| Patent Number |
Title Of Patent |
Date Issued |
| RE32024 |
Mercury probe |
November 5, 1985 |
| The disclosed apparatus provides a mercury electrode for making non-destructive tests, especially for Schottky-diode tests of semi-conductors such as silicon. By developing vacuum under a test wafer on a support, a column of mercury is drawn into contact with the test wafer through a |
| 5448625 |
Telephone advertising method and apparatus |
September 5, 1995 |
| A method and apparatus for routing a telephone call through a telephone network from a caller to a called party designated by the caller via advertising service apparatus that operates in two modes successively, the parties being in communication with each other in one mode and ads are |
| 4587484 |
Mercury probe and method |
May 6, 1986 |
| The disclosed mercury probe has a mercury reservoir and one or more passages extending from the reservoir to an aperture plate for engaging a test wafer. Dross that tends to form at the wafer-contact end of the mercury passage(s) is removed by returning all of the mercury in the pass |
| 4521730 |
Mercury probes |
June 4, 1985 |
| The disclosed mercury probe has one or more mercury reservoirs and one or more passages extending from the reservoir(s) to an aperture plate for engaging a test wafer. Dross that tends to form at the wafer-contact end of the mercury passage(s) is removed by returning all of the mercury i |
| 4409547 |
Mercury-probe apparatus |
October 11, 1983 |
| The described apparatus includes a member of insulation containing a reservoir of mercury and a passage from a side of the reservoir to a contact aperture in a flat face of the member that engages a test wafer, the contact aperture being below the upper surface of the reservoir by a |
| 4101830 |
Mercury probe |
July 18, 1978 |
| The disclosed apparatus provides a mercury electrode for making non-destructive tests, especially for Schottky-diode tests of semi-conductors such as silicon. By developing vacuum under a test wafer on a support, a column of mercury is drawn into contact with the test wafer through a |
