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Micron Technology, Inc. Patents
Assignee:
Micron Technology, Inc.
Address:
Boise, ID
No. of patents:
17464
Patents:




Patent Number Title Of Patent Date Issued
7470583 Method of improved high K dielectric-polysilicon interface for CMOS devices December 30, 2008
Methods for forming dielectric layers over polysilicon substrates, useful in the construction of capacitors and other semiconductor circuit components are provided. A self-limiting nitric oxide (NO) anneal of a polysilicon layer such as an HSG polysilicon capacitor electrode, at less
7470576 Methods of forming field effect transistor gate lines December 30, 2008
In one implementation, a method of forming a field effect transistor includes etching an opening into source/drain area of a semiconductor substrate. The opening has a base comprising semiconductive material. After the etching, insulative material is formed within the opening over th
7470563 Microelectronic device packages and methods for controlling the disposition of non-conductive ma December 30, 2008
A microelectronic package and method for forming such a package. In one embodiment, the package can include a microelectronic substrate having first connection sites, and a support member having second connection sites and third connection sites, with the third connection sites acces
7470552 Method for production of MRAM elements December 30, 2008
Magneto-resistive random access memory elements include a ferromagnetic layer having uniaxial anisotropy provided by elongate structures formed in the ferromagnetic film. The magnetic dipole aligns with the long axis of each structure. The structures can be formed in a variety of ways. F
7470344 Chemical dispensing system for semiconductor wafer processing December 30, 2008
A method for dispensing a chemical, such as an edge bead removal solvent, onto a semiconductor wafer comprising the steps of dispensing the chemical selectively onto the wafer and applying a suction to the area immediately surrounding the location at which the chemical is dispensed o
7468922 Apparatus and method for dynamically repairing a semiconductor memory December 23, 2008
An architecture for dynamically repairing a semiconductor memory, such as a Dynamic Random Access Memory (DRAM), includes circuitry for dynamically storing memory element remapping information. Memory is tested for errors by writing, then reading a plurality of memory blocks, such as row
7468623 Clamp circuit with fuse options December 23, 2008
A voltage control circuit provides a test supply voltage during manufacturing and testing of a semiconductor device and provides an operational supply voltage after certification of the semiconductor device. The operational supply voltage is lower than the test supply voltage. The vo
7468559 Semiconductor integrated circuit package having electrically disconnected solder balls for mount December 23, 2008
Integrated circuit packages that connect solder balls between solder ball pads of a die and substrate pads of a printed circuit board (PCB). The solder balls are electrically disconnected from any circuit of the die, i.e., "dummy" solder balls, and are used to temporarily hold the die in
7468534 Localized masking for semiconductor structure development December 23, 2008
Container structures for use in integrated circuits and methods of their manufacture without the use of mechanical planarization such as chemical-mechanical planarization (CMP), thus eliminating CMP-induced defects and variations. The methods utilize localized masking of holes for pr
7468533 Terraced film stack December 23, 2008
A process and apparatus directed to forming a terraced film stack of a semiconductor device, for example, a DRAM memory device, is disclosed. The present invention addresses etch undercut resulting from materials of different etch selectivity used in the film stack, which if not addresse
7468323 Method of forming high aspect ratio structures December 23, 2008
An etching process includes providing a dielectric first film on a substrate and a sacrificial second film on the dielectric first film. A conductive structure such as a container capacitor is formed in a recess in the first and second films. The conductive structure is exposed as to
7468108 Metal layer forming methods and capacitor electrode forming methods December 23, 2008
A capacitor electrode forming method includes chemisorbing a layer of at least one metal precursor at least one monolayer thick on a substrate, the layer including non-metal components from the precursor. The chemisorbed layer can be treated with an oxidant and the non-metal componen
7468105 CMP cleaning composition with microbial inhibitor December 23, 2008
An antimicrobial cleaning composition and methods for cleaning semiconductor substrates, particularly after chemical mechanical planarization or polishing, are provided. In one embodiment, the cleaning composition combines a solvent, a cleaning agent such as a hydroxycarboxylic acid
7468104 Chemical vapor deposition apparatus and deposition method December 23, 2008
A chemical vapor deposition apparatus includes a deposition chamber defined at least in part by at least one of a chamber sidewall and a chamber base wall. A substrate holder is received within the chamber. At least one process chemical inlet to the deposition chamber is included. At
7467334 Method for repairing a semiconductor memory December 16, 2008
A block repair device is used in a Dynamic Random Access Memory (DRAM) having a primary array with a defective cell and a redundant array with a redundant row. The block repair device stores a block repair configuration that determines the dimensions (e.g., the number of rows and col
7466618 Current limiting antifuse programming path December 16, 2008
Method and apparatus are provided for regulating an antifuse programming current by lightly doping an electrically connected region so that the resistance of the region responds in a non-linear manner to changes in voltage. In this way a variable resistor or a variably resistive tran
7466615 Low voltage data path and current sense amplifier December 16, 2008
Methods, circuits, devices, and systems are provided, including a low voltage data path and current sense amplifier. One data path includes a local input/output (LIO) line and a global input/output (GIO) line each having first and second signal lines. A source follower circuit, coupled
7466606 Memory device having terminals for transferring multiple types of data December 16, 2008
A memory device having a number of terminals for transferring input data and output data to and from a memory array. The memory device includes an auxiliary circuit for receiving input auxiliary information associated with the input data and for generating output auxiliary information
7466602 Method and apparatus for filtering output data December 16, 2008
Apparatus and methods for filtering spurious output transitions with an adaptive filtering circuit which tracks the memory architecture and form factors with a reduced speed penalty. The filtering is selectable by a fuse option.
