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Micron Technology, Inc. Patents
Assignee:
Micron Technology, Inc.
Address:
Boise, ID
No. of patents:
17440
Patents:


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Patent Number Title Of Patent Date Issued
7547978 Underfill and encapsulation of semiconductor assemblies with materials having differing properti June 16, 2009
Polymerized materials for forming the underfill and encapsulation structures for semiconductor package are disclosed. A filler constituent, such as boron nitride, silicates, elemental metals, or alloys, may be added to a liquid photopolymer resin to tailor the physical properties the
7547954 Electronic systems using optical waveguide interconnects formed through a semiconductor wafer June 16, 2009
An integrated circuit with a number of optical waveguides that are formed in high aspect ratio holes. The high aspect ratio holes extend through a semiconductor wafer. The optical waveguides include a highly reflective material that is deposited so as to line an inner surface of the high
7547949 Semiconductor structures and memory device constructions June 16, 2009
The invention includes a semiconductor structure having a gateline lattice surrounding vertical source/drain regions. In some aspects, the source/drain regions can be provided in pairs, with one of the source/drain regions of each pair extending to a digit line and the other extendin
7547945 Transistor devices, transistor structures and semiconductor constructions June 16, 2009
The invention includes a transistor device having a semiconductor substrate with an upper surface. A pair of source/drain regions are formed within the semiconductor substrate and a channel region is formed within the semiconductor substrate and extends generally perpendicularly rela
7547935 Semiconductor devices including buried digit lines that are laterally offset from corresponding June 16, 2009
A method of electrically linking contacts of a semiconductor device to their corresponding digit lines. The method includes disposing a quantity of mask material into a trench through which the contact is exposed. The mask also abuts a connect region of a conductive element of a corr
7547905 Programmable conductor memory cell structure and method therefor June 16, 2009
In programmable conductor memory cells, metal ions precipitate out of a glass electrolyte element in response to an applied electric field in one direction only, causing a conductive pathway to grow from cathode to anode. The amount of conductive pathway growth, and therefore the pro
7547877 Microelectronic imagers with integrated optical devices and methods for manufacturing such micro June 16, 2009
Microelectronic imagers with integrated optical devices and methods for manufacturing imagers. The imagers, for example, typically have an imaging unit including a first substrate and an image sensor on and/or in the first substrate. An embodiment of an optical device includes a stan
7547850 Semiconductor device assemblies with compliant spring contact structures June 16, 2009
Photolithography patterned spring contacts are disclosed. The spring contacts may be fabricated using thin film processing techniques. A substrate, such as a silicon wafer or a carrier substrate is provided. At least one layer of a metal or alloy film may be deposited on the substrat
7547640 Method for integrated circuit fabrication using pitch multiplication June 16, 2009
Different sized features in the array and in the periphery of an integrated circuit are patterned on a substrate in a single step. In particular, a mixed pattern, combining two separately formed patterns, is formed on a single mask layer and then transferred to the underlying substra
7547617 Semiconductor device including container having epitaxial silicon therein June 16, 2009
Methods for growing epitaxial silicon are provided. Methods for controlling bottom stacking fault propagation in epitaxial silicon are also provided.
7547604 Method of forming a recessed gate structure on a substrate having insulating columns and removin June 16, 2009
Self-aligned recessed gate structures and method of formation are disclosed. Field oxide areas for isolation are first formed in a semiconductor substrate. A plurality of columns are defined in an insulating layer formed over the semiconductor substrate subsequent to which a thin sac
7547599 Multi-state memory cell June 16, 2009
Floating-gate memory cells having a split floating gate facilitate decreased sensitivity to localized defects in the tunnel dielectric layer and/or the intergate dielectric layer. Such memory cells also permit storage of more than one bit per cell. Methods of the various embodiments
7547579 Underfill process June 16, 2009
A method and apparatus for underfilling a gap between a semiconductor die or device and a substrate, where the semiconductor die or device is electrically connected to the substrate so that an active surface of the semiconductor die is facing a top surface of the substrate with the gap
7547559 Method for forming MRAM bit having a bottom sense layer utilizing electroless plating June 16, 2009
The present invention provides a method of forming an MRAM cell which minimizes the occurrence of electrical shorts during fabrication. A first conductor in a trench is provided in an insulating layer and an upper surface of the insulating layer and the first conductor is planarized.
