2007
The present invention features a method of patterning a substrate that includes forming from a first material, disposed on the substrate, a first film having an original pattern that includes a plurality of projections. The projections extend from a nadir surface terminating in an ap
7252715 System for dispensing liquids August 7, 2007
The present invention provides a system to dispense a liquid, contained in a cartridge, onto a substrate employing a dispensing system under control of a processor in data communication with a memory.
7244386 Method of compensating for a volumetric shrinkage of a material disposed upon a substrate to for July 17, 2007
The present invention provides a method of planarizing a substrate with a template spaced-apart from the substrate having a liquid disposed therebetween, the method including: contacting the liquid with the template forming a first shape therein; and impinging radiation upon the liqu
7241395 Reverse tone patterning on surfaces having planarity perturbations July 10, 2007
The present invention features a method of patterning a substrate that includes forming, on the substrate, a first film having an original pattern that includes a plurality of projections a subset of which extends from a nadir surface terminating in an apex surface defining a height
7224443 Imprint lithography substrate processing tool for modulating shapes of substrates May 29, 2007
The present invention is directed to a chucking system to modulate substrates so as to properly shape and position the same with respect to a wafer upon which a pattern is to be formed with the substrate. The chucking system includes a chuck body having first and second opposed sides
7186656 Method of forming a recessed structure employing a reverse tone process March 6, 2007
The present invention provides a method of forming recesses on a substrate, the method including forming on the substrate a patterning layer having first features; trim etching the first features to define trimmed features having a shape; and transferring an inverse of the shape into
7179396 Positive tone bi-layer imprint lithography method February 20, 2007
The present invention provides a method to pattern a substrate which features creating a multi-layered structure by forming, on the substrate, a patterned layer having protrusions and recessions. Formed upon the patterned layer is a conformal layer, with the multi-layered structure h
7179079 Conforming template for patterning liquids disposed on substrates February 20, 2007
The present invention includes a conforming template for patterning liquids disposed on substrates. The template includes a body having opposed first and second surfaces. The first surface includes a plurality of recessed regions with a patterning region being disposed between adjace
7170589 Apparatus to vary dimensions of a substrate during nano-scale manufacturing January 30, 2007
The present invention is directed toward a system to vary dimensions of a substrate, such as a template having a patterned mold. To that end, the system includes a substrate chuck adapted to position the substrate in a region; a pliant member; and an actuator sub-assembly elastically cou
7157036 Method to reduce adhesion between a conformable region and a pattern of a mold January 2, 2007
The present invention provides a method to reduce adhesion between a conformable region on a substrate and a pattern of a mold, which selectively comes into contact with the conformable region. The method features forming a conformable material on the substrate and contacting the con
7150622 Systems for magnification and distortion correction for imprint lithography processes December 19, 2006
The present invention is directed toward a system to vary dimensions of a template in order to attenuate if not prevent distortions in an underlying pattern formed by the template. To that end, the system features a compression device that includes a pair of spaced-apart contact memb
7140861 Compliant hard template for UV imprinting November 28, 2006
A compliant UV imprint lithography template, which may also act as a thermal implant template, and methods for manufacturing it. The template essentially comprises a relief image and an elastomer adapted to adjust the relief image. In an embodiment, the relief image is arranged in a
7136150 Imprint lithography template having opaque alignment marks November 14, 2006
The present invention is directed to providing a template with alignment marks that are opaque to selective wavelength of light. In one embodiment, a template is provided having patterning areas and a template, with the template mark being formed from metal and disposed outside of th
7132225 Methods of inspecting a lithography template November 7, 2006
A method for forming imprint lithography templates is described herein. The method includes forming a masking layer and a conductive layer on a substrate surface. The use of a conductive layer allows patterning of the masking layer using electron beam pattern generators. The substrate is
7122482 Methods for fabricating patterned features utilizing imprint lithography October 17, 2006
One embodiment of the present invention is a method for generating patterned features on a substrate that includes: (a) forming a first layer on at least a portion of a surface of the substrate, the first layer comprising at least one layer of a first material, which one layer abuts
7122079 Composition for an etching mask comprising a silicon-containing material October 17, 2006
The present invention includes a composition for a silicon-containing material used as an etch mask for underlying layers. More specifically, the silicon-containing material may be used as an etch mask for a patterned imprinted layer comprising protrusions and recessions. To that end
7105452 Method of planarizing a semiconductor substrate with an etching chemistry September 12, 2006
The present invention provides a method of planarizing a substrate, the method including, forming, on the substrate, a patterned layer having a first shape associated therewith; and processing the patterned layer, with the first shape compensating for variations in the processing such
7090716 Single phase fluid imprint lithography method August 15, 2006
The present invention is directed toward a method for reducing pattern distortions in imprinting layers by reducing gas pockets present in a layer of viscous liquid deposited on a substrate. To that end, the method includes varying a transport of the gases disposed proximate to the v
7077992 Step and repeat imprint lithography processes July 18, 2006
The present invention is directed to methods for patterning a substrate by imprint lithography. Imprint lithography is a process in which a liquid is dispensed onto a substrate. A template is brought into contact with the liquid and the liquid is cured. The cured liquid includes an impri
7071088 Method for fabricating bulbous-shaped vias July 4, 2006
The present invention provides a method for fabricating bulbous-shaped vias on a substrate, having a surface, by disposing, on the substrate, a polymerizable fluid composition. A mold is placed in contact with the polymerizable fluid composition. The mold includes a relief structure on
7070405 Alignment systems for imprint lithography July 4, 2006
Described are systems for patterning a substrate by imprint lithography. Imprint lithography systems include an imprint head configured to hold a template in a spaced relation to a substrate. The imprint lithography system is configured to dispense an activating light curable liquid onto
7041604 Method of patterning surfaces while providing greater control of recess anisotropy May 9, 2006
The present invention features a method of patterning a substrate that includes forming, on the substrate, a multi-layer film defining an etch rate interface having a plurality of first portions that having a first etch rate associated therewith. The multi-layer film includes a second
7037639 Methods of manufacturing a lithography template May 2, 2006
A method for forming imprint lithography templates is described herein. The method includes forming a masking layer and a conductive layer on a substrate surface. The use of a conductive layer allows patterning of the masking layer using electron beam pattern generators. The substrate is
7036389 System for determining characteristics of substrates employing fluid geometries May 2, 2006
The present invention provides a system for determining characteristics of substrates, such as the presence of contaminants, shape, as well as the spatial relationships between spaced-apart substrates. The spatial relationships include distance and angular orientation between first and
7027156 Scatterometry alignment for imprint lithography April 11, 2006
Described are methods for patterning a substrate by imprint lithography. Imprint lithography is a process in which a liquid is dispensed onto a substrate. A template is brought into contact with the liquid and the liquid is cured. The cured liquid includes an imprint of any patterns
7019835 Method and system to measure characteristics of a film disposed on a substrate March 28, 2006
The present invention is directed to providing a method and system to measure characteristics of a film disposed on a substrate. The method includes identifying a plurality of processing regions on the film; measuring characteristics of a subset of the plurality of processing regions
7019819 Chucking system for modulating shapes of substrates March 28, 2006
The present invention is directed to a chucking system to modulate substrates so as to properly shape and position the same with respect to a wafer upon which a pattern is to be formed with the substrate. The chucking system includes a chuck body having first and second opposed sides
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