7466600 System and method for initiating a bad block disable process in a non-volatile memory December 16, 2008
A system and method for disabling access to individually addressable regions of an array of non-volatile memory. In response to receiving an initial valid command, a process for disabling access to the defective portions of the array of non-volatile memory is initiated in addition to
7465999 Fully-depleted (FD) (SOI) MOSFET access transistor December 16, 2008
A fully-depleted (FD) Silicon-on-Insulator (SOI) MOSFET access transistor comprising a gate electrode of a conductivity type which is opposite the conductivity type of the source/drain regions and a method of fabrication are disclosed.
7465983 Low tunnel barrier insulators December 16, 2008
Structures and methods for programmable array type logic and/or memory devices with asymmetrical low tunnel barrier intergate insulators are provided. The programmable array type logic and/or memory devices include non-volatile memory which has a first source/drain region and a second
7465982 Capacitor structures December 16, 2008
Embodiments in accordance with the present invention provide alternative materials, and methods of forming such materials, that are effective as dielectric layers. Such embodiments include forming metal-containing dielectric layers over a silicon-containing substrate where a metal-co
7465650 Methods of forming polysilicon-comprising plugs and methods of forming FLASH memory circuitry December 16, 2008
This invention includes methods of forming plugs containing polysilicon, and methods of forming FLASH memory circuitry. In one implementation, a method of forming a plug containing polysilicon includes providing a substrate having an opening formed therein. Polysilicon is formed within
7465627 Methods of forming capacitors December 16, 2008
This invention includes methods of forming capacitors. In one implementation, a first capacitor electrode material is formed over a substrate. The first capacitor electrode material is exposed to a nitrogen comprising atmosphere effective to form a dielectric silicon and nitrogen com
7465616 Method of forming a field effect transistor December 16, 2008
In one implementation, a method of forming a field effect transistor includes etching an opening into source/drain area of a semiconductor substrate. The opening has a base comprising semiconductive material. After the etching, insulative material is formed within the opening over th
7465608 Three-dimensional multichip module December 16, 2008
A three-dimensional multichip module having a base structure formed by a plurality of chips secured together in a stack and a plurality of exterior chips mounted to the exterior faces of the base structure. The multichip module may incorporate memory chips, processor chips, logic chi
7465607 Methods of fabrication of lead frame-based semiconductor device packages incorporating at least December 16, 2008
Methods of fabrication of lead frame-based semiconductor device packages including at least one land grid array package. At least one semiconductor die is mounted to an interposer substrate, with bond pads of the semiconductor die connected to terminal pads of the interposer substrat
7465488 Bow control in an electronic package December 16, 2008
A package including a package substrate, a die-substrate assembly including a substrate including a plurality of layers including a layer having a mesh to stiffen the substrate adapted to mount one or more dice, one or more dice mounted on the substrate and a molding compound to atta
7465406 Method of exposing a substrate to a surface microwave plasma, etching method, deposition method, December 16, 2008
In certain implementations, methods and apparatus include an antenna assembly having at least two overlapping and movable surface microwave plasma antennas. The antennas have respective pluralities of microwave transmissive openings formed therethrough. At least some of the openings
7464308 CAM expected address search testmode December 9, 2008
A CAM device that performs operations on-chip during testing. The CAM device can, for example, include circuitry that compares search results with an expected address to determine whether the expected address is defective. The CAM can be tested by applying search data and the expected
7464231 Method for self-timed data ordering for multi-data rate memories December 9, 2008
A self-timed data ordering method and circuit for multi-data rate memories orders a plurality of data words substantially simultaneously retrieved during successive read operations of a memory device. A data word ordering designator is stored from each of the successive read operations
7463542 Temperature sensing device in an integrated circuit December 9, 2008
A temperature sensing device can be embedded in a memory circuit in order to sense the temperature of the memory circuit. One oscillator generates a temperature variable signal that increases frequency as the temperature of the oscillator increases and decreases frequency when the temper
7463520 Memory device with variable trim settings December 9, 2008
A memory device includes a memory array including a plurality of cells. The cells are divided into a plurality of subsets. Each subset has at least one associated trim parameter. The trim parameter for each subset is stored in the memory array within the associated subset. Circuitry is
7463367 Estimating overlay error and optical aberrations December 9, 2008
Aberration marks, which may be used in conjunction with lenses in optical photolithography systems, may assist in estimating overlay errors and optical aberrations. Aberration marks may include an inner polygon pattern and an outer polygon pattern, wherein each of the inner and outer