7547213 Memory modules and methods for manufacturing memory modules June 16, 2009
Memory modules and methods for manufacturing memory modules are disclosed herein. In one embodiment, a memory module includes a substrate, a microelectronic device carried by the substrate, and a plurality of external contact pads operably coupled to the microelectronic device. The s
7546435 Dynamic command and/or address mirroring system and method for memory modules June 9, 2009
A memory module includes a memory hub that couples signals to memory devices mounted on opposite first and second surfaces of a memory module substrate. The memory devices are mounted in mirrored configuration with mirrored terminals of memory devices on opposite surfaces being inter
7546416 Method for substantially uninterrupted cache readout June 9, 2009
A memory device capable of sequentially outputting multiple pages of cached data while mitigating any interruption typically caused by fetching and transferring operations. The memory device outputs cached data from a first page while data from a second page is fetched into sense amp
7545682 Erase block data splitting June 9, 2009
A Flash memory device, system, and data handling routine is detailed with a distributed erase block sector user/overhead data scheme that splits the user data and overhead data and stores them in differing associated erase blocks. The erase blocks of the Flash memory are arranged into
7545674 Flash memory with low tunnel barrier interpoly insulators June 9, 2009
Structures and methods for Flash memory with low tunnel barrier intergate insulators are provided. The non-volatile memory includes a first source/drain region and a second source/drain region separated by a channel region in a substrate. A floating gate opposing the channel region a
7545669 Resistive memory device June 9, 2009
A system having a memory cell. In certain embodiments, the memory cell includes a resistive memory element, an access transistor having a gate, a first terminal, and a second terminal, and a control transistor having a gate, a first terminal, and a second terminal. The first terminal of
7545388 Apparatus, method, and product for downscaling an image June 9, 2009
An average filter or filters is used in line with the output of an interpolation filter to downscale an image. The interpolation filter upscales a source image or bitmap of pixels into an intermediate form and the average filter or filters downscales the intermediate form to a destin
7545183 Integrated circuit comparator or amplifier June 9, 2009
An integrated circuit comparator comprises a differential amplifier, a source follower circuit coupled to a gate terminal of a first transistor in the differential amplifier, and an output circuit. One or more source follower circuits may be utilized in connection with the differential
7545009 Word lines for memory cells June 9, 2009
Various embodiments of the invention described herein reduce contact resistance to a silicon-containing material using a first refractory metal material overlying the silicon-containing material and a second refractory metal material overlying the first refractory metal material. Eac
7544990 Scalable integrated logic and non-volatile memory June 9, 2009
A scalable, logic transistor has a pair of doped regions for the drain and source. A gate insulator layer is formed over the substrate and between the drain and source regions. A gate stack is formed of a gate layer, such as polysilicon or metal, between two metal nitride layers. A c
7544989 High density stepped, non-planar flash memory June 9, 2009
A first plurality of memory cells is in a first plane in a first column of the array. A second plurality of memory cells is in a second plane in the same column. The second plurality of memory cells are coupled to the first plurality of memory cells through a series connection of their
7544987 High-k dielectric materials and processes for manufacturing them June 9, 2009
High dielectric films of mixed transition metal oxides of titanium and tungsten, or titanium and tantalum, are formed by sequential chemical vapor deposition (CVD) of the respective nitrides and annealing in the presence of oxygen to densify and oxidize the nitrides. The resulting fi
7544986 System including integrated circuit structures formed in a silicone ladder polymer layer June 9, 2009
A method of forming integrated circuit structures, such as capacitors and conductive plugs, within contact openings formed in a photosensitive silicone ladder polymer (PVSQ) is disclosed. Contact openings with reduced striations and CD loss are formed in a photosensitive silicone lad
7544984 Gettering using voids formed by surface transformation June 9, 2009
One aspect of this disclosure relates to a memory device, comprising at least one gettering region, a memory array, a plurality of word lines and bit lines, and control circuitry. The gettering region is formed in a semiconductor substrate. The gettering region includes a precise arr
7544921 Linear distributed pixel differential amplifier having mirrored inputs June 9, 2009
A pixel circuit that partially incorporates an associated column amplifier into the pixel circuitry. By incorporating part of a mirrored amplifier into the pixel, noise from the pixel is reduced.