7463099 Phase detector for reducing noise December 9, 2008
The present invention provides a method and an apparatus for reducing noise. The apparatus includes a phase detector adapted to determine a phase difference between a first and a second signal, a first circuit adapted to generate a control signal based upon the determined phase diffe
7463052 Method and circuit for off chip driver control, and memory device using same December 9, 2008
An off chip driver impedance adjustment circuit includes a storage circuit adapted to receive and store a drive strength adjustment word. A counter circuit is coupled to the storage circuit to receive the drive strength adjustment word and develops a drive strength count responsive to th
7462935 Structure and method for forming a capacitively coupled chip-to-chip signaling interface December 9, 2008
A system and method for providing capacitively-coupled signaling in a system-in-package (SiP) device is disclosed. In one embodiment, the system includes a first semiconductor device and an opposing second semiconductor device spaced apart from the first device, a dielectric layer in
7462559 Systems and methods for forming metal-containing layers using vapor deposition processes December 9, 2008
A method of forming (and an apparatus for forming) a metal containing layer on a substrate, particularly a semiconductor substrate or substrate assembly for use in manufacturing a semiconductor or memory device structure, using one or more homoleptic and/or heteroleptic precursor com
7462534 Methods of forming memory circuitry December 9, 2008
The invention includes methods of forming memory circuitry. In one implementation, a substrate is provided which has a memory array circuitry area and a peripheral circuitry area. The memory array circuitry area comprises transistor gate lines having a first minimum line spacing. The
7462510 Standoffs for centralizing internals in packaging process December 9, 2008
A semiconductor device, semiconductor die package, mold tooling, and methods of fabricating the device and packages are provided. In one embodiment, the semiconductor device comprises a pair of semiconductor dies mounted on opposing sides of a flexible tape substrate, the outer surfa
7462088 Method for making large-area FED apparatus December 9, 2008
A method is provided for forming and associating a lower section of a large-area field emission device ("FED") that is sealed under a predetermined level of vacuum pressure with an upper section of a large-area FED. The upper section of the FED includes a faceplate. A first conductiv
7461320 Memory system and method having selective ECC during low power refresh December 2, 2008
A computer system includes a processor coupled to a DRAM through a memory controller. The processor switches the DRAM to a low power refresh mode in which DRAM cells are refreshed at a sufficiently low rate that data retention errors may occur. Prior to switching the DRAM to the low powe
7461306 Output data compression scheme using tri-state December 2, 2008
A memory device uses data compression to read data from an array of the memory during testing. The compressed data is either a logic one, logic zero or tri-state, depending upon the data read from the array. Output drivers of the memory are placed in a tri-state condition in response to
7461286 System and method for using a learning sequence to establish communications on a high-speed nons December 2, 2008
A memory system includes a memory hub controller that sends write data to a plurality of memory modules through a downstream data bus and receives read data from the memory modules through an upstream data bus. The memory hub controller includes a receiver coupled to the upstream data
7461188 Capacitive multidrop bus compensation December 2, 2008
The signal integrity of a high speed heavily loaded multidrop memory bus is often degraded due the numerous impedance mismatches. The impedance mismatches causes the bus to exhibit a nonlinear frequency response, which diminishes signal integrity and limits the bandwidth of the bus. A
7461139 Network computer providing mass storage, broadband access, and other enhanced functionality December 2, 2008
A network computer system includes a processor and a memory device coupled to the processor. The memory device contains an embedded operating system that is executed by the processor, the embedded operating system including at least one system parameter. A first reset device coupled to
7460432 Sequential access memory with system and method December 2, 2008
A sequential access memory ("SAM") device, system and method is provided that includes a memory array configured to store a group of bytes on each of a plurality of rows. A plurality of bit-lines transfer each of the group of bytes into and out of the memory array, and a pre-charging uni
7460430 Memory devices having reduced coupling noise between wordlines December 2, 2008
Memory devices configured to reduce coupling noise between adjacent wordlines in a memory array. More specifically, wordline drivers are interleaved such that adjacent wordlines are driven by wordline drivers enabled by different row decoders. Each wordline driver includes a weak tra
7460429 Circuit and method for reducing power in a memory device during standby modes December 2, 2008
A memory device responsive to standby mode commands for reducing internal operational power on a memory device is disclosed. The memory device includes a circuit for reducing power during a standby mode with the circuit including a reference with at least first and second reference s

 
 
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