7544624 Systems and methods for processing microfeature workpieces June 9, 2009
Systems and methods for processing microfeature workpieces are disclosed herein. In one embodiment, the system comprises a processing chamber having a workpiece processing site configured to receive a microfeature workpiece and a main inlet through which a processing fluid can flow into
7544622 Passivation for cleaning a material June 9, 2009
A contact is defined by an opening etched into borophosphosilicate glass (BPSG) down to a silicon substrate. In a contact cleaning process designed to remove native oxide at the bottom of the contact with little effect on the BPSG, the contact is dipped in an etch retardant before be
7544615 Systems and methods of forming refractory metal nitride layers using organic amines June 9, 2009
A method of forming (and apparatus for forming) refractory metal nitride layers (including silicon nitride layers), such as a tantalum nitride barrier layer, on a substrate by using an atomic layer deposition process (a vapor deposition process that includes a plurality of deposition
7544604 Tantalum lanthanide oxynitride films June 9, 2009
Electronic apparatus and methods of forming the electronic apparatus include a tantalum lanthanide oxynitride film on a substrate for use in a variety of electronic systems. The tantalum lanthanide oxynitride film may be structured as one or more monolayers. Metal electrodes may be d
7544596 Atomic layer deposition of GdScO3 films as gate dielectrics June 9, 2009
The use of atomic layer deposition (ALD) to form a nanolaminate dielectric of gadolinium oxide (Gd.sub.2O.sub.3) and scandium oxide (Sc.sub.2O.sub.3) acting as a single dielectric layer with a formula of GdScO.sub.3, and a method of fabricating such a dielectric layer, is described t
7544592 Method for increasing etch rate during deep silicon dry etch June 9, 2009
A method of increasing etch rate during deep silicon dry etch by altering the geometric shape of the etch mask is presented. By slightly altering the shape of the etch mask, the etch rate is increased in one area where an oval etch mask is used as compared to another areas where differen
7544584 Localized compressive strained semiconductor June 9, 2009
One aspect of the present subject matter relates to a method for forming strained semiconductor film. According to an embodiment of the method, a crystalline semiconductor bridge is formed over a substrate. The bridge has a first portion bonded to the substrate, a second portion bonded t
7544563 Methods of forming a plurality of capacitors June 9, 2009
The invention includes methods and integrated circuitry. Pillars project outwardly from openings in a first material over individual capacitor storage node locations. Insulative material is deposited over the first material laterally about sidewalls of the projecting pillars, and is
7544554 Methods of forming gatelines and transistor devices June 9, 2009
The invention includes semiconductor constructions, methods of forming gatelines, and methods of forming transistor structures. The invention can include, for example, a damascene method of forming a gateline. A thin segment of dielectric material is formed between two thicker segmen
7544388 Methods of depositing materials over substrates, and methods of forming layers over substrates June 9, 2009
The invention includes methods of utilizing supercritical fluids to introduce precursors into reaction chambers. In some aspects, a supercritical fluid is utilized to introduce at least one precursor into a chamber during ALD, and in particular aspects the supercritical fluid is util
7542614 Image feature identification and motion compensation apparatus, systems, and methods June 2, 2009
Apparatus, systems, and methods disclosed herein may estimate the magnitude of relative motion between a scene and an image capture device used to capture the scene. Some embodiments may utilize discrete cosine transform and/or Sobel gradient techniques to identify one or more blocks
7542336 Architecture and method for NAND flash memory June 2, 2009
A NAND memory architecture arranges all even bitlines of a page together, and arranges all odd bitlines of a page together, so that programming operations are carried out on adjacent bitlines on the same word line to reduce floating gate coupling. Non-connected bitlines can be used at
7542319 Chalcogenide glass constant current device, and its method of fabrication and operation June 2, 2009
The invention is related to methods and apparatus for providing a two-terminal constant current device, and its operation thereof. The invention provides a constant current device that maintains a constant current over an applied voltage range of at least approximately 700 mV. The in
7541963 Variable quantization ADC for image sensors June 2, 2009
An A/D converter suitable for use in a system in which the signal power of noise increases with the signal power of the signal, such as an imaging system, utilizes a variable quantization system for converting analog signals into digital signals. The variable quantization is controlled s
7541871 Operational transconductance amplifier (OTA) June 2, 2009
Apparatus and methods provide an operational transconductance amplifier (OTA) with one or more self-biased cascode current mirrors. Applicable topologies include a current-mirror OTA and a folded-cascode OTA. In one embodiment, the self-biasing cascode current mirror is an optional aspec
7541851 Control of a variable delay line using line entry point to modify line power supply voltage June 2, 2009
Disclosed herein is a VDL/DLL architecture in which the power supply to the VDL, VccVDL, is regulated at least as a function of the entry point of the input signal (ClkIn) into the VDL. Specifically, VccVDL is regulated to be higher when the delay through the VDL is relatively small
7541825 Isolation circuit June 2, 2009
The present disclosure includes various method, device, and system embodiments for isolation circuits. One such isolation circuit embodiment includes: a first transistor having its source connected to a first terminal, wherein the first terminal connects a supply voltage to the sourc
7541658 Optically interactive device package array June 2, 2009
An image sensor package and methods for simultaneously fabricating a plurality of such packages. A layer of barrier material comprising a matrix of raised walls is formed around chip attachment areas located in an array on a carrier substrate to create chip cavities. Image sensor chi
7541648 Electrostatic discharge (ESD) protection circuit June 2, 2009
An electrostatic discharge (ESD) protection circuit that includes a parallel connection of parasitic vertical and lateral bipolar junction transistors (BJTs) each with a floating base and a metal oxide semiconductor (MOS) field transistor with a floating body is disclosed. The three
7541635 Semiconductor fabrication using a collar June 2, 2009
In one embodiment, a method includes selectively depositing a collar material between a number of memory containers. The collar material along a side of a first memory container of the number of memory containers is in contact with the collar material along a side of a second memory
7541632 Relaxed-pitch method of aligning active area to digit line June 2, 2009
According to one aspect of the invention, a memory device is disclosed. The memory device comprises a substantially linear active area comprising a source and at least two drains defining a first axis. The memory device further comprises at least two substantially parallel word lines, at
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